IEC 62496-2:2017
光学电路板. 基本试验和测量程序. 第2部分: 光学电路板光学特性测量条件定义通用指南

Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards

被代替

标准号

IEC 62496-2:2017

发布

2017年

发布单位

国际电工委员会

替代标准

IEC 62496-2-5:2022

当前最新

IEC 62496-2-5:2022

 

 

引用标准

IEC 61300-1:2016 IEC 61300-3-53:2015 IEC 62496-2-1:2011 IEC 62614:2010

被代替标准

IEC 86/509/CDV:2017

适用范围

This part of IEC 62496 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.

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