IEC 62496-2-2017
光学电路板. 基本试验和测量程序. 第2部分: 光学电路板光学特性测量条件定义通用指南

Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards


 

 

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标准号
IEC 62496-2-2017
发布日期
2017年05月
实施日期
废止日期
中国标准分类号
M33
国际标准分类号
33.180.01
发布单位
IX-IEC
引用标准
IEC 61300-1-2016 IEC 61300-3-53-2015 IEC 62496-2-1-2011 IEC 62614-2010
被代替标准
IEC 86/509/CDV-2017
适用范围
This part of IEC 62496 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.

IEC 62496-2-2017系列标准





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