IEC 62435-5-2017
电子元件. 电子半导体设备的长期储存. 第5部分: 晶粒和晶元设备

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices


 

 

非常抱歉,我们暂时无法提供预览,您可以试试: 免费下载 IEC 62435-5-2017 前三页,或者稍后再访问。

点击下载后,生成下载文件时间比较长,请耐心等待......

 



标准号
IEC 62435-5-2017
发布日期
2017年01月
实施日期
废止日期
国际标准分类号
31.200
发布单位
IX-IEC
引用标准
IEC 62435-2-2017
被代替标准
IEC 47/2328/FDIS-2016
适用范围
This part of IEC 62435, is applicable to long-term storage of die and wafer devices and establishes specific storage regimen and conditions for singulated bare die and partial or complete wafers of die including die with added structures such as redistribution layers and solder balls or bumps or other metallisation. This part also provides guidelines for special requirements and primary packaging that contain the die or wafers for handling purposes. Typically, this part is used in conjunction with IEC 62435-1 for long-term storage of devices whose duration can be more than 12 months for products scheduled for long duration storage.

IEC 62435-5-2017系列标准


谁引用了IEC 62435-5-2017 更多引用





Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号