GB/T 17574.9-2006
Semiconductor devices.Integrated circuits.Part 2-9:Digital integrated circuits.Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories (English Version)

Standard No.

GB/T 17574.9-2006

Language

Chinese, Available in English version

Release Date

2006

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 17574.9-2006

Scope

The IEC electronic component quality assessment system follows the IEC statutes and works under the authorization of the IEC. The purpose of the system is to define a quality assessment procedure in such a way that electronic components released by a participating country in accordance with the relevant specifications are accepted equally by all other participating countries without further testing.

GB/T 17574.9-2006 Referenced Document

• GB/T 4728.12-1996 Graphical symbols for electrical diagrams. Part 12: Binary logic elements
• GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices
• IEC 60068-2-17:1978 Basic environmental testing procedures. Part 2 : Tests. Test Q: Sealing
• IEC 60134:1961 System of limiting values of electronic tubes and valves and the adequate semiconductor devices

GB/T 17574.9-2006 history

• 2006 GB/T 17574.9-2006 Semiconductor devices.Integrated circuits.Part 2-9:Digital integrated circuits.Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories

GB/T 17574.9-2006 -All Parts