GB/T 17574.10-2003
Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories (English Version)
- Standard No.
- GB/T 17574.10-2003
- Language
- Chinese, Available in English version
- Release Date
- 2003
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Latest
- GB/T 17574.10-2003
- Scope
- The IEC electronic component quality assessment system follows the IEC statutes and works under the authorization of the IEC. The purpose of the system is to define a quality assessment procedure in such a way that electronic components released by a participating country in accordance with the relevant specifications are accepted equally by all other participating countries without further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and is used together with the following standards.
GB/T 17574.10-2003 history
- 2003 GB/T 17574.10-2003 Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
GB/T 17574.10-2003 -All Parts
GB/T 17574.10-2003 Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
GB/T 17574.11-2006 Semiconductor devices Integrated circuits Part 2-11: Digital integrated circuits Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
GB/T 17574.20-2006 Semiconductor devices Integrated circuits Part 2-20: Digital integrated circuits Family specification Low voltage integrated circuits
GB/T 17574.9-2006 Semiconductor devices.Integrated circuits.Part 2-9:Digital integrated circuits.Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories