GB/T 4326-1984
Extrinsic semiconductor single crystals--Measurement of Hall mobility and Hall coefficient

Be replaced

Standard No.

GB/T 4326-1984

Language

Chinese

Release Date

1984

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Replace By

GB/T 4326-2006

Lastest

GB/T 4326-2006

Scope

This standard applies to the determination of carrier Hall mobility in extrinsic semiconductor single crystal samples. Resistivity and Hall coefficient must be measured in order to obtain Hall mobility, so this standard also applies to the measurement of these parameters respectively.

GB/T 4326-1984 history

• 2006 GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
• 1984 GB/T 4326-1984 Extrinsic semiconductor single crystals--Measurement of Hall mobility and Hall coefficient