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Semiconducting

Semiconducting, Total:83 items.

In the international standard classification, Semiconducting involves: Semiconductor devices, Semiconducting materials, Electrical wires and cables, Thermodynamics and temperature measurements, Insulating materials, Electricity. Magnetism. Electrical and magnetic measurements, Inorganic chemicals, Components and accessories for telecommunications equipment, Integrated circuits. Microelectronics, Electromechanical components for electronic and telecommunications equipment, Products of non-ferrous metals, Fibre optic communications, Valves, Road vehicle systems.

British Standards Institution (BSI), Semiconducting

• BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
• BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
• BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
• BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
• BS IEC 62951-8:2023 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for stretchability, flexibility, and stability of flexible resistive memory
• BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
• BS IEC 62951-2:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
• BS EN 13604:2013 Copper and copper alloys. Semiconductor devices, electronic and vacuum products made from high conductivity copper
• BS IEC 62951-9:2022 Semiconductor devices. Flexible and stretchable semiconductor devices - Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
• BS IEC 62951-3:2018 Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging
• 20/30424984 DC BS EN IEC 62951-8. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 8. Test method for stretchability, flexibility and stability of flexible resistive memory

American Society for Testing and Materials (ASTM), Semiconducting

• ASTM D6095-99 Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
• ASTM D6095-06 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
• ASTM D6095-12 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
• ASTM D4388-97 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
• ASTM D4388-02 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
• ASTM D4388-08 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
• ASTM D4388-13 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
• ASTM D3004-08 Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
• ASTM D3004-08(2013) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials

International Electrotechnical Commission (IEC), Semiconducting

• IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
• IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
• IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
• IEC 62951-1:2017 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
• IEC 62951-8:2023 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
• IEC 62951-9:2022 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
• IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
• IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

Hebei Provincial Standard of the People's Republic of China, Semiconducting

• DB13/T 5293-2020 Specifications for Maintenance of Semiconductor Characteristic Tracer

Professional Standard - Aviation, Semiconducting

• HB 4-118-1996 Metal conduit semi-flexible connection
• HB 4-118-1983 Metal conduit semi-flexible connection
• HB 4-118-1976 Metal conduit semi-flexible connection

Professional Standard - Electron, Semiconducting

• SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
• SJ 20236-1993 Verification regulation of the model GH2050/51 calibrator for transistor characteristic tracer
• SJ/T 11777-2021 Technical requirements and measurement methods of calibrator for semiconductor tube characteristic tracer

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconducting

• GB/T 29856-2013 Characterization of semiconducting single-walled carbon nanotubes using near infrared photoluminescence spectroscopy
• GB/T 13974-1992 Test methods for semiconductor deviece curve tracers
• GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
• GB/T 13973-1992 General specification for semiconductor deviece curve tracers

Defense Logistics Agency, Semiconducting

• DLA MIL-DTL-28839/1 A-2013 WAVEGUIDES, ELLIPTICAL, SEMIRIGID
• DLA SMD-5962-77034 REV X-2006 MICROCIRCUIT, LINEAR, ADJUSTABLE VOLTAGE REGULATOR, MONOLITHIC SILICON
• DLA SMD-5962-89877 REV C-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL, RS232, TRANSCEIVER, MONOLITHIC SILICON
• DLA SMD-5962-93183 REV C-2002 MICROCIRCUIT, LINEAR, BUS TRANSCEIVER, DIFFERENTIAL, MONOLITHIC SILICON
• DLA SMD-5962-94513 REV C-2006 MICROCIRCUIT, LINEAR, LOW POWER, PULSE WIDTH MODULATOR, MONOLITHIC SILICON
• DLA SMD-5962-94514 REV B-2004 MICROCIRCUIT, LINEAR, MICROPROCESSOR SUPERVISORY CIRCUIT, MONOLITHIC SILICON
• DLA SMD-5962-03251-2004 MICROCIRCUIT, LINEAR, CMOS, RESOLVER TO DIGITAL CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-94517 REV C-2004 MICROCIRCUIT, LINEAR, WIDEBAND, VARIABLE GAIN AMPLIFIER, MONOLITHIC SILICON
• DLA SMD-5962-89674 REV C-2001 MICROCIRCUITS, LINEAR, CMOS, 14-BIT, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-89676 REV C-2001 MICROCIRCUIT, LINEAR, CMOS, 16-BIT, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-89679 REV B-2001 MICROCIRCUIT, LINEAR, CMOS 12-BIT ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-93179 REV B-2002 MICROCIRCUIT, LINEAR, A/D CONVERTER, 12-BIT, CMOS, MONOLITHIC SILICON
• DLA SMD-5962-89503 REV H-2004 MICROCIRCUIT, LINEAR, CMOS, PRECISION TIMERS, MONOLITHIC SILICON
• DLA MIL-DTL-28830 D-2005 CABLE, RADIO FREQUENCY, COAXIAL, SEMIRIGID, CORRUGATED OUTER CONDUCTOR, GENERAL SPECIFICATION FOR [Use In Lieu Of: DLA MIL-C-0028830 A]
• DLA QPL-28830-13 NOTICE 1-2008 Cable, Radio Frequency, Coaxial, Semirigid, Corrugated Outer Conductor, General Specification for
• DLA SMD-5962-94512 REV C-2004 MICROCIRCUIT, LINEAR, CMOS VIDEO MULTIPLEXER/AMPLIFIER, MONOLITHIC SILICON
• DLA SMD-5962-94604 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, DUAL MICROPOWER OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
• DLA SMD-5962-88750 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, QUAD ANALOG SWITCH, MONOLITHIC SILICON
• DLA SMD-5962-93180 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, QUAD, SPDT ANALOG SWITCH, MONOLITHIC SILICON
• DLA SMD-5962-93182 REV D-2004 MICROCIRCUIT, LINEAR, RAIL-TO-RAIL, QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
• DLA SMD-5962-93255 REV A-2002 MICROCIRCUIT, LINEAR, CMOS QUAD, SPST ANALOG SWITCH, MONOLITHIC SILICON
• DLA QPL-28830-13-2007 CABLE, RADIO FREQUENCY, COAXIAL, SEMIRIGID, CORRUGATED OUTER CONDUCTOR, GENERAL SPECIFICATION FOR
• DLA SMD-5962-89653 REV A-1991 MICROCIRCUIT, LINEAR, CMOS, 8-BIT VIDEO D/A CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-89655 REV B-2004 MICROCIRCUIT, LINEAR, 12-BIT CMOS, HIGH-SPEED A/D CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-89657 REV B-2001 MICROCIRCUIT, LINEAR, DUAL, CMOS, 12-BIT, D/A CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-93184 REV A-1993 MICROCIRCUIT, LINEAR, DUAL/QUAD, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
• DLA SMD-5962-89507 REV B-2000 MICROCIRCUIT, LINEAR, HIGH SPEED CMOS, QUAD BILATERAL SWITCH, MONOLITHIC SILICON
• DLA SMD-5962-89508-1989 MICROCIRCUIT, DIGITAL, FAST CMOS, 1 OF 4 DECODER, MONOLITHIC SILICON

Association Francaise de Normalisation, Semiconducting

• NF C93-591:1990 Sectional specification for semi-flexible waveguides with flanges.
• UTE C93-591U*UTE C93-591:1994 Electronic components. Semi-flexible waveguides with flanges.
• NF A51-310*NF EN 13604:2013 Copper and copper alloys - Semiconductor devices, electronic and vacuum products made from high conductivity copper

National Metrological Technical Specifications of the People's Republic of China, Semiconducting

• JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers
• JJF 1894-2021 Calibration Specification for Calibrators of Semiconductor Curve Tracers

YU-JUS, Semiconducting

• JUS A.A4.302-1990 Tabular layouts ofarticle characteristics for semiconductor diodes

Korean Agency for Technology and Standards (KATS), Semiconducting

• KS C IEC 62951-1:2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates

KR-KS, Semiconducting

• KS C IEC 62951-1-2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates

HU-MSZT, Semiconducting

• MSZ 771/5-1979

American National Standards Institute （ANSI), Semiconducting

• ANSI/UL 1557-2013 Standard for Safety for Electrically Isolated Semiconductor Devices
• ANSI/ASTM D3004:2008 Specification for Extruded Crosslinked and Thermoplastic Semi-conducting, Conductor and Insulation Shielding Materials

U.S. Military Regulations and Norms, Semiconducting

• ARMY MIL-M-63321 A (4)-1990 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
• ARMY MIL-M-63321 A-1981 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)

Group Standards of the People's Republic of China, Semiconducting

• T/CIE 144-2022

Society of Automotive Engineers (SAE), Semiconducting

• SAE J1879-2007 Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications
• SAE J1879-2014 Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications

Others:   Semiconducting, gas semipermeable material, semi-permeable material, semiconducting light wave, Guidelines for Reliability Analysis of Nuclear Power Plant Personnel, non-semiconductor, Commissioning guidelines for coal-fired flue gas dry/semi-dry desulfurization equipment, Indentation of resilient semi-flexible/vinyl tiles, Equipment Maintainability Guidelines, Equipment Maintainability Guidelines, Coal-fired flue gas dry process/semi-dry process equipment commissioning guidelines, cobalt semiconducting, thermal conductivity, semi-permanent, Guidelines for Authenticity Inspection of Remote Sensing Products, semiconducting photocatalysis, Guidelines for Sampling Techniques for Semivolatile Organic Compounds, Semiconductor + Quality, semiconducting, semi-permeable.