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cobalt semiconducting

cobalt semiconducting, Total:497 items.

In the international standard classification, cobalt semiconducting involves: Semiconductor devices, Electricity. Magnetism. Electrical and magnetic measurements, Electromechanical components for electronic and telecommunications equipment, Thermodynamics and temperature measurements, Components and accessories for telecommunications equipment, Road vehicle systems, Mechanical structures for electronic equipment, Products of non-ferrous metals, Semiconducting materials, Integrated circuits. Microelectronics, Optoelectronics. Laser equipment, Environmental protection, Linear and angular measurements, Electrical wires and cables, Insulating materials, Characteristics and design of machines, apparatus, equipment, Graphical symbols, Environmental testing, Electrical and electronic testing, Rectifiers. Convertors. Stabilized power supply, Analytical chemistry, Plastics, Protection against fire, Rubber and plastics products, Standardization. General rules, Fibre optic communications, Radiation protection, Safety of machinery, Industrial automation systems, Electrical engineering in general, Inorganic chemicals, Products of the textile industry, Valves, Radiation measurements, Office machines, Surface treatment and coating, Electromagnetic compatibility (EMC), Capacitors.

British Standards Institution (BSI), cobalt semiconducting

BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
BS EN IEC 63287-1:2021 Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
BS IEC 62951-8:2023 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for stretchability, flexibility, and stability of flexible resistive memory
BS IEC 60747-14-10:2019 Semiconductor devices. Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
BS IEC 62951-3:2018 Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging
14/30297227 DC BS EN 62880-1. Semiconductor devices. Wafer level reliability for semiconductor devices. Copper stress migration test method
BS IEC 62830-7:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Linear sliding mode triboelectric energy harvesting
BS EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
BS IEC 62951-9:2022 Semiconductor devices. Flexible and stretchable semiconductor devices - Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
BS IEC 60747-18-4:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
BS EN 13604:2013 Copper and copper alloys. Semiconductor devices, electronic and vacuum products made from high conductivity copper
BS IEC 62951-2:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
20/30424984 DC BS EN IEC 62951-8. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 8. Test method for stretchability, flexibility and stability of flexible resistive memory
BS EN 60749-21:2011 Semiconductor devices. Mechanical and climatic test methods. Solderability
BS EN 60749-21:2005 Semiconductor devices - Mechanical and climatic test methods - Solderability
BS IEC 62373-1:2020 Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET
BS IEC 62830-5:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Test method for measuring generated power from flexible thermoelectric devices
BS IEC 63275-1:2022 Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Test method for bias temperature instability
20/30423207 DC BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
BS IEC 62830-4:2019 Semiconductor devices. Semiconductor devices for energy harvesting and generation - Test and evaluation methods for flexible piezoelectric energy harvesting devices
BS EN 62007-1:2000 Semiconductor optoelectronic devices for fibre optic system applications - Essential ratings and characteristics
BS EN 60749-9:2002 Semiconductor devices - Mechanical and climatic test methods - Permanence of marking
20/30409285 DC BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors
BS EN 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Robustness of terminations (lead integrity)
BS EN 60749-9:2017 Semiconductor devices. Mechanical and climatic test methods - Permanence of marking
18/30380675 DC BS EN IEC 62830-7. Semiconductor devices. Semiconductor devices for energy harvesting and generation. Part 7. Linear sliding mode triboelectric energy harvesting
BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
BS EN 62047-22:2014 Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates
BS EN IEC 60747-17:2020 Semiconductor devices. Magnetic and capacitive coupler for basic and reinforced insulation
BS EN IEC 60749-39:2022 Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
BS IEC 60747-18-3:2019 Semiconductor devices. Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
21/30432234 DC BS IEC 60747-18-4. Semiconductor devices. Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 61207-7:2013 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS IEC 60747-18-5:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method
18/30355426 DC BS EN 62830-5. Semiconductor devices. Semiconductor devices for energy harvesting and generation. Part 5. Test method for measuring generated power from flexible thermoelectric devices
17/30366375 DC BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method
20/30406230 DC BS IEC 63275-1. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Part 1. Test method for bias temperature instability
BS EN 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased HAST
BS EN 60749-29:2011 Semiconductor devices. Mechanical and climatic test methods. Latch-up test
BS IEC 62047-32:2019 Semiconductor devices. Micro-electromechanical devices - Test method for the nonlinear vibration of MEMS resonators
20/30425840 DC BS EN IEC 60749-39. Semiconductor devices. Mechanical and climatic test methods. Part 39. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
BS IEC 62830-8:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
BS ISO 17299-5:2014 Textiles. Determination of deodorant property. Metal-oxide semiconductor sensor method
BS IEC 62047-35:2019 Semiconductor devices. Micro-electromechanical devices - Test method of electrical characteristics under bending deformation for flexible electromechanical devices
BS EN 62007-1:2009 Semiconductor optoelectronic devices for fibre optic system applications - Specification template for essential ratings and characteristics
BS EN 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications. Specification template for essential ratings and characteristics
BS DD IEC/PAS 60747-17:2011 Semiconductor devices. Discrete devices. Magnetic and capacitive coupler for basic and reinforced isolation
BS EN 60749-33:2004 Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave
BS IEC 62047-40:2021 Semiconductor devices. Micro-electromechanical devices. Test methods of micro-electromechanical inertial shock switch threshold
BS IEC 62047-30:2017 Semiconductor devices. Micro-electromechanical devices - Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
BS IEC 62047-42:2022 Semiconductor devices. Micro-electromechanical devices - Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
18/30361905 DC BS EN 60747-18-3. Semiconductor devices. Part 18-3. Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package module with fluidic system
BS EN IEC 60749-41:2020 Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices
BS EN 62047-8:2011 Semiconductor devices. Micro-electromechanical devices. Strip bending test method for tensile property measurement of thin films
BS EN 60749-15:2010 Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices
19/30395503 DC BS EN IEC 62830-8. Semiconductor devices. Semiconductor devices for energy harvesting and generation. Part 8. Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
BS EN 60749-31:2003 Semiconductor devices - Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced)
BS EN 60749-32:2003 Semiconductor devices - Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced)
BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)
BS EN 62047-17:2015 Semiconductor devices. Micro-electromechanical devices. Bulge test method for measuring mechanical properties of thin films
21/30432238 DC BS EN IEC 60747-18-5. Semiconductor devices. Part 18-5. Semiconductor bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
BS PD CEN/TS 16599:2014 Photocatalysis. Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions

International Electrotechnical Commission (IEC), cobalt semiconducting

IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
IEC 62951-1:2017 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
IEC 62951-8:2023 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
IEC 60747-14-10:2019 Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
IEC 62830-7:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 7: Linear sliding mode triboelectric energy harvesting
IEC 62951-9:2022 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
IEC 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
IEC 60747-18-4:2023 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
IEC 62830-5:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
IEC 63275-1:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
IEC 60749-39:2021 RLV Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
IEC 62373-1:2020 Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
IEC 60749-39:2021 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
IEC 60749-21:2004 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
IEC 60749-21:2005 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
IEC 60749-21:2011 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
IEC 60749-13:2002 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
IEC 60749-13:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
IEC 60747-18-3:2019 Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
IEC 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
IEC 60749-32:2002/AMD1:2010 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
IEC 60749-32:2002+AMD1:2010 CSV Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
IEC 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
IEC 60749-9:2002 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
IEC 60749-9:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
IEC 62007-1:1999 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics
IEC 60204-33:2009 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
IEC 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
IEC 60747-17:2020/COR1:2021 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation; Corrigendum 1
IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
IEC PAS 60747-17:2011 Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation
IEC 60747-18-5:2023 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of lig
IEC 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
IEC 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
IEC 63284:2022 Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
IEC 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (Edition 1.0; Replaces IEC PAS 62336:2002)
IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
IEC 62830-8:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
IEC 62047-35:2019 Semiconductor devices – Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices
CISPR 11-2015+AMD1-2016+AMD2-2019 CSV Requirements for semiconductor power converters (SPC)/ Improvement of repeatability for measurements in the frequency range 1-18 GHz
CISPR 11:2015+AMD1:2016+AMD2:2019 CSV Requirements for semiconductor power converters (SPC)/ Improvement of repeatability for measurements in the frequency range 1-18 GHz
IEC 63275-2:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operatio
IEC 62007-1/AMD1:1998 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics; Amendment 1
IEC 62047-32:2019 Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
IEC 60146-4:1986 Semiconductor convertors - Part 4: Method of specifying the performance and test requirements of uninterruptible power systems

Defense Logistics Agency, cobalt semiconducting

DLA MIL-DTL-28839/1 A-2013 WAVEGUIDES, ELLIPTICAL, SEMIRIGID
DLA QPL-28830-QPD-2011 Cable, Radio Frequency, Coaxial, Semirigid, Corrugated Outer Conductor, General Specification For
DLA QPL-28830-2013 Cable, Radio Frequency, Coaxial, Semirigid, Corrugated Outer Conductor, General Specification For
DLA MIL-DTL-28830 D-2005 CABLE, RADIO FREQUENCY, COAXIAL, SEMIRIGID, CORRUGATED OUTER CONDUCTOR, GENERAL SPECIFICATION FOR [Use In Lieu Of: DLA MIL-C-0028830 A]
DLA QPL-28830-13 NOTICE 1-2008 Cable, Radio Frequency, Coaxial, Semirigid, Corrugated Outer Conductor, General Specification for
DLA SMD-5962-77034 REV X-2006 MICROCIRCUIT, LINEAR, ADJUSTABLE VOLTAGE REGULATOR, MONOLITHIC SILICON
DLA QPL-28830-13-2007 CABLE, RADIO FREQUENCY, COAXIAL, SEMIRIGID, CORRUGATED OUTER CONDUCTOR, GENERAL SPECIFICATION FOR
DLA SMD-5962-89638-1989 MICROCIRCUIT, LINEAR, CMOS CURRENT MODE CONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-89877 REV C-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL, RS232, TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-93183 REV C-2002 MICROCIRCUIT, LINEAR, BUS TRANSCEIVER, DIFFERENTIAL, MONOLITHIC SILICON
DLA SMD-5962-94513 REV C-2006 MICROCIRCUIT, LINEAR, LOW POWER, PULSE WIDTH MODULATOR, MONOLITHIC SILICON
DLA SMD-5962-94514 REV B-2004 MICROCIRCUIT, LINEAR, MICROPROCESSOR SUPERVISORY CIRCUIT, MONOLITHIC SILICON
DLA SMD-5962-90544 REV A-2003 MICROCIRCUIT, DIGITAL, CMOS, HIGH PERFORMANCE MICROCONTROLLER MONOLITHIC SILICON
DLA SMD-5962-03251-2004 MICROCIRCUIT, LINEAR, CMOS, RESOLVER TO DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-90997-1991 MICROCIRCUIT, DIGITAL, CHMOS BUS CONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-94517 REV C-2004 MICROCIRCUIT, LINEAR, WIDEBAND, VARIABLE GAIN AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-89674 REV C-2001 MICROCIRCUITS, LINEAR, CMOS, 14-BIT, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89676 REV C-2001 MICROCIRCUIT, LINEAR, CMOS, 16-BIT, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89679 REV B-2001 MICROCIRCUIT, LINEAR, CMOS 12-BIT ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-93179 REV B-2002 MICROCIRCUIT, LINEAR, A/D CONVERTER, 12-BIT, CMOS, MONOLITHIC SILICON
DLA SMD-5962-89503 REV H-2004 MICROCIRCUIT, LINEAR, CMOS, PRECISION TIMERS, MONOLITHIC SILICON
DLA SMD-5962-94512 REV C-2004 MICROCIRCUIT, LINEAR, CMOS VIDEO MULTIPLEXER/AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-94604 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, DUAL MICROPOWER OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-87667 REV C-1993 MICROCIRCUIT, HIGH PERFORMANCE CMOS BUS BUFFERS, MONOLITHIC SILICON
DLA SMD-5962-88750 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, QUAD ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-93180 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, QUAD, SPDT ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-93182 REV D-2004 MICROCIRCUIT, LINEAR, RAIL-TO-RAIL, QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-93255 REV A-2002 MICROCIRCUIT, LINEAR, CMOS QUAD, SPST ANALOG SWITCH, MONOLITHIC SILICON
DLA SMD-5962-89653 REV A-1991 MICROCIRCUIT, LINEAR, CMOS, 8-BIT VIDEO D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89655 REV B-2004 MICROCIRCUIT, LINEAR, 12-BIT CMOS, HIGH-SPEED A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89657 REV B-2001 MICROCIRCUIT, LINEAR, DUAL, CMOS, 12-BIT, D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88503 REV J-2003 MICROCIRCUIT, LINEAR, DUAL MOSFET DRIVERS, MONOLITHIC SILICON
DLA SMD-5962-88743 REV B-1991 MICROCIRCUITS, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-93184 REV A-1993 MICROCIRCUIT, LINEAR, DUAL/QUAD, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-89507 REV B-2000 MICROCIRCUIT, LINEAR, HIGH SPEED CMOS, QUAD BILATERAL SWITCH, MONOLITHIC SILICON
DLA SMD-5962-89508-1989 MICROCIRCUIT, DIGITAL, FAST CMOS, 1 OF 4 DECODER, MONOLITHIC SILICON
DLA MIL-W-3970/23 A-2009 WAVEGUIDE ASSEMBLIES, RIGID, CAST, 90-DEGREE E-PLANE BEND, MITER AND RADIUS-BACK MITER, FULL CORRAL
DLA SMD-5962-81006 REV J-2005 MICROCIRCUIT, LINEAR, CMOS, HIGH LEVEL ANALOG SWITCHES WITH DRIVERS, MONOLITHIC SILICON
DLA SMD-5962-93262 REV D-2006 MICROCIRCUIT, LINEAR, CMOS, 6-BIT FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-94556 REV B-2004 MICROCIRCUIT, LINEAR, CMOS RF/VIDEO MULTIPLEXERS/DEMULTIPLEXERS, MONOLITHIC SILICON
DLA SMD-5962-87713 REV A-1991 MICROCIRCUITS, DIGITAL, HMOS, MULTI-PROTOCOL, SERIAL CONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-89777 REV C-2007 MICROCIRCUIT, LINEAR, CMOS, 8-BIT A/D FLASH, CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89971-1992 MICROCIRCUIT, DIGITAL, HMOS, REMOTE UNIVERSAL PERIPHERAL INTERFACE, MONOLITHIC SILICON
DLA SMD-5962-88770 REV H-2003 MICROCIRCUIT, LINEAR, SINGLE POWER MOSFET DRIVER, MONOLITHIC SILICON
DLA SMD-5962-89481 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, 12-BIT, MULTIPLYING D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-87763 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL 12-BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-90512-1992 MICROCIRCUIT, DIGITAL, HMOS, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
DLA SMD-5962-88573 REV C-1992 MICROCIRCUIT, DIGITAL CMOS, HIGH PERFORMANCE PARITY BUS TRANSCEIVERS, MONOLITHIC SILICON
DLA SMD-5962-88699-1988 MICROCIRCUITS, LINEAR, 16-CHANNEL/DIFFERENTIAL 8-CHANNEL CMOS ANALOG MULTIPLEXER
DLA SMD-5962-89483 REV D-1996 MICROCIRCUIT, LINEAR, CMOS, QUAD, UNIVERSAL FILTER BUILDING BLOCK, MONOLITHIC SILICON
DLA SMD-5962-89518 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, 8-BIT, A/D CONVERTER WITH TRACK/HOLD, MONOLITHIC SILICON
DLA SMD-5962-96820 REV B-1999 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE-AND GATE, MONOLITHIC SILICON
DLA SMD-5962-96822-1996 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE NAND GATE, MONOLITHIC SILICON
DLA SMD-5962-96825-1996 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE TWO-INPUT POSITIVE OR GATE, MONOLITHIC SILICON

YU-JUS, cobalt semiconducting

JUS A.A4.302-1990 Tabular layouts ofarticle characteristics for semiconductor diodes
JUS N.R1.372-1979 Semiconductor diodes. Essential ratmgs and characteristics: rectifier diodes
JUS N.R1.375-1980 Semiconductor diode s. Essential ratings and characteristics. Variable capacitance diodes
JUS N.R1.370-1979 emicon?uctor devices. General principles for specifications of essential ratings and characteristics
JUS N.R1.374-1980 Semiconductor diodes. Essentialratings and chdracteristics. Ttmneldiodes
JUS N.R1.371-1979 Semiconductor diodes. Essential ratings and characteristics: Voltage reference and voltage regulator diodes

Professional Standard - Aviation, cobalt semiconducting

HB 4-118-1996 Metal conduit semi-flexible connection
HB 4-118-1983 Metal conduit semi-flexible connection
HB 4-118-1976 Metal conduit semi-flexible connection

Military Standard of the People's Republic of China-General Armament Department, cobalt semiconducting

GJB 8515-2015 Specification for platinum-cobalt permanent magnet materials for inertial navigation systems

HU-MSZT, cobalt semiconducting

Professional Standard - Electron, cobalt semiconducting

SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
SJ 20756-1999 Guideline for application of structrually similarity of discrete semiconductor devices
SJ 20236-1993 Verification regulation of the model GH2050/51 calibrator for transistor characteristic tracer
SJ/T 10882-1996 Semiconductor integrated circuits - General principles of measuring methods for linear amplifiers
SJ 50033/155-2002 Semiconductor discrete devices Detail specification for type 3DG252 silicon microwave linearity transistor
SJ/T 11777-2021 Technical requirements and measurement methods of calibrator for semiconductor tube characteristic tracer
SJ 2658.11-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for pulse response characteristics

Korean Agency for Technology and Standards (KATS), cobalt semiconducting

KS C IEC 62951-1:2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates
KS C 5212-1981(2002) GENERAL RULES FOR RELIABILITY ASSURED DISCRETE SEMICONDUCTOR DEVICES
KS C 5212-1981 GENERAL RULES FOR RELIABILITY ASSURED DISCRETE SEMICONDUCTOR DEVICES
KS C IEC 60747-14-10:2022 Semiconductor devices — Part 14-10: Semiconductor sensors — Performance evaluation methods for wearable glucose sensors
KS C 6520-2008 Components and materials of semiconductor process－Measurement of wear characteristics by plasma
KS C 5218-1983 Reliability assured complementary MOS digital semiconductor integrated circuits(Gates)
KS C 5210-1980 General rules for reliability assured digital semiconductor integrated circuits
KS C 6562-1996 Essential ratings and characteristics for semiconductor pressure sensor elements
KS C 7202-1990 General Rules for Reliability Assured Analogue Semiconducter Integrated Circuits
KS C 5210-1980(2020) General rules for reliability assured digital semiconductor integrated circuits
KS C IEC 60749-39:2006 Semiconductor devices－Mechanical and climatic test methods－Part 39：Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
KS C 5218-1983(2013) Reliability assured complementary MOS digital semiconductor integrated circuits(Gates)
KS C 7202-1990(2021) General Rules for Reliability Assured Analogue Semiconducter Integrated Circuits
KS C 6049-1980 Environmental Testing Methods and Endurance Testing Methods for Semiconductor Integrated Circuits
KS C 6562-1996(2021) Essential ratings and characteristics for semiconductor pressure sensor elements
KS C 6562-1996(2016) Essential ratings and characteristics for semiconductor pressure sensor elements
KS C IEC 60749-39-2006(2021) Semiconductor devices－Mechanical and climatic test methods－Part 39：Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
KS C IEC 60749-39-2006(2016) Semiconductor devices－Mechanical and climatic test methods－Part 39：Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
KS C IEC 60749-21:2005 Semiconductor devices－Mechanical and climatic test methods－ Part 21：Solderability
KS C IEC 60749-21:2020 Semiconductor devices — Mechanical and climatic test methods — Part 21: Solderability
KS C 6049-1980(2020) Environmental Testing Methods and Endurance Testing Methods for Semiconductor Integrated Circuits
KS C IEC 60749-13:2002 Semiconductor devices-Mechanical and climatic test methods-Part 13:Salt atmosphere
KS C 6520-2021 Components and materials of semiconductor process —Measurement of wear characteristics by plasma
KS C IEC 60749-9:2020 Semiconductor devices — Mechanical and climatic test methods — Part 9: Permanence of marking
KS C IEC 60749-32:2021 Semiconductor devices — Mechanical and climatic test methods — Part 32: Flammability of plastic-encapsulated devices(externally induced)
KS C IEC 60749-9:2003 Semiconductor devices-Mechanical and climatic test methods-Part 9:Permanence of marking
KS C IEC 62007-1:2003 Semiconduct optoelectronic devices for fibre optic system applications ? Part 1：Essential ratings and characteristics
KS C IEC 60204-33:2010 Safety guideline for semiconductor fabrication equipment
KS C 6046-1978(2001) ENVIRONMENTAL TESTING METHODS AND ENDURANCE TESTING METHODS FOR DISCRETE SEMICONDUCTOR DEVICES
KS C 6046-1986 ENVIRONMENTAL TESTING METHODS AND ENDURANCE TESTING METHODS FOR DISCRETE SEMICONDUCTOR DEVICES
KS C IEC 60749-14-2006(2021) Semiconductor devices－Mechanical and climatic test methods－Part 14：Robustness of terminations(lead integrity)
KS C IEC 60749-14-2006(2016) Semiconductor devices－Mechanical and climatic test methods－Part 14：Robustness of terminations(lead integrity)
KS C 6520-2019 Components and materials of semiconductor process —Measurement of wear characteristics by plasma
KS C IEC 60749-24:2006 Semiconductor devices-Mechanical and climatic test methods-Part 24:Accelerated moisture resistance-Unbiased HAST
KS C IEC 62007-1-2003(2018)
KS C IEC 60749-14:2006 Semiconductor devices－Mechanical and climatic test methods－Part 14：Robustness of terminations(lead integrity)

KR-KS, cobalt semiconducting

KS C IEC 62951-1-2022 Semiconductor devices — Flexible and stretchable semiconductor devices — Part 1: Bending test method for conductive thin films on flexible substrates
KS C IEC 60747-14-10-2022 Semiconductor devices — Part 14-10: Semiconductor sensors — Performance evaluation methods for wearable glucose sensors
KS C IEC 60749-21-2020 Semiconductor devices — Mechanical and climatic test methods — Part 21: Solderability
KS C IEC 60749-9-2020 Semiconductor devices — Mechanical and climatic test methods — Part 9: Permanence of marking
KS C IEC 60749-32-2021 Semiconductor devices — Mechanical and climatic test methods — Part 32: Flammability of plastic-encapsulated devices(externally induced)

Hebei Provincial Standard of the People's Republic of China, cobalt semiconducting

DB13/T 5293-2020 Specifications for Maintenance of Semiconductor Characteristic Tracer
DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication

Danish Standards Foundation, cobalt semiconducting

DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
DS/EN 60749-21:2011 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
DS/EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
DS/EN 60749-9/Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
DS/EN 60749-9:2003 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
DS/EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
DS/EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
DS/EN 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
DS/EN 60747-5-2/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
DS/EN 60747-5-2:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

Association Francaise de Normalisation, cobalt semiconducting

NF C96-287-1*NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : guidelines for IC reliability qualification
NF C93-591:1990 Sectional specification for semi-flexible waveguides with flanges.
NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
NF EN 62779-2:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2 : caractérisation des performances d'interfaçage
NF EN IEC 63287-1:2021 Dispositifs à semiconducteurs - Lignes directrices génériques concernant la qualification des semiconducteurs - Partie 1 : lignes directrices concernant la qualification de la fiabilité des circuits intégrés
UTE C93-591U*UTE C93-591:1994 Electronic components. Semi-flexible waveguides with flanges.
NF A51-310*NF EN 13604:2013 Copper and copper alloys - Semiconductor devices, electronic and vacuum products made from high conductivity copper
NF C96-022-39*NF EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
NF EN IEC 62969-2:2018 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 2 : méthodes d'évaluation du rendement de la transmission d'énergie sans fil par résonance pour les capteurs de véhicules automobiles
NF C96-022-21:2005 Semiconductor devices - Mechanical and climatic test methods - Part 21 : solderability.
NF C96-022-21*NF EN 60749-21:2012 Semiconductor devices - Mechanical and climatic test methods - Part 21 : solderability
NF EN 60749-21:2012 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 21 : brasabilité
NF C96-022-39*NF EN IEC 60749-39:2022 Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
NF EN IEC 60749-39:2022 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 39 : mesure de la diffusivité d'humidité et de l'hydrosolubilité dans les matériaux organiques utilisés dans les composants à semiconducteurs
XP CEN/TS 16599:2014 Photocatalyse - Détermination des conditions d'irradiation pour tester les propriétés photocatalytiques de matériaux semi-conducteurs
NF C96-050-22*NF EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates
NF EN 62047-22:2014 Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 22 : méthode d'essai de traction électromécanique pour les couches minces conductrices sur des substrats souples
NF C96-022-14*NF EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods - Part 14 : robustness of terminations (lead integrity)
NF C96-022-9:2002 Semiconductor devices - Mechanical and climatic test methods - Part 9 : permamence of marking.
NF C96-051*NF EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
NF C96-022-9*NF EN 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9 : permanence of marking
NF EN 60749-9:2017 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 9 : permanence du marquage
NF EN 62373:2006 Essai de stabilité de température en polarisation pour transistors à effet de champ métal-oxyde-semiconducteur (MOSFET)
NF EN 60749-14:2004 Dispositifs de semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 14 : robustesse des sorties (intégrité des connexions)
NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
NF EN 60749-22:2003 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 22 : robustesse des contacts soudés
NF EN 61747-5:1999 Dispositifs d'affichages à cristaux liquides et à semiconducteurs - Partie 5 : méthodes d'essais d'environnement, d'endurance et mécaniques
NF C96-017:2020 Semiconductor devices - Part 17 : magnetic and capacitive coupler for basic and reinforced insulation
NF EN 60749-24:2005 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 24 : résistance à l'humidité accélérée - HAST sans polarisation
NF EN 61207-7:2014 Expression des performances des analyseurs de gaz - Partie 7 : analyseurs de gaz laser à semiconducteurs accordables
NF EN 60747-5-2:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-2 : dispositifs optoélectroniques - Valeurs limites et caractéristiques essentielles
NF EN 60747-5-2/A1:2003 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-2 : dispositifs optoélectroniques - Valeurs limites et caractéristiques essentielles
NF C93-801-1:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics.
NF C93-801-1*NF EN 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics
NF C96-005-2/A1*NF EN 60747-5-2/A1:2003 Discrete semiconductor devices and integrated circuits - Partie 5-2 : optoelectronic devices - Essential ratings and characteristics
NF C96-005-2*NF EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits - Part 5-2 : optoelectronic devices - Essential ratings and characteristics
NF C96-050-17*NF EN 62047-17:2015 Semiconductor devices - Micro-electromechanical devices - Part 17 : bulge test method for measuring mechanical properties of thin films
NF C96-047*NF EN IEC 60747-17:2020 Semiconductor devices - Part 17 : magnetic and capacitive coupler for basic and reinforced insulation

European Committee for Electrotechnical Standardization（CENELEC）, cobalt semiconducting

EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
EN 60749-21:2011 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
EN IEC 60749-39:2022 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
EN 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
EN 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
EN 62047-17:2015 Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films

ES-UNE, cobalt semiconducting

UNE-EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
UNE-EN 60749-21:2011 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
UNE-EN IEC 60749-39:2022 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Española de Normalización in March of 2022.)
UNE-EN 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)
UNE-EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)
UNE-EN IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)
UNE-EN 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
UNE-EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)
UNE-EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in January of 2014.)
UNE-EN 61207-7:2013/AC:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in September of 2015.)
UNE-EN 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (Endorsed by Asociación Española de Normalización in October of 2017.)

German Institute for Standardization, cobalt semiconducting

DIN EN IEC 63287-1:2020-06 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020 / Note: Date of issue 2020-05-08*Intended as replacem...
DIN 4000-18:1988-12 Tabular layouts of article characteristics for semiconductor diodes
DIN V VDE V 0884-10:2006 Semiconductor devices - Magnetic and capacitive couplers for safe isolation
DIN EN 60749-39:2007 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006); German version EN 60749-39:2006
DIN 4000-18:1988 Tabular layouts of article characteristics for semiconductor diodes
DIN 4000-20:1988 Tabular layouts of article characteristics for opto-electronic semiconductor devices
DIN EN 60749-21:2012-01 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2011); German version EN 60749-21:2011 / Note: DIN EN 60749-21 (2005-06) remains valid alongside this standard until 2014-05-12.
DIN EN 62779-2:2017 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (IEC 62779-2:2016); German version EN 62779-2:2016
DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
DIN EN 60749-39:2007-01 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006); German version EN 60749-39:2006 / Note: To be r...
DIN EN 13604:2013 Copper and copper alloys - Semiconductor devices, electronic and vacuum products made from high conductivity copper; German version EN 13604:2013
DIN EN 60749-9:2003 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2002); German version EN 60749-9:2002
DIN 50451-2:2003-04 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2: Calcium (Ca), cobalt (Co), chromium (Cr), copper (Cu), Iron (Fe), nickel (Ni) and zinc (Zn) in hydrofluoric acid with plasma-induced emission spect...
DIN EN 62373:2007 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
DIN EN 60749-14:2004-07 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003); German version EN 60749-14:2003 / Note: Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside th...
DIN EN 60749-9:2017-11 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (IEC 60749-9:2017); German version EN 60749-9:2017 / Note: DIN EN 60749-9 (2003-04) remains valid alongside this standard until 2020-04-07.
DIN EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003); German version EN 60749-14:2003
DIN EN IEC 60749-39:2021-07 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 47/2652/CDV:2020); English version prEN IEC 60749-39:2020 / Not...
DIN 41772:1979 Static power convertors; semiconductor rectifier equipment, shapes and letter symbols of characteristic curves
DIN EN 62373:2007-01 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
DIN EN 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
DIN 41772 Bb.1:1979 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
DIN 41772:1979-02 Static power convertors; semiconductor rectifier equipment, shapes and letter symbols of characteristic curves
DIN 41772 Beiblatt 1:1979-02 Static power convertors; semiconductor rectifier equipment, examples of characteristic curves for battery chargers
DIN EN 61207-7:2015-07 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013); German version EN 61207-7:2013 / Note: Applies in conjunction with DIN EN 61207-1 (2011-04).
DIN EN 60749-24:2004-09 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
DIN 50455-2:1999-11 Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
DIN EN 62047-22:2015-04 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014
DIN EN 60749-31:2003-12 Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic encapsulated devices (internally induced) (IEC 60749-31:2002 + Corr. 1:2003); German version EN 60749-31:2003 / Note: Under certain conditions, DIN EN 60749...
DIN EN 60749-43:2018-05 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017 / Note: To be replaced by DIN EN IEC 63287-1 (2020-06).
DIN EN 60749-32:2011-01 Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002 + Cor. :2003 + A1:2010); German version EN 60749-32:2003 + Cor. :2003 + A1:2010 / Note: DIN EN ...
DIN EN IEC 60749-39:2021 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 47/2652/CDV:2020); English version prEN IEC 60749-39:2020
DIN EN IEC 60749-39:2023-10 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2021); German version EN IEC 60749-39:2022 / Note: DIN...
DIN EN IEC 63287-1:2023-09 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021 / Note: DIN EN 60749-43 (2018-05) remains valid alongside this standard ...
DIN 41776:1983 Static power convertors; semiconductor rectifier equipment with I characteristic for charging of batteries; requirements

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, cobalt semiconducting

GB/T 13974-1992 Test methods for semiconductor deviece curve tracers
GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
GB/T 30116-2013 Requirements for semiconductor manufacturing facility electromagnetic compatibility
GB/T 13973-1992 General specification for semiconductor deviece curve tracers
GB/T 4855-1984 Families and products of linear amplifier for semiconductor integrated circuits
GB/T 24468-2009 Specification for definition and measurement of semiconductor equipment reliability,availability and maintainability(RAM)
GB/T 6815-1986 Families and variety of semiconductor integrated nonlinear circuits Variety of phase-looked loop
GB/T 6813-1986 Families and variety of semiconductor integrated nonlinear circuits Variety of timers
GB/T 6814-1986 Families and variety of semiconductor integrated nonlinear circuits Variety of analog switch
GB/T 6812-1986 Families and variety of semiconductor integrated nonlinear circuits Variety of analog multipliers-dividers
GB/T 29856-2013 Characterization of semiconducting single-walled carbon nanotubes using near infrared photoluminescence spectroscopy
GB/T 3048.3-1994 Test methods for determining electrical properties of electric cables and wires.Measurement of volumeresistivity of semi-conducting rubbers and plastics
GB/T 12844-1991 Series and products of nonlinear circuits for semiconductor integrated circuits--Products of sample/hold amplifiers
GB/T 3048.3-2007 Test methods for electrical properties of electric cables and wires.Part 3: Test of volume resistivity of semi-conducting rubbers and plastics

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, cobalt semiconducting

JEDEC JESD30E-2008 Descriptive Designation System for Semiconductor-device Packages
JEDEC JESD22-B108A-2003 Coplanarity Test for Surface-Mount Semiconductor Devices
JEDEC JESD30F-2013 Descriptive Designation System for Semiconductor-device Packages
JEDEC JESD30G-2016 Descriptive Designation System for Semiconductor-device Packages
JEDEC JESD22-B108B-2010 Coplanarity Test for Surface-Mount Semiconductor Devices
JEDEC JESD286-B-2000 Standard for Measuring Forward Switching Characteristics of Semiconductor Diodes
JEDEC JEP148-2004 Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
JEDEC JEP148A-2008 Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
JEDEC JEP148B-2014 Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment

National Metrological Technical Specifications of the People's Republic of China, cobalt semiconducting

JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers
JJF 1894-2021 Calibration Specification for Calibrators of Semiconductor Curve Tracers

American National Standards Institute （ANSI), cobalt semiconducting

ANSI/UL 1557-2013 Standard for Safety for Electrically Isolated Semiconductor Devices
ANSI/ASTM D3004:2008 Specification for Extruded Crosslinked and Thermoplastic Semi-conducting, Conductor and Insulation Shielding Materials
ANSI/ASTM E1161:1996 Test Method for Radiologic Examination of Semiconductors and Electronic Components
ANSI/UL 2360-2004 Test Methods for Determining the Combustibility Characteristics of Plastics Used in Semi-Conductor Tool Construction
BS EN IEC 63287-2:2023 Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile (British Standard)
ANSI/ASTM D6095:2012 Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials

Group Standards of the People's Republic of China, cobalt semiconducting

T/CIE 144-2022
T/ZSA 47-2020 Reliability test methods for power semiconductor devices in electric vehicle applications
T/GVS 006-2022 Method of measuring output deviation stability for semiconductor RF power supply and microwave power supply
T/CHES 70-2022 Technical Guidelines for Determination of Seasonal River Ecological Flow (Water Quantity) in Inland Arid and Semi-arid Areas
T/IAWBS 004-2021 General Requirements and Test Methods for Reliability Test of Power Semiconductor Modules Used in Electric Vehicles
T/SHPTA 014.2-2021 Modified polypropylene insulating compounds and semi-conductive shielding compounds for power cables of rated voltages from 6kV up to 35kV – Part 2 : Semi-conductive shielding compounds for polypropylene insulating power cables of rated voltages fro

Society of Automotive Engineers (SAE), cobalt semiconducting

SAE J1879-2007 Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications
SAE J1879-2014 Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications

RO-ASRO, cobalt semiconducting

STAS 12258/5-1986 OPTOELECTRONIG SEMICONDUCTOR DEVICES DISPLAYS Terminology and essential characteristres
STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
STAS 12258/7-1987 OPTOELECTRONIC SEMICONDIC- TOH DEVICES PHOTOVOLTAIC CELLS Terminology and essential cliarac! eristics
STAS 12258/2-1984 Optoelectronic semiconductor devices PIIOTODIODES Terminology and essentia] characteristics
STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics
STAS 12258/4-1986 Optoelectronic semiconductor devices LIGHT EMITTING DIODES Terminology and main characteristics
STAS 12123/1-1982 Semiconductor devices RECTIFIER DIODES Measuring methods for electrical and thermal characteristics
STAS 12123/4-1984 Semiconductor devices VARIABLE-CAPACITANCE DIODES Measuring methodes for electrical characteristics
STAS 12258/6-1987 OPTOELECTRONIC SEMICON- DUCTOR DEVICES INFRARED EMM1TING DIODES Terminology and essential characteristics
STAS SR CEI 748-2/A1-1994 DISPOZITIVE CU SEMICONDUCTOARE Circuite integrate. Partea 2: Circuite integrate digitale
STAS 12123/3-1983 Semiconductor devices VOLTAGE REFERENCE DIODES AND VOLTAGE REGULATOR DIODES Measuring methodes for electrical characteristics

Japanese Industrial Standards Committee (JISC), cobalt semiconducting

JIS C 7210:1977 General rules for reliability assured discrete semiconductor devices
JIS C 7021:1977 Environmental testing methods and endurance testing methods for discrete semiconductor devices
JIS C 7022:1979 Environmental testing methods and endurance testing methods for semiconductor integrated circuits
JIS C 7310:1979 General rules for reliability assured digital semiconductor integrated circuits
JIS C 7410:1981 General rules for reliability assured analogue semiconductor integrated circuits
JIS C 7312:1982 Reliability assured complementary MOS digital semiconductor integrated circuits (gates)
JIS B 9960-33:2012 Safety of machinery -- Electrical equipment of machines -- Part 33: Requirements for semiconductor fabrication equipment
JIS K 0315:2022 Method for measuring reducing trace gases by semiconductor-type trace gas measuring equipment

Institute of Electrical and Electronics Engineers (IEEE), cobalt semiconducting

IEEE Std 1005-1991 IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
IEEE Std 1005-1998 IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

American Society for Testing and Materials (ASTM), cobalt semiconducting

ASTM E1161-95 Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
ASTM D3004-02 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
ASTM D3004-97 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
ASTM D3004-08(2020) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
ASTM D3004-08 Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
ASTM D3004-08(2013) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
ASTM D4388-97 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4388-02 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4388-08 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4388-13 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM E1161-03 Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
ASTM F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
ASTM D6095-99 Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ASTM D6095-05 Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ASTM D6095-06 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ASTM D6095-12 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
ASTM F92-93(1998) Standard Practice for Determination of Character Yield of Inked Fabric Typewriter and Printer Ribbons
ASTM F928-93(1999) Standard Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
ASTM D6095-12(2023) Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials

Professional Standard - Environmental Protection, cobalt semiconducting

HJ 691-2014 Ambient air -Sampling technical guideline of semi-volatile organic compounds(SVOCs)

Professional Standard - Aerospace, cobalt semiconducting

QJ 1906A-1997 Destructive Physical Analysis (DPA) Methods and Procedures for Semiconductor Devices
QJ 1906-1990 器件

U.S. Military Regulations and Norms, cobalt semiconducting

ARMY MIL-M-63321 A (4)-1990 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
ARMY MIL-M-63321 A-1981 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)

IN-BIS, cobalt semiconducting

Guangdong Provincial Standard of the People's Republic of China, cobalt semiconducting

DB44/T 1895-2016 On-line rapid evaluation method for chromatic aberration consistency of semiconductor lighting devices

PH-BPS, cobalt semiconducting

PNS IEC 62373-1:2021 Semiconductor devices - Bias-temperature stability test for metal-ox ide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
PNS IEC 62830-4:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
PNS IEC 60749-43:2021 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Taiwan Provincial Standard of the People's Republic of China, cobalt semiconducting

CNS 5072-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Sealing Test)
CNS 6117-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Damp Heat Test)
CNS 8104-1981 Method for Measuring MOSFET Linear Threshold Voltage
CNS 5066-1983 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (General Rules)
CNS 5067-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Soft Solders for Heat Endurance)
CNS 5068-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Solderability Testing for Adhesion)
CNS 5076-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Vibration Test)
CNS 5073-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Shock Test)
CNS 5069-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Thermal Shock)
CNS 5070-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Cycle Test for Temperature)
CNS 5077-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Terminal Strength)
CNS 5547-1988 1
CNS 5074-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Free Fall)
CNS 5075-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Constant Acceleration)
CNS 6118-1988 1
CNS 5078-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Salt Mist Spray)
CNS 5071-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Cycle Test for Temperature & Humidity)

CENELEC - European Committee for Electrotechnical Standardization, cobalt semiconducting

EN 60749-21:2005 Semiconductor devices Mechanical and climatic test methods Part 21: Solderability
EN 62007-1:2000 Semiconductor Optoelectronic Devices for Fibre Optic System Applications Part 1: Essential Ratings and Characteristics

国家市场监督管理总局、中国国家标准化管理委员会, cobalt semiconducting

GB/T 4937.21-2018 Semiconductor devices—Mechanical and climatic test methods—Part 21: Solderability
GB/T 4937.14-2018 Semiconductor devices—Mechanical and climatic test methods—Part 14: Robustness of terminations（lead integrity）

(U.S.) Ford Automotive Standards, cobalt semiconducting

FORD FLTM BB 114-01-2002 PROCEDURE FOR SEMI-GUIDED WRAP BEND FIXTURE FOR TESTING AND ANALYSIS OF THE BENDABILITY OF ALUMINUM SHEET
FORD FLTM BB 114-02-2013 PROCEDURE FOR SEMI-GUIDED WRAP BEND FIXTURE FOR TESTING AND ANALYSIS OF THE BENDABILITY OF ALUMINUM SHEET
FORD FLTM BB 114-02-2014 PROCEDURE FOR SEMI-GUIDED WRAP BEND FIXTURE FOR TESTING AND ANALYSIS OF THE BENDABILITY OF ALUMINUM SHEET
FORD FLTM BB 114-1-2002 PROCEDURE FOR SEMI-GUIDED WRAP BEND FIXTURE FOR TESTING AND ANALYSIS OF THE BENDABILITY OF ALUMINUM SHEET

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, cobalt semiconducting

GJB 5914-2006 Methodsof destructive physical analysis for military semiconductor devices of all kinds of quality class

Underwriters Laboratories (UL), cobalt semiconducting

UL 2360-2000 Test Methods for Determining the Combustibility Characteristics of Plastics Used in Semi-Conductor Tool Construction

The American Road & Transportation Builders Association, cobalt semiconducting

AASHTO SLF4-2009 AASHTO Safety Leadership Forum IV - Reducing Fatalities by Half Revision 1

RU-GOST R, cobalt semiconducting

GOST 18986.21-1978 Reference diodes and stabistors. Method for measuring time drift of working voltage
GOST 19868-1974 Spectrometric linear amplifiers for transistorized detectors of ionizing radiations. Methods of measuring parameters
GOST 17772-1988 Semiconducting photoelectric detectors and receiving photoelectric devices. Methods of measuring photoelectric parameters and determining characteristics
GOST R 59740-2021 Optics and photonics. Semiconductor lasers for the determination of low concentrations of substances. Methods for measuring characteristics

Lithuanian Standards Office , cobalt semiconducting

LST EN 60749-39-2006 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006)
LST EN 60749-21-2011 Semiconductor devices - Mechanical and climatic test methods -- Part 21: Solderability (IEC 60749-21:2011)
LST EN 60749-14-2004 Semiconductor devices. Mechanical and climatic test methods. Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003)
LST EN 62373-2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006)
LST EN 60749-9-2003 Semiconductor devices. Mechanical and climatic test methods. Part 9: Permanence of marking (IEC 60749-9:2002)

中华人民共和国国家卫生和计划生育委员会, cobalt semiconducting

GB/T 11713-1989 Standard methods of analyzing low specific gamma radioactivity samples by semiconductor gamma spectrometers

AENOR, cobalt semiconducting

UNE-EN 60749-9:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 9: Permanence of marking.
UNE-EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
UNE-EN 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST

AT-OVE/ON, cobalt semiconducting

OVE EN IEC 63275-1:2021 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability (IEC 47/2679/CDV) (english version)
OVE EN IEC 60749-39:2020 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 47/2652/CDV) (english version)
OVE EN IEC 63284:2021 Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors (IEC 47/2681/CDV) (english version)

SE-SIS, cobalt semiconducting

SIS SEN 43 32 00-1973 Semiconductor devices. Survey of standards. International recommendations' validity as Swedish standard

Insulated Cable Engineers Association （ICEA), cobalt semiconducting

ICEA T-25-425-2015 GUIDE FOR ESTABLISHING STABILITY OF VOLUME RESISTIVITY FOR SEMICONDUCTING POLYMERIC COMPONENTS OF POWER CALBES
ICEA T-32-645-2012 TEST METHOD FOR ESTABLISHING VOLUME RESISTIVITY COMPATIBILITY OF WATER BLOCKING COMPONENTS WITH EXTRUDED SEMICONDUCTING SHIELD MATERIALS

ICEA - Insulated Cable Engineers Association Inc., cobalt semiconducting

T-25-425-2015-2015 GUIDE FOR ESTABLISHING STABILITY OF VOLUME RESISTIVITY FOR SEMICONDUCTING POLYMERIC COMPONENTS OF POWER CALBES
T-32-645-2012 Test Method for Establishing Volume Resistivity Compatibility of Water Blocking Components With Extruded Semiconducting Shield Materials

International Organization for Standardization (ISO), cobalt semiconducting

ISO 17299-5:2014 Textiles - Determination of deodorant property - Part 5: Metal-oxide semiconductor sensor method

European Committee for Standardization (CEN), cobalt semiconducting

PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions

未注明发布机构, cobalt semiconducting

BS EN 61207-7:2013(2015) Expression of performance of gas analyzers Part 7 : Tuneable semiconductor laser gas analyzers
BS EN 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods Part 43 : Guidelines for IC reliability qualification plans

Professional Standard - Post and Telecommunication, cobalt semiconducting

YD/T 2001.1-2009 Semiconductor optoelectronic devices for fibre optic system applications.Part 1:Specification template for essential rating and characteristics

ITU-T - International Telecommunication Union/ITU Telcommunication Sector, cobalt semiconducting

ITU-T K.28-1991 Characteristics of Semi-Conductor Arrester Assemblies for the Protection of Telecommunications Installations (Study Group V) 15 pp

International Telecommunication Union (ITU), cobalt semiconducting

ITU-T K.28-1993 Characteristics of Semi-Conductor Arrester Assemblies for the Protection of Telecommunications Installations - Protection Against Interference (Study Group V) 14 pp

IX-CISPR, cobalt semiconducting

CISPR 11:2015/AMD1:2016/AMD2:2019 CSV Requirements for semiconductor power converters (SPC)/ Improvement of repeatability for measurements in the frequency range 1-18 GHz