ZH
RU
ES

field electron microscope

field electron microscope, Total:453 items.

In the international standard classification, field electron microscope involves: Air quality, Optical equipment, Optics and optical measurements, Analytical chemistry, Metrology and measurement in general, Vocabularies, Welding, brazing and soldering, Education, Electronic component assemblies, Medical equipment, Optoelectronics. Laser equipment, Electronic components in general, Testing of metals, Linear and angular measurements, Protection against crime, Thermodynamics and temperature measurements, Technical drawings, Surface treatment and coating, Electronic display devices, Materials for the reinforcement of composites, Physics. Chemistry, Non-ferrous metals, Construction materials, Raw materials for rubber and plastics, Fluid power systems, Materials for aerospace construction, Animal feeding stuffs, Aerospace fluid systems and components, Hydraulic fluids, Test conditions and procedures in general, Photography, Iron and steel products, Semiconductor devices, Integrated circuits. Microelectronics, Ceramics, Nuclear energy engineering, Paints and varnishes, Medical sciences and health care facilities in general, Paper and board, Microbiology, Paint ingredients, Textile fibres.

American Society for Testing and Materials (ASTM), field electron microscope

ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM D3849-95a(2000) Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
ASTM D3849-07 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM D3849-22 Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM D7200-06 Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in Mines and Quarries, by Phase Contrast Microscopy and Transmission Electron Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3060-16 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM D3849-02 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-04 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM D3849-14a Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM D5756-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
ASTM D5756-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM D5755-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
ASTM D5755-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
ASTM D5756-02(2008) Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Surface Loading
ASTM F3294-18 Standard Guide for Performing Quantitative Fluorescence Intensity Measurements in Cell-based Assays with Widefield Epifluorescence Microscopy
ASTM D5755-03 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
ASTM D5755-09 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
ASTM D5755-09(2014)e1 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D6056-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

British Standards Institution (BSI), field electron microscope

BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 19056-2:2019 Microscopes. Definition and measurement of illumination properties - Illumination properties related to the colour in bright field microscopy
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
18/30339980 DC BS ISO 19056-2. Microscopes. Definition and measurement of illumination properties. Part 2. Illumination properties related to the colour in bright field microscopy
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 10936-1:2002 Optics and optical instruments. Operation microscopes. Requirements and test methods
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
15/30292710 DC BS ISO 19214. Guidelines for growth direction determination of wirelike crystals by transmission electron microscopy
BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 13794:2019 Ambient air. Determination of asbestos fibres. Indirect-transfer transmission electron microscopy method
BS ISO 10312:2019 Ambient air. Determination of asbestos fibres. Direct transfer transmission electron microscopy method
BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
PD IEC TR 62977-2-4:2018 Electronic displays. Transparent displays. Overview of application scenarios
BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
BS PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
18/30351714 DC BS ISO 21363. Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 10936-1:2017 Tracked Changes. Optics and photonics. Operation microscopes. Requirements and test methods
BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS EN ISO 17751-2:2023 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Scanning electron microscopy method
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
BS EN ISO 17751-2:2016 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends. Scanning Electron Microscopy method

Korean Agency for Technology and Standards (KATS), field electron microscope

KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B ISO 19012-1:2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS M 0044-1999
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
KS I ISO 10312:2008 Ambient air-Determination of asbestos fibers-Direct-transfer transmission electron microscopy method
KS I ISO 13794:2008 Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method
KS I ISO 13794-2008(2018) Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 8040-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8040-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS B ISO 14880-2:2013 Optics and photonics ― Microlens arrays ― Part 2: Test methods for wavefront aberrations
KS B ISO 14880-2:2008 Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations

Professional Standard - Machinery, field electron microscope

JB/T 5480-1991 Diaphragm of electron microscope
JB/T 5481-1991 Lamp filament of electron microscope
JB/T 7398.10-1994 Microscope - Dark field device
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 6842-1993 Test method of scanning electron microscope
JB/T 5383-1991 Specification for transmission electron microscope
JB/T 5384-1991 Scanning electron microscope - Technical specification
JB/T 5584-1991 Test method of transmission electron microscope amplification
JB/T 5585-1991 Test method of transmission electron microscope resolution
JB/T 5586-1991 Classification and basic parameter of transmission electron microscope

International Organization for Standardization (ISO), field electron microscope

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
ISO 10312:1995 Ambient air - Determination of asbestos fibres - Direct-transfer transmission electron microscopy method
ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
ISO 13794:2019 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
ISO 10312:2019 Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO/CD 20263:2023 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO/TR 14880-5:2010 Optics and photonics - Microlens arrays - Part 5: Guidance on testing
ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
ISO/TS 22292:2021 Nanotechnologies — 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
ISO 10936-1:2017 Optics and photonics - Operation microscopes - Part 1: Requirements and test methods
ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties

Japanese Industrial Standards Committee (JISC), field electron microscope

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
JIS K 3850-2:2000 Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method
JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy

KR-KS, field electron microscope

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS B ISO 10936-1-2023 Optics and photonics — Operation microscopes — Part 1: Requirements and test methods

Association Francaise de Normalisation, field electron microscope

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF ISO 13794:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert indirect
NF ISO 10312:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert direct
NF E48-651:1986 Hydraulic fluid power. Fluids. Determination of particulate contamination by the counting method using a microscope.
NF X43-050:2021 Air quality - Determination of the asbestos fiber concentration by transmission electron microscopy - Indirect method
NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
NF EN ISO 21363:2022 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à transmission
NF X21-016*NF ISO 15932:2014 Microbeam analysis - Analytical electron microscopy - Vocabulary
NF X43-050:1996 Air quality. Determination of the asbestos fiber concentration by transmission electron microscopy. Indirect method.
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
NF S10-132-4*NF EN ISO 14880-4:2006 Optics and phonotics - Microlens arrays - Part 4 : test methods for geometrical properties.
NF EN 60749-35:2006 Dispositifs à semiconducteurs - Méthodes d'essai climatiques et mécaniques - Partie 35 : microscopie acoustique pour composants électroniques à boîtier plastique
NF ISO 16000-27:2014 Air intérieur - Partie 27 : détermination de la poussière fibreuse déposée sur les surfaces par MEB (microscopie électronique à balayage) (méthode directe)
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

National Metrological Technical Specifications of the People's Republic of China, field electron microscope

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China, field electron microscope

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/QGCML 1940-2023
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/TIAA 014-2018 Optical measuring methods of display devices for Vehicle electronic rearview mirror

National Metrological Verification Regulations of the People's Republic of China, field electron microscope

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Education, field electron microscope

JY/T 011-1996 General Principles of Transmission Electron Microscopy
JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
JY/T 010-1996 General principles of analytical scanning electron microscopy

Guangdong Provincial Standard of the People's Republic of China, field electron microscope

DB44/T 1529.1-2015 Microscope objective designation part 1: flat field

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, field electron microscope

GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
GB/T 34831-2017 Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope
GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon nanomaterials involving biological effect
GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, field electron microscope

GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
GB/T 23414-2009 Microbeam analysis.Scanning electron microscopy.Vocabulary
GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/Z 21738-2008 Fundamental structures of one dimensional nano-materials.High resolution transmission electron microscopy characterization
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
GB/T 32189-2015 Atomic Force Microscopy Examination of Surface Roughness of Gallium Nitride Single Crystal Substrate
GB/T 22092-2018 Micrometer head and depth micrometer with electronic digital display
GB/T 22092-2008 Fixed micrometer and depth micrometer with electronic digital display
GB/T 2679.11-2008 Paper and board.Qualitative analysis of mineral filler and mineral coating.SEM/EDAX Method
GB/T 2679.11-1993 Paper and board. Qualitative analysis of mineral filler and mineral coating. SEM/EDAX method
GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic steps
GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells

Association of German Mechanical Engineers, field electron microscope

DVS 2803-1974 Electron-beam welding in microscopy (survey)
DVS 2801-1968 Resistance welding in microscopy (survey)
VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method

Military Standards (MIL-STD), field electron microscope

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-54222-1990 WATER BATH, ELECTRIC (MICROTOME TISSUE SPECIMEN SECTION MOUNTING)

国家市场监督管理总局、中国国家标准化管理委员会, field electron microscope

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)

Institute of Interconnecting and Packaging Electronic Circuits (IPC), field electron microscope

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC/JEDEC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components [Superseded: IPC TM-650 2.6.22]

RU-GOST R, field electron microscope

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
GOST R 56168-2014 Medical electrical equipment. Operation microscope. Specifications for governmental purchase
GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST ISO 16000-27-2017 Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
GOST R 8.697-2010 State system for ensuring the uniformity of measurements. Interpenar spacings in crystals. Method for measurement by means of a transmission electron microscope

Professional Standard - Medicine, field electron microscope

YY 1296-2016 Optical and Photonic Surgical Microscopes Photohazards of Ophthalmic Surgical Microscopes

TIA - Telecommunications Industry Association, field electron microscope

TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
EIA-546A000-1989 Sectional Specification for a Field Portable Optical Microscope for Inspection of Optical Waveguides and Related Devices
EIA/TIA-546AA00-1990 Blank Detail Specification for Field Portable Optical Microscopes for Inspection of Optical Waveguides and Related Devices

German Institute for Standardization, field electron microscope

DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
DIN EN ISO 21363:2022-03 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020); German version EN ISO 21363:2022
DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
DIN EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); English version of DIN EN ISO 14880-2:2007-03
DIN EN 60749-35:2007-03 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
DIN ISO 16000-27:2014-11 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)

Professional Standard - Petroleum, field electron microscope

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, field electron microscope

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, field electron microscope

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

International Electrotechnical Commission (IEC), field electron microscope

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
IEC TR 62977-2-4:2018 Electronic displays - Part 2-4: Transparent displays - Overview of application scenarios

国家能源局, field electron microscope

SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

工业和信息化部, field electron microscope

YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy

Jiangsu Provincial Standard of the People's Republic of China, field electron microscope

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Professional Standard - Judicatory, field electron microscope

SF/T 0139-2023

American National Standards Institute （ANSI), field electron microscope

ANSI/TIA/EIA 573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ANSI/ASTM D6056:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy

Professional Standard - Commodity Inspection, field electron microscope

SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

ESDU - Engineering Sciences Data Unit, field electron microscope

SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM
SPB-M14-1-2010 Sept.10: Interactions and rheological properties of Asphaltenes studied by Atomic Force Microscopy

SE-SIS, field electron microscope

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
SIS SS 11 11 15-1985 Steel - Method for assessing the slag inclusion content - Microscopic methods - Manual counting of particles and calculation of size-distribution

European Committee for Standardization (CEN), field electron microscope

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
EN ISO 14880-1:2005 Optics and photonics - Microlens array - Part 1: Vocabulary
EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
prEN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
EN ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations

Danish Standards Foundation, field electron microscope

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
DS/EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

ES-UNE, field electron microscope

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)
UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
UNE-EN 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)

Professional Standard - Public Safety Standards, field electron microscope

GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

IT-UNI, field electron microscope

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

PH-BPS, field electron microscope

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

AENOR, field electron microscope

UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
UNE 77236:1999 AMBIENT AIR. DETERMINATION OF ASBESTOS FIBRES. DIRECT-TRANSFER TRANSMISSION ELECTRON MICROSCOPY METHOD.

Lithuanian Standards Office , field electron microscope

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Society of Automotive Engineers (SAE), field electron microscope

SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems

AT-ON, field electron microscope

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
OENORM EN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, field electron microscope

GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method
GJB 5384.23-2005 Test methods of performance for pyrotechnic composition Part 23: Determination of particles size distribution for solid smoke particles Electron microscope method

Military Standard of the People's Republic of China-General Armament Department, field electron microscope

GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy
GJB 8684.23-2015 Test methods for pyrotechnic properties - Part 23: Determination of particle size distribution of smoke solid particles by electron microscopy

CN-STDBOOK, field electron microscope

图书 a-4565 Practical Methods for Electron Microanalysis

未注明发布机构, field electron microscope

BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy

BE-NBN, field electron microscope

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

IPC - Association Connecting Electronics Industries, field electron microscope

IPC/JEDEC J-STD-035 CD-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components (Incorporates Amendment 1: January 2007)

Professional Standard - Nuclear Industry, field electron microscope

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

GOSTR, field electron microscope

PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry
PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry

YU-JUS, field electron microscope

JUS U.M1.056-1993 Concrete - Determination for contents and factor pore's distance of aerated concrete with line microscope analysis