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scanning microscope
scanning microscope, Total:102 items.
In the international standard classification, scanning microscope involves: Non-ferrous metals, Optical equipment, Linear and angular measurements, Vocabularies, Optics and optical measurements, Analytical chemistry, Air quality, Education, Protection against crime, Electronic display devices, Surface treatment and coating, Construction materials, Non-destructive testing, Mechanical testing.
Korean Agency for Technology and Standards (KATS), scanning microscope
British Standards Institution (BSI), scanning microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
International Organization for Standardization (ISO), scanning microscope
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
- ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
BE-NBN, scanning microscope
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
Japanese Industrial Standards Committee (JISC), scanning microscope
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
German Institute for Standardization, scanning microscope
- DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
KR-KS, scanning microscope
National Metrological Technical Specifications of the People's Republic of China, scanning microscope
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Machinery, scanning microscope
National Metrological Verification Regulations of the People's Republic of China, scanning microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Professional Standard - Education, scanning microscope
- JY/T 0582-2020 General Rules for Scanning Probe Microscopy Analytical Methods
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
- JY/T 0586-2020 General Rules for Analytical Methods of Laser Scanning Confocal Microscopy
American Society for Testing and Materials (ASTM), scanning microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E1813-96e1 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
- ASTM E1813-96(2002) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
- ASTM E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Professional Standard - Petroleum, scanning microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Shanghai Provincial Standard of the People's Republic of China, scanning microscope
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, scanning microscope
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
国家能源局, scanning microscope
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
Professional Standard - Commodity Inspection, scanning microscope
- SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
Association Francaise de Normalisation, scanning microscope
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
Professional Standard - Judicatory, scanning microscope
SE-SIS, scanning microscope
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
European Committee for Standardization (CEN), scanning microscope
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
RU-GOST R, scanning microscope
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, scanning microscope
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
Danish Standards Foundation, scanning microscope
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
Jiangsu Provincial Standard of the People's Republic of China, scanning microscope
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
ES-UNE, scanning microscope
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
Association of German Mechanical Engineers, scanning microscope
- VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
Professional Standard - Public Safety Standards, scanning microscope
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy