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spm scanning microscope
spm scanning microscope, Total:44 items.
In the international standard classification, spm scanning microscope involves: Analytical chemistry, Non-ferrous metals, Optical equipment, Optics and optical measurements, Linear and angular measurements, Vocabularies, Education, Air quality, Protection against crime, Thermodynamics and temperature measurements.
International Organization for Standardization (ISO), spm scanning microscope
- ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
- ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
British Standards Institution (BSI), spm scanning microscope
- BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Korean Agency for Technology and Standards (KATS), spm scanning microscope
Japanese Industrial Standards Committee (JISC), spm scanning microscope
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
National Metrological Technical Specifications of the People's Republic of China, spm scanning microscope
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Machinery, spm scanning microscope
National Metrological Verification Regulations of the People's Republic of China, spm scanning microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
KR-KS, spm scanning microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, spm scanning microscope
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
American Society for Testing and Materials (ASTM), spm scanning microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Professional Standard - Commodity Inspection, spm scanning microscope
- SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
Professional Standard - Education, spm scanning microscope
- JY/T 0582-2020 General Rules for Scanning Probe Microscopy Analytical Methods
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
- JY/T 0586-2020 General Rules for Analytical Methods of Laser Scanning Confocal Microscopy
Professional Standard - Petroleum, spm scanning microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Shanghai Provincial Standard of the People's Republic of China, spm scanning microscope
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, spm scanning microscope
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
国家能源局, spm scanning microscope
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
Professional Standard - Judicatory, spm scanning microscope
Group Standards of the People's Republic of China, spm scanning microscope