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Separation of impurities
Separation of impurities, Total:36 items.
In the international standard classification, Separation of impurities involves: Semiconductor devices, Pipeline components and pipelines, Plant and equipment for the food industry, Analytical chemistry, Semiconducting materials, Non-ferrous metals, Inorganic chemicals, Organic chemicals, Milk and milk products, Testing of metals, Water quality.
Group Standards of the People's Republic of China, Separation of impurities
- T/CASAS 010-2019 Determination of Trace Impurities Concentration and Distribution in GaN Materials by Secondary Ion Mass Spectrometry
- T/CASAS 009-2019 Determination of Trace Impurities Concentration and Distribution in Semi-insulating SiC Materials by Secondary Ion Mass Spectrometry
- T/CBWQA 0003-2013 Dirt separator
Association Standard - China Boiler Water Quality Association Standards, Separation of impurities
CZ-CSN, Separation of impurities
Indonesia Standards, Separation of impurities
VN-TCVN, Separation of impurities
- TCVN 2315-1978 Reagents.Method for the determination of anions impurities
RU-GOST R, Separation of impurities
- GOST 10671.0-2016 Reagents. General requirements for methods of analysis of anions impurities
- GOST 10671.0-1974 Reagents. General requirements for methods of analysis of anions impurities
- GOST R 57061-2016 Copper. Measurement of impurities mass fraction in copper by an inductively coupled plasma mass spectrometry method
American Society for Testing and Materials (ASTM), Separation of impurities
- ASTM E1438-06 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
- ASTM D5996-05 Standard Test Method for Measuring Anionic Contaminants in High-Purity Water by On-Line Ion Chromatography
- ASTM UOP720-93 Impurities in High Purity p-Xylene by GC
HU-MSZT, Separation of impurities
International Organization for Standardization (ISO), Separation of impurities
- ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
- ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
Association Francaise de Normalisation, Separation of impurities
- NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Separation of impurities
- GB/T 20176-2006 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of boron atomic concentration in silicon using uniformly doped materials
- GB/T 31197-2014 Inorganic chemicals for industrial use.Determination of impurity anions.Ion chromatography method
- GB/T 5413.30-1997 Milk and milk powder--Determination of impurities
British Standards Institution (BSI), Separation of impurities
- BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
Professional Standard - Coal, Separation of impurities
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Separation of impurities
- GB/T 35925-2018 Determination of impurity fluorine ion in water soluble chemicals—Ion chromatography method
工业和信息化部, Separation of impurities
- YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
- YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
Japanese Industrial Standards Committee (JISC), Separation of impurities
- JIS K 1800:1978 Analytical methods for trace of impurities in high purity ethylene
Universal Oil Products Company (UOP), Separation of impurities
- UOP 720-2008 Impurities in, and Purity of, High Purity p-Xylene by GC
Korean Agency for Technology and Standards (KATS), Separation of impurities
- KS I ISO 6332:2021 Water quality ― Determination of iron —Spectrometric method using 1,10-phenanthroline
- KS D ISO 14237:2003 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of boron atomic concentration in silicon using uniformly doped materials
KR-KS, Separation of impurities
- KS I ISO 6332-2021 Water quality ― Determination of iron —Spectrometric method using 1,10-phenanthroline
Professional Standard - Automobile, Separation of impurities
- QC/T 575-1999 The analysis method of impurities in the working guideline of automobile cleanliness
Professional Standard - Non-ferrous Metal, Separation of impurities
- YS/T 473-2015 Methods for chemical analysis industrial gallium.Determination of impurity elements.ICP-MS analytical method
- YS/T 473-2005 Determination of impurity elements in gallium for industrial use-ICP-MS analytical method
- YS/T 742-2010 Methods for chemical analysis of gallium oxide Determination of impurities
Inductively coupled plasma mass spectrometer method