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X-ray diffractometer parameters
X-ray diffractometer parameters, Total:78 items.
In the international standard classification, X-ray diffractometer parameters involves: Optics and optical measurements, Testing of metals, Radiation protection, Occupational safety. Industrial hygiene, Non-destructive testing, Analytical chemistry, Products of the chemical industry, Production of metals, Non-metalliferous minerals, Linear and angular measurements, Radiation measurements, Electronic tubes, Education, Inorganic chemicals.
Professional Standard - Machinery, X-ray diffractometer parameters
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
- JB/T 8387-2010 Non-destructive testing instruments.Main parameter for the industrial detection X-ray tube
- JB/T 8387-1996 Main parameters of industrial flaw detection X-ray tube
- JB/T 7808-2010 Non-destructive testing instruments Main parameter series for the industrial X-ray equipment
- JB/T 7808-1995 Main parameter series of industrial X-ray flaw detector
National Metrological Verification Regulations of the People's Republic of China, X-ray diffractometer parameters
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
Professional Standard - Nuclear Industry, X-ray diffractometer parameters
- EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray diffractometer parameters
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 8362-1987 Retained austenite in steel--Quantitative determination--Method of X-ray diffractometer
- GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/Z 41399-2022 Non-destructive testing instruments—Industrial digital X-ray imaging system
- GB/T 12162.4-2010/ISO 4037 4-2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
- GB/T 12162.4-2010/ISO 4037 4:2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
- GB/T 12162.4-2010 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy.Part 4:Calibration of area and personal dosemeters in low energy X reference radiation fields
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
- GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
Professional Standard - Ferrous Metallurgy, X-ray diffractometer parameters
- YB/T 5337-2006 Determination method of metal lattice constant X-ray diffractometer method
- YB/T 5338-2006 X-ray Diffraction Method for Quantitative Determination of Retained Austenite in Steel
- YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
Professional Standard - Energy, X-ray diffractometer parameters
- NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
- NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
- NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method
工业和信息化部, X-ray diffractometer parameters
- YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel
Occupational Health Standard of the People's Republic of China, X-ray diffractometer parameters
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
RU-GOST R, X-ray diffractometer parameters
- GOST 22091.0-1984 X-ray devices. General requirements for measuring of parameters
- GOST R 8.698-2010 State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer
- GOST 28258-1989 Radioisotope X-ray devices. Types, main parameters and technical requirements
- GOST 17489-1972 Vidicons, X-ray. Basic parameters and dimensions
- GOST R 52125-2003 Sealed radionuclide X-radiation sources. Methods of parameters measurement
- GOST 25113-1986 Non-destructive testing x-ray apparatus for industrial flaw detection. General specifications
American National Standards Institute （ANSI), X-ray diffractometer parameters
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
国家市场监督管理总局、中国国家标准化管理委员会, X-ray diffractometer parameters
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
British Standards Institution (BSI), X-ray diffractometer parameters
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Japanese Industrial Standards Committee (JISC), X-ray diffractometer parameters
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
American Society for Testing and Materials (ASTM), X-ray diffractometer parameters
- ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E1426-14(2019)e1 Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques
- ASTM E1426-98 Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
- ASTM E1426-98(2009)e1 Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
- ASTM E915-19 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-21 Standard Practice for Verifying the Alignment of X-Ray Diffraction Instruments for Residual Stress Measurement
- ASTM E1426-14 Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques
Korean Agency for Technology and Standards (KATS), X-ray diffractometer parameters
- KS D 0287-2005(2020) Standard test method for determining the effective elastic parameter for X-ray diffraction measurements of residual stress
- KS D 0287-2005 Standard test method for determining the effective elastic parameter for X-ray diffraction measurements of residual stress
- KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
German Institute for Standardization, X-ray diffractometer parameters
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN 6868-16:2019-05 Image quality assurance in diagnostic X-ray departments - Part 16: Documentation of clinical image processing parameters in digital X-ray systems
European Committee for Standardization (CEN), X-ray diffractometer parameters
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Association Francaise de Normalisation, X-ray diffractometer parameters
Danish Standards Foundation, X-ray diffractometer parameters
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Lithuanian Standards Office , X-ray diffractometer parameters
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Professional Standard - Customs, X-ray diffractometer parameters
- HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
AENOR, X-ray diffractometer parameters
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
IT-UNI, X-ray diffractometer parameters
IX-IX-IEC, X-ray diffractometer parameters
- IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy
International Organization for Standardization (ISO), X-ray diffractometer parameters
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
Professional Standard - Education, X-ray diffractometer parameters
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
Standard Association of Australia （SAA）, X-ray diffractometer parameters
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
RO-ASRO, X-ray diffractometer parameters
- STAS R 12771-1989 SPECIFICATION FOR X AND T REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATE METERS AND FOR DETERMINING THBIR RESPONSE AS FUNCTION OF PHOTON ENERGY