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scanning electron microscope
scanning electron microscope, Total:19 items.
In the international standard classification, scanning electron microscope involves: Paint ingredients, Air quality, Optical equipment, Vocabularies.
British Standards Institution (BSI), scanning electron microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
American Society for Testing and Materials (ASTM), scanning electron microscope
- ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
- ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
International Organization for Standardization (ISO), scanning electron microscope
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
Korean Agency for Technology and Standards (KATS), scanning electron microscope
Association Francaise de Normalisation, scanning electron microscope
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
KR-KS, scanning electron microscope
Japanese Industrial Standards Committee (JISC), scanning electron microscope
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0132:1997 General rules for scanning electron microscopy