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scanning electron microscope scan magnification
scanning electron microscope scan magnification, Total:186 items.
In the international standard classification, scanning electron microscope scan magnification involves: Optical equipment, Analytical chemistry, Optics and optical measurements, Vocabularies, Education, Linear and angular measurements, Electronic display devices, Protection against crime, Thermodynamics and temperature measurements, Surface treatment and coating, Air quality, Construction materials, Iron and steel products, Ceramics, Paints and varnishes, Semiconductor devices, Integrated circuits. Microelectronics, Medical sciences and health care facilities in general, Metrology and measurement in general, Paint ingredients.
American Society for Testing and Materials (ASTM), scanning electron microscope scan magnification
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
- ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
- ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
Shanghai Provincial Standard of the People's Republic of China, scanning electron microscope scan magnification
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
Japanese Industrial Standards Committee (JISC), scanning electron microscope scan magnification
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
International Organization for Standardization (ISO), scanning electron microscope scan magnification
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
- ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
- ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, scanning electron microscope scan magnification
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
- GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness
National Metrological Technical Specifications of the People's Republic of China, scanning electron microscope scan magnification
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery, scanning electron microscope scan magnification
National Metrological Verification Regulations of the People's Republic of China, scanning electron microscope scan magnification
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Korean Agency for Technology and Standards (KATS), scanning electron microscope scan magnification
KR-KS, scanning electron microscope scan magnification
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
British Standards Institution (BSI), scanning electron microscope scan magnification
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
- 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- BS EN ISO 17751-2:2023 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Scanning electron microscopy method
- DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Professional Standard - Education, scanning electron microscope scan magnification
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
Professional Standard - Petroleum, scanning electron microscope scan magnification
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
国家能源局, scanning electron microscope scan magnification
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
Professional Standard - Commodity Inspection, scanning electron microscope scan magnification
- SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method
Professional Standard - Judicatory, scanning electron microscope scan magnification
Group Standards of the People's Republic of China, scanning electron microscope scan magnification
Association Francaise de Normalisation, scanning electron microscope scan magnification
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
- NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
- NF ISO 16000-27:2014 Air intérieur - Partie 27 : détermination de la poussière fibreuse déposée sur les surfaces par MEB (microscopie électronique à balayage) (méthode directe)
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, scanning electron microscope scan magnification
- GB/T 23414-2009 Microbeam analysis.Scanning electron microscopy.Vocabulary
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 27788-2011 Microbeam analysis.Scanning electron microscopy.Guidelines for calibrating image magnification
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
- GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
- GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
- GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
- GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 43196-2023 Nanotechnology Scanning Electron Microscopy to Measure Nanoparticle Size and Shape Distribution
- GB/Z 26083-2010 Determination for Copper(Ⅱ) octaakoxyl-substituted phthalocyanine on graphite surface(scanning tunneling microscope)
Jiangsu Provincial Standard of the People's Republic of China, scanning electron microscope scan magnification
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
SE-SIS, scanning electron microscope scan magnification
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
European Committee for Standardization (CEN), scanning electron microscope scan magnification
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
- prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
RU-GOST R, scanning electron microscope scan magnification
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
- GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
- GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST ISO 16000-27-2017 Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
Danish Standards Foundation, scanning electron microscope scan magnification
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
German Institute for Standardization, scanning electron microscope scan magnification
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
- DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
- DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
- DIN ISO 16000-27:2014-11 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)
国家市场监督管理总局、中国国家标准化管理委员会, scanning electron microscope scan magnification
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
ES-UNE, scanning electron microscope scan magnification
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
Professional Standard - Public Safety Standards, scanning electron microscope scan magnification
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
- GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
- GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy
AENOR, scanning electron microscope scan magnification
- UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
Lithuanian Standards Office , scanning electron microscope scan magnification
- LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
AT-ON, scanning electron microscope scan magnification
- OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
BE-NBN, scanning electron microscope scan magnification
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
Association of German Mechanical Engineers, scanning electron microscope scan magnification
- VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
- VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
- VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
未注明发布机构, scanning electron microscope scan magnification
- JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
未注明发布机构, scanning electron microscope scan magnification
- JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
American National Standards Institute （ANSI), scanning electron microscope scan magnification
- ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
工业和信息化部, scanning electron microscope scan magnification
- SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy
Guangdong Provincial Standard of the People's Republic of China, scanning electron microscope scan magnification
- DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
GOSTR, scanning electron microscope scan magnification
- PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry