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single particle tracing

single particle tracing, Total:140 items.

In the international standard classification, single particle tracing involves: Particle size analysis. Sieving, Radiation measurements, Raw materials for rubber and plastics, Valves, Physics. Chemistry, Road vehicle systems, Farming and forestry, Air quality, Aerospace electric equipment and systems, Semiconductor devices, Analytical chemistry, Components for aerospace construction, Electronic display devices, Aerospace fluid systems and components, Space systems and operations, Integrated circuits. Microelectronics, Company organization and management, Electronic components in general, Optoelectronics. Laser equipment, On-board equipment and instruments, Services, Aircraft and space vehicles in general, Barrels. Drums. Canisters, Insulation.


Professional Standard - Education, single particle tracing

  • JY 0011-1990 Teaching single trace cathode - rad oscilloscope

Society of Automotive Engineers (SAE), single particle tracing

  • SAE J2970-2023 Minimum Performance Requirements for Non-Refrigerant Tracer Gases and Electronic Tracer Gas Leak Detectors
  • SAE J2970-2012 Minimum Performance Requirements for Non-Refrigerant Tracer Gasses and Electronic Tracer Gas Leak Detectors

International Organization for Standardization (ISO), single particle tracing

  • ISO/DIS 19430 Determination of particle size distribution and number concentration by particle tracking analysis (PTA)
  • ISO 21501-3:2007 Determination of particle size distribution - Single particle light interaction methods - Part 3: Light extinction liquid-borne particle counter
  • ISO 21501-2:2007 Determination of particle size distribution - Single particle light interaction methods - Part 2: Light scattering liquid-borne particle counter
  • ISO 21501-3:2019 Determination of particle size distribution — Single particle light interaction methods — Part 3: Light extinction liquid-borne particle counter
  • ISO 21501-2:2019 Determination of particle size distribution — Single particle light interaction methods — Part 2: Light scattering liquid-borne particle counter
  • ISO 21501-4:2007 Determination of particle size distribution - Single particle light interaction methods - Part 4: Light scattering airborne particle counter for clean spaces
  • ISO 21501-4:2018 Determination of particle size distribution - Single particle light interaction methods - Part 4: Light scattering airborne particle counter for clean spaces
  • ISO 21501-4:2018/Amd 1:2023 Determination of particle size distribution — Single particle light interaction methods — Part 4: Light scattering airborne particle counter for clean spaces — Amendment 1
  • ISO 21501-1:2009 Determination of particle size distribution - Single particle light interaction methods - Part 1: Light scattering aerosol spectrometer
  • ISO 8942:2010 Rubber compounding ingredients - Carbon black - Determination of individual pellet crushing strength
  • ISO 12584:2013 Aerospace.Hydraulic fluid components.Expression of particulate contamination levels
  • ISO/TS 19590:2017 Nanotechnologies — Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry

British Standards Institution (BSI), single particle tracing

  • BS ISO 21501-3:2007 Determination of particle size distribution. Single particle light interaction methods. Light extinction liquid-borne particle counter
  • BS ISO 21501-2:2007 Determination of particle size distribution. Single particle light interaction methods. Light scattering liquid-borne particle counter
  • BS ISO 6980-1:2022 Tracked Changes. Nuclear energy. Reference beta-particle radiation. Methods of production
  • BS ISO 21501-3:2019 Determination of particle size distribution. Single particle light interaction methods - Light extinction liquid-borne particle counter
  • BS ISO 21501-4:2018 Determination of particle size distribution. Single particle light interaction methods. Light scattering airborne particle counter for clean spaces
  • BS ISO 21501-4:2007 Determination of particle size distribution. Single particle light interaction methods. Light scattering airborne particle counter for clean spaces
  • BS ISO 21501-2:2019 Determination of particle size distribution. Single particle light interaction methods - Light scattering liquid-borne particle counter
  • BS ISO 11171:2022 Tracked Changes. Hydraulic fluid power. Calibration of automatic particle counters for liquids
  • BS ISO 21501-4:2018+A1:2023 Determination of particle size distribution. Single particle light interaction methods - Light scattering airborne particle counter for clean spaces
  • 19/30385918 DC BS ISO 21501-3. Determination of particle size distribution. Single particle light interaction methods. Part 3. Light extinction liquid-borne particle counter
  • BS ISO 16844-4:2022 Tracked Changes. Road vehicles. Tachograph systems. Display unit communication interface
  • 19/30385915 DC BS ISO 21501-2. Determination of particle size distribution. Single particle light interaction methods. Part 2. Light scattering liquid-borne particle counter
  • BS ISO 21501-1:2009 Determination of particle size distribution - Single particle light interaction methods - Light scattering aerosol spectrometer
  • BS 3406-7:1988 Methods for determination of particle size distribution - Recommendations for single particle light interaction methods
  • BS IEC 62679-3-3:2016 Electronic paper displays - Optical measuring methods for displays with integrated lighting units
  • BS ISO 15864:2021 Tracked Changes. Space systems. General test methods for spacecraft, subsystems and units
  • DD IEC/TS 62396-2:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for single event effects testing for avionics systems
  • DD IEC/PAS 62396-2:2007 Process management for avionics. Atmospheric radiation effects - Guidelines for single event effects testing for avionics systems
  • BS EN 120007:1993 Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit
  • BS EN 50419:2022 Tracked Changes. Marking of electrical and electronic equipment (EEE) in respect to separate collection of waste EEE (WEEE)
  • BS IEC 62396-5:2014 Process management for avionics. Atmospheric radiation effects. Assessment of thermal neutron fluxes and single event effects in avionics systems
  • BS EN 120007:1991 Harmonized system of quality assessment for electronic components - Blank detail specification - Liquid crystal displays - Monochrome LCDs without electronic circuit
  • 21/30419440 DC BS ISO 21501-4 AMD1. Determination of particle size distribution. Single particle light interaction methods. Part 4. Light scattering airborne particle counter for clean spaces
  • BS ISO 8518:2022 Tracked Changes. Workplace air. Determination of particulate lead and lead compounds. Flame and electrothermal atomic absorption spectrometric methods
  • BS IEC 62396-2:2017 Tracked Changes. Process management for avionics. Atmospheric radiation effects. Guidelines for single event effects testing for avionics systems
  • DD IEC/TS 62396-4:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects
  • DD IEC/PAS 62396-4:2007 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects
  • BS IEC 62396-1:2012 Process management for avionics. Atmospheric radiation effects. Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
  • BS DD IEC/TS 62396-1:2006 Process management for avionics - Atmospheric radiation effects - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
  • BS IEC 62396-1:2016 Process management for avionics. Atmospheric radiation effects. Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
  • PD IEC TR 62396-8:2020 Process management for avionics. Atmospheric radiation effects. Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines
  • BS EN 62396-1:2016 Process management for avionics. Atmospheric radiation effects - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
  • DD IEC/TS 62396-1:2006 Process management for avionics. Atmospheric radiation effects - Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
  • BS EN 60749-44:2016 Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
  • PD IEC TR 61948-2:2019 Tracked Changes. Nuclear medicine instrumentation. Routine tests. Scintillation cameras and single photon emission computed tomography imaging
  • PD CEN ISO/TS 19590:2019 Nanotechnologies. Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry
  • DD IEC/TS 62396-3:2008 Process management for avionics. Atmospheric radiation effects - Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
  • DD IEC/PAS 62396-3:2007 Process management for avionics. Atmospheric radiation effects - Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
  • BS EN 61466-1:2016 Tracked Changes. Composite string insulator units for overhead lines with a nominal voltage greater than 1000 V. Standard strength classes and end fittings

IETF - Internet Engineering Task Force, single particle tracing

German Institute for Standardization, single particle tracing

  • DIN 66161:2010-10 Particle size analysis - Formula symbols, units
  • DIN EN 120007:1993-06 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
  • DIN EN 120007:1993 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
  • DIN 54407:2023-06 Testing of ion exchange resins - Determination of bead size distribution for mono- and heterodisperse ion exchange resins
  • DIN CEN ISO/TS 19590:2019-11*DIN SPEC 19286:2019-11 Nanotechnologies - Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry (ISO/TS 19590:2017); German version CEN ISO/TS 19590:2019
  • DIN EN 60749-44:2017-04 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, single particle tracing

  • GB/T 14853.6-2002 Rubber compounding ingredients--Carbon black,pelletized--Determination of individual pellet crushing trength
  • GB/T 3780.16-1983 Carbon black--Determination of individual pellet crush strength
  • GB/T 43226-2023 Single-event soft error time domain testing method for semiconductor integrated circuits used in aerospace applications
  • GB/T 42732-2023 Size Distribution and Concentration Measurement of Inorganic Nanoparticles in Aqueous Phases in Nanotechnology by Single Particle Inductively Coupled Plasma Mass Spectrometry

Military Standard of the People's Republic of China-General Armament Department, single particle tracing

  • GJB 7242-2011 Test methods and procedures for single-event effects
  • GJB 6777-2009 Testing method of single event effects in Cf radiation source for military electronic devices

(U.S.) Ford Automotive Standards, single particle tracing

American Society for Testing and Materials (ASTM), single particle tracing

  • ASTM E2834-12(2018) Standard Guide for Measurement of Particle Size Distribution of Nanomaterials in Suspension by Nanoparticle Tracking Analysis (NTA)
  • ASTM E2834-12(2022) Standard Guide for Measurement of Particle Size Distribution of Nanomaterials in Suspension by Nanoparticle Tracking Analysis (NTA)
  • ASTM E2834-12 Standard Guide for Measurement of Particle Size Distribution of Nanomaterials in Suspension by Nanoparticle Tracking Analysis (NTA)
  • ASTM E741-00(2006)e1 Standard Test Method for Determining Air Change in a Single Zone by Means of a Tracer Gas Dilution
  • ASTM E741-00 Standard Test Method for Determining Air Change in a Single Zone by Means of a Tracer Gas Dilution
  • ASTM E741-23 Standard Test Method for Determining Air Change in a Single Zone by Means of a Tracer Gas Dilution
  • ASTM F328-98 Standard Practice for Calibration of an Airborne Particle Counter Using Monodisperse Spherical Particles
  • ASTM E741-00(2006) Standard Test Method for Determining Air Change in a Single Zone by Means of a Tracer Gas Dilution
  • ASTM E741-11(2017) Standard Test Method for Determining Air Change in a Single Zone by Means of a Tracer Gas Dilution
  • ASTM F1192-11 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
  • ASTM F50-92(1996) Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
  • ASTM F50-92(2001)e1 Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
  • ASTM F50-07 Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
  • ASTM D5743-97 Standard Practice for Sampling Single or Multilayered Liquids, With or Without Solids, in Drums or Similar Containers
  • ASTM D5743-97(2003) Standard Practice for Sampling Single or Multilayered Liquids, With or Without Solids, in Drums or Similar Containers
  • ASTM D5743-97(2008) Standard Practice for Sampling Single or Multilayered Liquids, With or Without Solids, in Drums or Similar Containers
  • ASTM F50-12(2015) Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles

RU-GOST R, single particle tracing

  • GOST R ISO 21501-4-2012 Determination of particle size distribution. Single particle light interaction methods. Part 4. Light scattering airborne particle counter for clean spaces
  • GOST 22617.4-1991 Beet seeds. Methods for determinations of 1000 seeds mass and one sowing unit mass

US-FCR, single particle tracing

  • FCR NE-F-3-41T-1981 IN-PLACE TESTING OF HEPA FILTER SYSTEMS BY THE SINGLE-PARTICLE, PARTICLE-SIZE SPECTROMETER METHOD

ES-UNE, single particle tracing

  • UNE-EN 120007:1992 BDS: LIQUID CRISTAL DISPLAYS. MONOCHROME LCDS WITHOUT ELECTRONIC CIRCUIT. (Endorsed by AENOR in September of 1996.)
  • SAE AIR6219-2023 Development of Atmospheric Neutron Single Event Effects Analysis for Use in Safety Assessments
  • UNE-EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
  • UNE-EN 300386 V1.5.1:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)

Liaoning Provincial Standard of the People's Republic of China, single particle tracing

  • DB21/T 2789-2017 Technical Regulations for Maize Seed Production Suitable for Single Seed Sowing

Professional Standard - Aerospace, single particle tracing

  • QJ 10005-2008 Test guidelines of single event effects induced by heavy ions of semiconductor devices for space applications

Professional Standard - Agriculture, single particle tracing

Danish Standards Foundation, single particle tracing

  • DS/ISO 21501-4:2007 Determination of particle size distribution - Single particle light interaction methods - Part 4: Light scattering airborne particle counter for clean spaces

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, single particle tracing

  • GB/T 34955-2017 Atmospheric radiation effects—Guidelines for single event effects testing for avionics systems
  • GB/T 29024.4-2017 Determination of particle size distribution-Single particle light interaction methods-Part 4: Light scattering airborne particle counter for clean spaces
  • GB/T 34956-2017 Atmospheric radiation effects—Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

Group Standards of the People's Republic of China, single particle tracing

U.S. Military Regulations and Norms, single particle tracing

  • ARMY MIL-C-70723-1993 CARTRIDGE, CALIBER .50, M-858 BALL AND M-860 TRACER SHORT RANGE TRAINING AMMUNITION

SAE - SAE International, single particle tracing

  • SAE J2970-2015 Minimum Performance Requirements for Non-Refrigerant Tracer Gasses and Electronic Tracer Gas Leak Detectors

国家市场监督管理总局、中国国家标准化管理委员会, single particle tracing

  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
  • GB/T 39343-2020 Processor device single event effects experiment design and procedure for aerospace
  • GB/T 41270.7-2022 Process management for avionics—Atmospheric radiation effects—Part 7: Management of single event effects (SEE) analysis process in avionics design
  • GB/T 41270.9-2022 Process management for avionics—Atmospheric radiation effects—Part 9:Single event effect fault rate calculation methods and procedures for avionic equipment

SE-SIS, single particle tracing

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, single particle tracing

  • JEDEC JESD57-1996 Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation

CEN - European Committee for Standardization, single particle tracing

  • CEN ISO/TS 19590:2019 Nanotechnologies - Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry

Association Francaise de Normalisation, single particle tracing

  • XP T16-401*XP CEN ISO/TS 19590:2019 Nanotechnologies - Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry
  • NF EN 120007:1992 Spécification Particulière cadre : dispositifs de visualisation à cristaux liquides - LCD monochromes sans circuit électronique
  • NF C93-120-007*NF EN 120007:1992 Blank Detail Specification: Liquid cristal displays - Monochrome LCDs without electronic circuit
  • XP CEN ISO/TS 19590:2019 Nanotechnologies - Distribution granulométrique et concentration de nanoparticules inorganiques en milieu aqueux par spectrométrie de masse à plasma induit en mode particule unique
  • NF EN 60749-44:2016 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 44 : méthode d'essai des effets d'un événement isolé (SEE) irradié par un faisceau de neutrons pour des dispositifs à semiconducteurs

Lithuanian Standards Office , single particle tracing

  • LST EN 120007-2001 Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit

未注明发布机构, single particle tracing

  • BS ISO 13323-1:2000(2002) Determination of particle size distribution — Single - particle light interaction methods — Part 1 : Light interaction considerations

European Committee for Electrotechnical Standardization(CENELEC), single particle tracing

  • EN 120007:1992 Blank Detail Specification: Liquid Crystal Displays Monochrome LCDs without Electronic Circuit

Defense Logistics Agency, single particle tracing

API - American Petroleum Institute, single particle tracing

  • API 4091-1971 OPTICAL STUDIES OF AUTOMOTIVE AND NATURAL HAZES: SCATTERING FROM SINGLE PARTICLES - FINAL REPORT

Professional Standard - Electron, single particle tracing

  • SJ/T 10271-1991 Detail specification for electronic component.Monochrome display tube of type 31SG7Y14

International Electrotechnical Commission (IEC), single particle tracing

  • IEC 62396-2:2012 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
  • IEC 62396-5:2014 Process management for avioncs - Atmospheric radioation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
  • IEC TR 62396-8:2020 Process management for avionics - Atmospheric radiation effects - Part 8: Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment - Awareness guideline
  • IEC 62396-1:2012 Process management for avionics - Atmospheric radioation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
  • IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

Shandong Provincial Standard of the People's Republic of China, single particle tracing

  • DB37/T 3698.4-2020 Guidance for the creation of demonstration units for assured consumption Part 4: E-commerce operators

IN-BIS, single particle tracing

Society of Motion Picture and Television Engineers (SMPTE), single particle tracing

  • SMPTE 390M-2004 Television Material Exchange Format (MXF) Specialized Operational Pattern Atom (Simplified Representation of a Single Item)

Standard Association of Australia (SAA), single particle tracing

  • IEC 62396-1:2016 RLV Process management for avionics — Atmospheric radiation effects — Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

PH-BPS, single particle tracing

  • PNS IEC 60749-44:2021 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices




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