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Test Method for Measuring Resistivity, Hall Coefficient and Hall Mobility of Single Crystal Semiconductors

Test Method for Measuring Resistivity, Hall Coefficient and Hall Mobility of Single Crystal Semiconductors, Total:3 items.

In the international standard classification, Test Method for Measuring Resistivity, Hall Coefficient and Hall Mobility of Single Crystal Semiconductors involves: Semiconducting materials.

American Society for Testing and Materials (ASTM), Test Method for Measuring Resistivity, Hall Coefficient and Hall Mobility of Single Crystal Semiconductors

• ASTM F76-86(1996)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
• ASTM F76-86(2002) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
• ASTM F76-08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

Others:   Test Method for Measuring Resistivity, Hall Coefficient and Hall Mobility of Single Crystal Semiconductors.