ZH
RU
ES

Semiconductor General

Semiconductor General, Total:50 items.

In the international standard classification, Semiconductor General involves: Semiconductor devices, Shipbuilding and marine structures in general, Integrated circuits. Microelectronics, Components for aerospace construction, Telecommunication systems, Optoelectronics. Laser equipment, Electricity. Magnetism. Electrical and magnetic measurements.

British Standards Institution (BSI), Semiconductor General

• BS EN IEC 63287-1:2021 Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
• BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
• BS 9300:1969 Specification for semiconductor devices of assessed quality: generic data and methods of test

RU-GOST R, Semiconductor General

• GOST 11630-1984 Semiconductor devices. General specification

Defense Logistics Agency, Semiconductor General

• DLA QML-19500-QPD-2010 Semiconductor Devices, General Specification for
• DLA QML-19500-QPD-2011 Semiconductor Devices, General Specification for
• DLA QML-19500-2011 Semiconductor Devices, General Specification for
• DLA QML-19500-QPD-2012 Semiconductor Devices, General Specification for
• DLA QML-19500-2012 Semiconductor Devices, General Specification for
• DLA QML-19500-2013 Semiconductor Devices, General Specification for
• DLA SMD-5962-96890 REV A-2003 MICROCIRCUITS, DIGITAL, LOW VOLTAGE CMOS, 18-BIT GTL/LVT UNIVERSAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON

Danish Standards Foundation, Semiconductor General

• DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification

Association Francaise de Normalisation, Semiconductor General

• NF C96-287-1*NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : guidelines for IC reliability qualification
• NF EN IEC 63287-1:2021 Dispositifs à semiconducteurs - Lignes directrices génériques concernant la qualification des semiconducteurs - Partie 1 : lignes directrices concernant la qualification de la fiabilité des circuits intégrés
• NF C96-779-3*NF EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3 : functional type and its operational conditions

European Committee for Electrotechnical Standardization（CENELEC）, Semiconductor General

• EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
• EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
• EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions

International Electrotechnical Commission (IEC), Semiconductor General

• IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
• IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
• IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions

ES-UNE, Semiconductor General

• UNE-EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)

German Institute for Standardization, Semiconductor General

• DIN EN IEC 63287-1:2020-06 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020 / Note: Date of issue 2020-05-08*Intended as replacem...
• DIN EN IEC 63287-1:2023-09 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021 / Note: DIN EN 60749-43 (2018-05) remains valid alongside this standard ...

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor General

• GB/T 14548-1993 General specification for marine semiconductor conver-tors
• GB/T 43366-2023
• GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
• GB/T 7423.1-1987 Heat sink of semiconductor devices--Generic specification
• GB 7423.1-1987 General technical requirements for heat sinks for semiconductor devices
• GB/T 29299-2012 General specification of semiconductor laser rangefinder
• GB/T 13973-2012 General specification test methods for semiconductor device curve tracers

Professional Standard - Aerospace, Semiconductor General

• QJ 10006-2008 General Specification for Semiconductor Integrated Circuits for Aerospace
• QJ 10007-2008 General Specification for Semiconductor Discrete Devices for Aerospace

Professional Standard - Machinery, Semiconductor General

• JB/T 7064-1993 General Specifications for Semiconductor Inverters

国家市场监督管理总局、中国国家标准化管理委员会, Semiconductor General

• GB/T 38345-2019 General design requirements of semiconductor integrate circuit for space application

YU-JUS, Semiconductor General

• JUS N.R1.350-1979 Letter symbolsfor semiconductor devices. General symboh.

Military Standard of the People's Republic of China-General Armament Department, Semiconductor General

• GJB 8121-2013 General specification for semiconductor optoelectronic assembly
• GJB 8120-2013 General specification for semiconductor optoelectronic module
• GJB 597B-2012 General specification for semiconductor integrated circuits
• GJB 33B-2021 General Specification for Semiconductor Discrete Devices
• GJB 8190-2015 General specification for semiconductor solid-state light sources for aircraft exterior lighting
• GJB 7400-2011 General specification for semiconductor integrated circuits of qualitied manufacturer certification
• GJB 8119-2013 General specification for semiconductor optoelectronic device
• GJB 1420B-2011 General specification for packages of semiconductor integrated circuits
• GJB 923A-2004 General specification for packages of semiconductor discrete devices
• GJB 923B-2021 General Specification for Semiconductor Discrete Device Enclosures

RO-ASRO, Semiconductor General

• STAS 10954-1977 SEMICONDUCTOR RECTIFIERS General technical requirements for quality

Professional Standard - Post and Telecommunication, Semiconductor General

• YD 576-1992 Semiconductor rectifier equipments For telecommunications

SE-SIS, Semiconductor General

• SIS SS CECC 50001-1981 Blank detail specification: General purpose semiconductor diodes Vordruck fur Bauartspezi fika tion: Allzweck—Halbleiterdioden

Shaanxi Provincial Standard of the People's Republic of China, Semiconductor General

• DB61/T 1250-2019 General Specification for Sic (Silicon Carbide) Material Semiconductor Discrete Devices

Others:   General technical conditions for semiconductor laser range finder, General Technical Specifications for Semiconductor Laser Rangefinders, fluorescent general purpose, Universal semiconductor integrated circuit housing, Universal grating, Semiconductor optoelectronic components general, General Motors, General purpose vehicle, General Motors, general vehicle, General purpose for semiconductor photoelectric modules, Semiconductor General, General China, General purpose oven, General semiconductor integrated circuit, Universal lug, Fiber Universal, universal pcr, dsc universal, Universal semiconductor integrated circuits for aerospace.