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How to analyze energy spectrum

How to analyze energy spectrum, Total:278 items.

In the international standard classification, How to analyze energy spectrum involves: Analytical chemistry, Particle size analysis. Sieving, Radiation protection, Optical equipment, Optics and optical measurements, Medical sciences and health care facilities in general, Non-destructive testing, Test conditions and procedures in general, Geology. Meteorology. Hydrology, Electronic components in general, Products of the textile industry, Radiation measurements, Linear and angular measurements, Soil quality. Pedology, General methods of tests and analysis for food products, Nuclear energy engineering, Applications of information technology, Non-ferrous metals, Products of the chemical industry, Ferroalloys, Beverages, Tobacco, tobacco products and related equipment, Raw materials for rubber and plastics, Testing of metals, Wastes, Fuels, Paper and board, Physics. Chemistry, Milk and milk products.


US-CFR-file, How to analyze energy spectrum

  • CFR 33-148.277-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.277:How may Federal agencies and States participate in the application process?
  • CFR 50-23.75-2014 Wildlife and fisheries. Part23:Convention on international trade in endangered species of wild fauna and flora (cites). Section23.75:How can I trade internationally in vicun? a (Vicugna vicugna)?
  • CFR 50-23.71-2014 Wildlife and fisheries. Part23:Convention on international trade in endangered species of wild fauna and flora (cites). Section23.71:How can I trade internationally in sturgeon caviar?
  • CFR 50-23.74-2014 Wildlife and fisheries. Part23:Convention on international trade in endangered species of wild fauna and flora (cites). Section23.74:How can I trade internationally in personal sport-hunted trophies?
  • CFR 50-23.70-2014 Wildlife and fisheries. Part23:Convention on international trade in endangered species of wild fauna and flora (cites). Section23.70:How can I trade internationally in American alligator and other crocodilian skins, parts, and products?
  • CFR 50-23.69-2014 Wildlife and fisheries. Part23:Convention on international trade in endangered species of wild fauna and flora (cites). Section23.69:How can I trade internationally in fur skins and fur skin products of bobcat, river otter, Canada lynx, gray wolf, and bro

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, How to analyze energy spectrum

  • GB/T 17359-2012 Microbeam analysis.Quantitative analysis using energy dispersive spectrometry
  • GB/T 15244-2013 Microbeam analysis.Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
  • GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
  • GB/T 11713-2015 General analytical methods of high-purity germanium gamma spectrometer
  • GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
  • GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
  • GB/T 16141-1995 Analytical method for radionuclides by alpha spectrometry
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 42256-2022 Determination of ruthenium-106 in seawater─Gamma spectrometry
  • GB/Z 32494-2016 Analysis of Surface Chemical Analysis Auger Electron Spectroscopy Chemical Information Interpretation
  • GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
  • GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
  • GB/T 16140-1995 Gamma spectrometry method for analysis of radionuclides in water
  • GB/T 29731-2013 Surface chemical analysis.High-resolution Auger electron spectrometers.Calibration of energy scales for elemental and chemical-state analysis
  • GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
  • GB/T 11743-2013 Determination of radionuclides in soil by gamma spectrometry
  • GB/T 29732-2013 Surface chemical analysis.Medium resolution Auger electron spectrometers.Calibration of energy scales for elemental analysis
  • GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
  • GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
  • GB/T 16145-1995 Gamma spectrometry method of analysing radionuclides in biological samples
  • GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
  • GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
  • GB/T 25187-2010 Surface chemical analysis.Auger electron spectroscopy.Description of selected instrumental performance parameters
  • GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
  • GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
  • GB/T 30702-2014 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
  • GB/T 16145-2022 Gamma-ray spectrometry method for the determination of radionuclides in environmental and biological samples
  • GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
  • GB/T 29558-2013 Surface chemical analysis.Auger electron spectroscopy.Repeatability and constancy of intensity scale
  • GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
  • GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
  • GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
  • GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
  • GB/T 28971-2012 Cigarettes.Determination of tobacco specific N-nitrosamines in sidestream smoke.GC-TEA method
  • GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
  • GB/T 30919-2014 Styrene-butadiene rubber, raw.Determination of N-nitrosamines content by gas chromatography.Thermo energy analyzer method
  • GB/T 2679.11-2008 Paper and board.Qualitative analysis of mineral filler and mineral coating.SEM/EDAX Method
  • GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
  • GB/T 2679.11-1993 Paper and board. Qualitative analysis of mineral filler and mineral coating. SEM/EDAX method

国家市场监督管理总局、中国国家标准化管理委员会, How to analyze energy spectrum

  • GB/T 41072-2021 Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis
  • GB/T 41074-2021 Microbeam analysis—Method of specimen preparation for analysis of general powders using WDS and EDS
  • GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
  • GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
  • GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
  • GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
  • GB/T 16145-2020 Gamma spectrometry method of analysing radionuclides in biological samples

Korean Agency for Technology and Standards (KATS), How to analyze energy spectrum

  • KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 22309-2011(2016) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 22309-2011(2021) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 19319:2005 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 17974-2011(2016) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS M 0033-2008(2018) General rules for analytical methods in high performance liquid chromatography
  • KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 15471-2005(2020) Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 18118-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
  • KS D ISO 17974-2011(2021) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
  • KS D ISO TR 17270:2007 Microbeam analysis-Analytical transmission electron microscopy-Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
  • KS D ISO 17974:2011 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 22309:2011 Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 15471:2005 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 19318-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Reporting of methods used for charge control and charge correction
  • KS M 2800-1-2007 Determination of aromatic hydrocarbon types in oil spill dispersant-High performance liquid chromatography method with refrN index detection

IN-BIS, How to analyze energy spectrum

Japanese Industrial Standards Committee (JISC), How to analyze energy spectrum

  • JIS Z 8826:2005 Particle size analysis -- Photon correlation spectroscopy
  • JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
  • JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

International Organization for Standardization (ISO), How to analyze energy spectrum

  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
  • ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
  • ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
  • ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
  • ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
  • ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
  • ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 15647:2004 Nuclear energy - Isotopic analysis of uranium hexafluoride - Double-standard gas-source mass spectrometric method
  • ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
  • ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
  • ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
  • ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
  • ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
  • ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • ISO 22309:2011 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
  • ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
  • ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
  • ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
  • ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
  • ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
  • ISO 19668:2017 Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials

Professional Standard - Petroleum, How to analyze energy spectrum

  • SY/T 6189-1996 Quantitative Analysis Method of Rock Mineral Energy Spectrum
  • SY/T 6189-2018 Quantitative Analysis Method of Rock Mineral Energy Spectrum
  • SY/T 5252-2002 Natural gamma spectrographic method of analysing for core' sample
  • SY/T 5253-1991 Natural gamma ray spectrum analysis method of rock core High-purity germanium detector method

British Standards Institution (BSI), How to analyze energy spectrum

  • BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
  • BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
  • BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • BS ISO 17973:2016 Tracked Changes. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
  • 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
  • BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
  • BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
  • BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
  • 23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
  • BS ISO 15471:2016 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
  • BS ISO 16242:2011 Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
  • BS ISO 22309:2011 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
  • PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
  • BS ISO 18118:2015 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
  • BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
  • BS ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
  • BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • BS ISO 20903:2019 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
  • BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
  • 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
  • BS 7164-31.1:1997 Chemical tests for raw and vulcanized rubber - Determination of anti-degradants - High-performance liquid chromatography
  • BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials

American Society for Testing and Materials (ASTM), How to analyze energy spectrum

  • ASTM E1508-98 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-12 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-12a Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-98(2003) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-98(2008) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
  • ASTM E1508-12a(2019) Standard guide for quantitative analysis using energy dispersive spectroscopy
  • ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM F1375-92(2005) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM C1255-93(1999) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
  • ASTM C1255-18 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
  • ASTM C1255-93(2005) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
  • ASTM C1255-11 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
  • ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E2823-17 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Mass Spectrometry (Performance-Based)
  • ASTM D5839-96(2001) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
  • ASTM D5839-96(2006) Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry
  • ASTM D5143-06(2010)e1 Standard Test Method for Analysis of Nitroaromatic and Nitramine Explosive in Soil by High Performance Liquid Chromatography
  • ASTM E2994-21 Standard Test Method for Analysis of Titanium and Titanium Alloys by Spark Atomic Emission Spectrometry and Glow Discharge Atomic Emission Spectrometry (Performance-Based Method)
  • ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM E2594-20 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry (Performance-Based)
  • ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM D5839-15 Standard Test Method for Trace Element Analysis of Hazardous Waste Fuel by Energy-Dispersive X-Ray Fluorescence Spectrometry

Association Francaise de Normalisation, How to analyze energy spectrum

  • NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
  • NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
  • NF ISO 24236:2006 Analyse chimique des surfaces - Spectroscopie des électrons Auger - Répétabilité et constance de l'échelle d'énergie
  • NF ISO 17974:2009 Analyse chimique des surfaces - Spectromètres d'électrons Auger à haute résolution - Étalonnage des échelles d'énergie pour l'analyse élémentaire et de l'état chimique
  • NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
  • NF ISO 15647:2006 Énergie nucléaire - Analyse isotopique de l'hexafluorure d'uranium - Méthode du double étalon pour la spectrométrie de masse avec source de gaz
  • NF X21-004*NF ISO 22309:2012 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above.
  • NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
  • NF M60-457*NF ISO 15647:2006 Nuclear energy - Isotopic analysis of uranium hexafluoride - Double-standard gas-source mass spectrometric method.
  • NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
  • NF X21-072*NF ISO 16242:2012 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES).
  • NF ISO 22309:2012 Analyse par microfaisceaux - Analyse élémentaire quantitative par spectrométrie à sélection d'énergie (EDS) des éléments ayant un numéro atomique de 11 (Na) ou plus
  • NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
  • NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
  • NF ISO 29081:2010 Analyse chimique des surfaces - Spectroscopie d'électrons Auger - Indication des méthodes mises en oeuvre pour le contrôle et la correction de la charge
  • NF T70-357:2007 Energetic materials for defence - Physico-chemical analysis and properties - Determination of metallic elements by atomic absorption spectrophotometry
  • NF T70-310:1995 Energetic materials for defense. Physical-chemical analysis and properties. Hexogene of single and multibases materials. Method by liquid chromatography.

Group Standards of the People's Republic of China, How to analyze energy spectrum

  • T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
  • T/BSRS 027-2020 Technical specification for the analysis of gamma spectra of inert gas in gaseous effluents for nuclear power plants

Professional Standard - Electron, How to analyze energy spectrum

  • SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
  • SJ/Z 3206.2-1989 Laser source and its performance requirements for determination of emision spectrum

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, How to analyze energy spectrum

  • GB/T 16140-2018 Determination of radionuclides in water by gamma spectrometry
  • GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
  • GB/T 32565-2016 Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)
  • GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS)
  • GB/T 32998-2016 Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction

Xinjiang Provincial Standard of the People's Republic of China, How to analyze energy spectrum

  • DB65/T 4489-2022 Identification method of natural colored cotton EDS energy spectrum analysis method

未注明发布机构, How to analyze energy spectrum

  • BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
  • BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
  • BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
  • DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method

Institute of Electrical and Electronics Engineers (IEEE), How to analyze energy spectrum

  • IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
  • IEEE 1214-1992 Standard Multichannel Analyzer (MCA) Histogram Data Interchange Format for Nuclear Spectroscopy
  • IEEE Std 1214-1992 IEEE Standard Multichannel Analyzer (MCA) Histogram Data Interchange Format for Nuclear Spectroscopy

Professional Standard - Hygiene , How to analyze energy spectrum

  • WS/T 184-1999 Gamma spectrometry method of analysing radionuclides in air

German Institute for Standardization, How to analyze energy spectrum

  • DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 16242:2020-05 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
  • DIN ISO 22309:2015-11 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above (ISO 22309:2011)
  • DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
  • DIN ISO 22309:2015 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above (ISO 22309:2011)
  • DIN ISO 16242:2020 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
  • DIN 10473:1997 Determination of acid soluble -lactoglobulin content of heat-treated milk - Reversed phase, high performance liquid chromatographic method

Standard Association of Australia (SAA), How to analyze energy spectrum

  • AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
  • AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • AS 2134.1:1999 Recommended practice for chemical analysis by atomic absorption spectrometry - Flame atomic absorption spectrometry
  • AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

KR-KS, How to analyze energy spectrum

  • KS D ISO 15472-2003(2023)
  • KS D ISO TR 17270-2007 Microbeam analysis-Analytical transmission electron microscopy-Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

工业和信息化部/国家能源局, How to analyze energy spectrum

  • JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
  • JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer

中华人民共和国国家卫生和计划生育委员会, How to analyze energy spectrum

  • GB/T 11743-1989 Gamma spectrometry method of analysing radionuclides in soil
  • WS/T 184-2017 Gamma spectroscopy analysis method of radionuclides in air (replacing WS/T 184-1999)

Professional Standard - Agriculture, How to analyze energy spectrum

  • NY/T 2652-2014 Analyzing radionuclide <上标137>Cs in agro-products.sourceless efficiency calibration gamma spectrometry method

卫生健康委员会, How to analyze energy spectrum

  • WS/T 614-2018 Rapid analysis method of gamma energy spectrum of radionuclides in emergency situations

American National Standards Institute (ANSI), How to analyze energy spectrum

VN-TCVN, How to analyze energy spectrum

  • TCVN 7080-2010 Milk and dried milk.Determination of iodide content.Method using high-performance liquid chromatography

International Electrotechnical Commission (IEC), How to analyze energy spectrum

  • IEC 61455:1995 Nuclear instrumentation - MCA histogram data interchange format for nuclear spectroscopy

Professional Standard - Non-ferrous Metal, How to analyze energy spectrum

  • YS/T 273.14-2008 Chemical analysis methods and determination of physical performance of synthetic cryolite.Part 14: X-ray fluorescence spectrometric method for the determination of elements content
  • YS/T 581.10-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 10:Determination of sulphur content by X-ray fluorescence spectrometric method
  • YS/T 273.11-2006 Chemical analysis methods and physical properties of cryolite. Part 11:Determination of sulphur content by X-ray fluorescence spectrometric method
  • YS/T 581.16-2008 Chemical analysis methods and determination of physical performance of industrial aluminium fluoride.Part 16: X-ray fluorescence spectrometric method for the determination of elements content
  • YS/T 581.18-2012 Chemical analysis methods and physical properties of Aluminum Fluoride.Part 18:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets
  • YS/T 273.15-2012 Chemical analysis methods and physical properties of cryolite.Part 15:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets

Fujian Provincial Standard of the People's Republic of China, How to analyze energy spectrum

  • DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Taiwan Provincial Standard of the People's Republic of China, How to analyze energy spectrum

  • CNS 8413-2002 Methods of test for chemical, mass spectrometric, spectrochemical, nuclear, and radiochemical analysis of nuclear-grade plutonium nitrate solutions

工业和信息化部, How to analyze energy spectrum

  • YS/T 581.15-2012 Methods for chemical analysis and determination of physical properties of aluminum fluoride Part 15: Determination of elemental content by X-ray fluorescence spectrometry (tablet pressing) method

RO-ASRO, How to analyze energy spectrum

  • SR 2567-5-1996 Soft drinks - Methods of analysis - Determination of artificial sweeteners - Method using high-performance liquid chromatography

ES-UNE, How to analyze energy spectrum

  • UNE 73340-1:2021 Procedure for the determination of environmental radioactivity. Analytical methods. Part 1: Determination of the activity concentration of thorium (Th) isotopes by alpha spectrometry.




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