ZH
RU
ES
Instrument Life File
Instrument Life File, Total:137 items.
In the international standard classification, Instrument Life File involves: Technical product documentation, Equipment for the chemical industry, Equipment for petroleum and natural gas industries, Mechanical testing, Applications of information technology, Non-destructive testing, Audio, video and audiovisual engineering, Optoelectronics. Laser equipment, Linear and angular measurements, Aerospace electric equipment and systems, Semiconductor devices, Geology. Meteorology. Hydrology, Software development and system documentation, Medical equipment, Fibre optic communications, Electricity. Magnetism. Electrical and magnetic measurements, Electronic display devices, On-board equipment and instruments, Industrial automation systems, Adhesives, Astronomy. Geodesy. Geography, Fruits. Vegetables, Graphical symbols, Mining equipment, Construction industry, Cableway equipment.
German Institute for Standardization, Instrument Life File
- DIN 28000-2:2011 Chemical apparatus - Documentation in the life cycle of process plants - Part 2: Contents of documentation
- DIN 28000-2:2002 Chemical apparatus - Types of documents in the life cycle of process plants - Part 2: Definitions of the types of documents
- DIN EN 62304:2007 Medical device software - Software life-cycle processes (IEC 62304:2006); German version EN 62304:2006
- DIN ISO 15226:2017 Technical product documentation - Life cycle model and allocation of documents (ISO 15226:1999)
- DIN ISO 15226:1999 Technical product documentation - Life cycle model and allocation of documents (ISO 15226:1999)
- DIN EN ISO 17526:2003-10 Optic and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003); German version EN ISO 17526:2003
- DIN 28000-1:2002 Chemical apparatus - Types of documents in the life cycle of process plants - Part 1: Registration of the essential and supplementary types of documents
- DIN 28000-1:2011 Chemical apparatus - Documentation in the life cycle of process plants - Part 1: Registration of the essential and supplementary documentation
- DIN 28000-3:2009 Chemical apparatus - Documentation in the life cycle of process plants - Part 3: Flow diagrams and plant identification codes
- DIN EN ISO 17526:2003 Optic and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003); German version EN ISO 17526:2003
- DIN EN 62304:2016 Medical device software - Software life-cycle processes (IEC 62304:2006 + A1:2015); German version EN 62304:2006 + Cor.:2008 + A1:2015
- DIN EN 2591-406:1998 Aerospace series - Elements of electrical and optical connection; test methods - Part 406: Mechanical endurance; German version EN 2591-406:1998
- DIN 28000-1 Berichtigung 1:2012 Chemical apparatus - Documentation in the life cycle of process plants - Part 1: Registration of the essential and supplementary documentation, Corrigendum to DIN 28000-1:2011-01
- DIN EN 60749-23:2011-07 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011); German version EN 60749-23:2004 + A1:2011 / Note: DIN EN 60749-23 (2004-10) remains valid alongside this standard unt...
- DIN EN 62005-7:2004 Reliability of fibre optic interconnecting devices and passive optical components - Part 7: Life stress modeling (IEC 62005-7:2004); German version EN 62005-7:2004
- DIN EN 3745-410:2015 Aerospace series - Fibres and cables, optical, aircraft use - Test methods - Part 410: Thermal life; German and English version EN 3745-410:2015
- DIN EN 3745-410:2016 Aerospace series - Fibres and cables, optical, aircraft use - Test methods - Part 410: Thermal life; German and English version EN 3745-410:2015
- DIN EN 60749-23:2011 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011); German version EN 60749-23:2004 + A1:2011
- DIN EN 302-7:2013 Adhesives for load-bearing timber structures - Test methods - Part 7: Determination of the working life under referenced conditions; German version EN 302-7:2013
- DIN EN 60749-5:2018-01 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017 / Note: DIN EN 60749-5 (2003-09) remains valid alongside this standard until 2020...
- DIN EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003
- DIN 28000-4:2014 Chemical apparatus - Documentation in the life cycle of process plants - Part 4: Graphical symbols of valves, pipes and actuators
- DIN CWA 16633:2013 Ageing behaviour of Structural Components with regard to Integrated Lifetime Assessment and subsequent Asset Management of Constructed Facilities; English version CWA 16633:2013
Professional Standard - Petroleum, Instrument Life File
- SY/T 6144-2008 Technical specifications of neutron lifetime logging tool
- SY/T 6144-1995 Technical conditions of neutron lifetime logging tool
- SY 6144-2008 Annual neutron lifetime logging tool technical conditions
IN-BIS, Instrument Life File
Society of Automotive Engineers (SAE), Instrument Life File
Association Francaise de Normalisation, Instrument Life File
- NF C74-017*NF EN 62304:2006 Medical device software - Software life-cycle processes.
- NF E04-810*NF ISO 15226:1999 Technical product documentation. Live cycle model and allocation of documents.
- NF EN ISO 17526:2003 Optique et instruments d'optique - Lasers et équipements associés aux lasers - Durée de vie des lasers
- NF S10-128*NF EN ISO 17526:2003 Optics and optical instruments - Lasers and laser-related equipments - Lifetime of lasers.
- NF C96-022-23*NF EN 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life.
- NF C96-022-23/A1*NF EN 60749-23/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life.
- NF C93-913-7*NF EN 62005-7:2004 Reliability of fibre optic interconnecting devices and passive optical components - Part 7 : life stress modeling.
- NF EN 60749-23:2004 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23 : durée de vie en fonctionnement à haute température
- NF EN 60749-23/A1:2012 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23 : durée de vie en fonctionnement à haute température
- NF C96-022-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test.
- NF C96-022-5*NF EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
- NF EN 60749-5:2017 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5 : essai continu de durée de vie sous température et humidité avec polarisation
国家市场监督管理总局、中国国家标准化管理委员会, Instrument Life File
- GB/T 37929-2019 Non-destructive testing instruments—Testing methods for life of X-ray tubes
- GB/T 40214-2021 Document kinds for electrical and instrumentation projects in the process industry
European Committee for Electrotechnical Standardization（CENELEC）, Instrument Life File
- EN 62304:2006 Medical device software - Software life-cycle processes (Incorporating corrigendum November 2008)
- EN 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods Part 23: High temperature operating life (Incorporates Amendment A1: 2011)
American National Standards Institute （ANSI), Instrument Life File
Professional Standard - Water Conservancy, Instrument Life File
- SL/T 108-1995 The methods of model nomenclature for hydrologic instruments
- SL 108-2006 The methods of model and nomenclature for hydrologic instruments and automatic system of water resources and hydrology
- SL/T 244-1999 General specifications for equipment and instrument of hydrometric cableway measurements
British Standards Institution (BSI), Instrument Life File
- BS ISO/IEC 24789-1:2012 Identification cards. Card service life. Application profiles and requirements
- BS EN ISO 17526:2003 Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers
- BS EN 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods - High temperature operating life
- BS EN 60749-23:2004+A1:2011 Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
- BS ISO/IEC/IEEE 26531:2015 Systems and software engineering. Content management for product lifecycle, user and service management documentatio
- BS EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Steady-state temperature humidity bias life test
- BS EN 60749-5:2017 Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
Japanese Industrial Standards Committee (JISC), Instrument Life File
- JIS C 5036:1975 Endurance (electrical) testing method for electronic components
- JIS C 5037:1975 Endurance (mechanical) testing method for electronic components
National Metrological Technical Specifications of the People's Republic of China, Instrument Life File
- JJF 1203-2008 Calibration Specification for Electro-acoustic Products (Loudspeakers) Power Life-span Measurement Equipments
Korean Agency for Technology and Standards (KATS), Instrument Life File
- KS B ISO 17526:2020 Optics and optical instruments — Lasers and laser-related equipment — Lifetime of lasers
- KS B ISO 17526:2015 Optics and optical instruments ― Lasers and laser-related equipment ― Lifetime of lasers
- KS B ISO 17526:2013 Optics and optical instruments ?; Lasers and laser-related equipment ?; Lifetime of lasers
- KS B ISO 17526:2008 Optics and optical instruments-Lasers and laser-related equipment-Lifetime of lasers
- KS C IEC 60749-23:2006 Semiconductor devices－Mechanical and climatic test methods－Part 23：High temperature operating life
- KS C IEC 60749-23:2021 Semiconductor devices — Mechanical and climatic test methods — Part 23: High temperature operating life
- KS C IEC 60749-23-2006(2016) Semiconductor devices－Mechanical and climatic test methods－Part 23：High temperature operating life
KR-KS, Instrument Life File
- KS B ISO 17526-2020 Optics and optical instruments — Lasers and laser-related equipment — Lifetime of lasers
- KS C IEC 60749-23-2021 Semiconductor devices — Mechanical and climatic test methods — Part 23: High temperature operating life
Group Standards of the People's Republic of China, Instrument Life File
- T/ZAQ 10113-2022 Intermittent working life test equipment for semiconductor devices
GB-REG, Instrument Life File
Military Standard of the People's Republic of China-General Armament Department, Instrument Life File
- GJB 10196-2021 Accelerated life test method for solid-state microwave power devices
- GJB 9380-2018 Surface mount device solder joint life test method and evaluation requirements
- GJB 8349-2015 General requirements for random documents for military test instruments
International Organization for Standardization (ISO), Instrument Life File
- ISO 17526:2003 Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers
- ISO/IEC 24789-1:2012 Identification cards - Card service life - Part 1: Application profiles and requirements
Danish Standards Foundation, Instrument Life File
- DS/EN ISO 17526:2003 Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers
- DS/EN 60749-23/A1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
- DS/EN 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
- DS/EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
JP-JEITA, Instrument Life File
Lithuanian Standards Office , Instrument Life File
- LST EN ISO 17526:2004 Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)
- LST EN 60749-23-2004 Semiconductor devices. Mechanical and climatic test methods. Part 23: High temperature operating life (IEC 60749-23:2004)
- LST EN 60749-23-2004/A1-2011 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life (IEC 60749-23:2004/A1:2011)
AENOR, Instrument Life File
- UNE-EN ISO 17526:2004 Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)
- UNE-EN 62005-7:2005 Reliability of fibre optic interconnecting devices and passive optical components -- Part 7: Life stress modeling
- UNE-EN 60749-23:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
- UNE-EN 60749-23:2005/A1:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
- UNE-EN 60749-5:2003 Semiconductor devices. Mechanical and climatic test methods. Part 5: Steady-state temperature humidity bias life test
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Instrument Life File
- JEDEC JESD74A-2007 Early Life Failure Rate Calculation Procedure for Semiconductor Components
Shaanxi Provincial Standard of the People's Republic of China, Instrument Life File
- DB61/T 1448-2021 Intermittent life test procedures for high-power semiconductor discrete devices
European Committee for Standardization (CEN), Instrument Life File
- EN ISO 17526:2003 Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers ISO 17526:2003
RU-GOST R, Instrument Life File
American Welding Society (AWS), Instrument Life File
- WRC 374:1992 Papers Presented At The Conference On "Life Of Pressure Vessels" Held By The French AFIAP In 1989
Electronic Components, Assemblies and Materials Association, Instrument Life File
WRC - Welding Research Council, Instrument Life File
- BULLETIN 374-1992 "PAPERS PRESENTED AT THE CONFERENCE ON ""LIFE OF PRESSURE VESSELS"" HELD BY THE FRENCH AFIAP IN 1989
Professional Standard - Building Materials, Instrument Life File
- JC/T 551-1994 Toilet low water tank accessories - drain valve seal and life test method
ZA-SANS, Instrument Life File
- SANS 15289:2007 Systems and software engineering - Content of systems and software life cycle process information products (Documentation)
Standard Association of Australia （SAA）, Instrument Life File
- AS/NZS ISO/IEC 15289:2007 Systems and software engineering - Content of systems and software life cycle process information products (Documentation)
(U.S.) Telecommunications Industries Association , Instrument Life File
- TIA-1048-2005 Reliability of Fibre Optic Interconnecting Devices and Passive Components-Part 7: Life Stress Modeling (Adopted IEC 62005-7)
International Electrotechnical Commission (IEC), Instrument Life File
- IEC 60749-23:2004/AMD1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
- IEC 60749-23:2004 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
- IEC 60749-23:2004+AMD1:2011 CSV Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
- IEC 60278:1968 Documentation to be supplied with electronic measuring apparatus
- IEC 60749-23:2011 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
- IEC 62005-7:2004 Reliability of fibre optic interconnecting devices and passive optical components - Part 7: Life stress modeling
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Instrument Life File
- GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
- GB/T 13972-2010 General technical specifications for oceanographic hydrological instruments
- GB/T 13972-1992 General technical specifications for oceanographic hydrological instruments
- GB/T 9359-2016 Basic conditions and methods of environmental test for hydrological instrument
- GB/T 9359-2001 Basic conditions and methods of enviromental test for hydrologic instruments
- GB/T 15966-2007 Primary parameter and general specification for hydrologic instrument
- GB/T 15966-1995 Primary parameter and general specification for hydrologic instrument
- GB/T 18522.2-2002 General specification for hydrometric instruments--Part 2: Referential operating condition
- GB/T 32749-2016 General specifications for equipment and instrument by hydrometric cableway measurements
American Society for Testing and Materials (ASTM), Instrument Life File
- ASTM F3487-20 Standard Guide for Assessing the Service Life of a Brush Part Intended to Clean a Medical Device
Professional Standard - Electron, Instrument Life File
- SJ/Z 9077-1987 Accompanying documents of electronic measuring instrument
- SJ 2259-1982 Preparing for documentation of supplied with electronic measuring instruments
工业和信息化部, Instrument Life File
- SJ/T 11461.5.3-2016 Organic light-emitting diode display devices Part 5-3: Test methods for afterimage and lifetime
Professional Standard - Geology, Instrument Life File
- DZ 0038-1992 Regulations on Process Documentation of Geological Instrument Products
- DZ/T 0163-1995 Classification and numbering method for product design documents of geological instruments
- DZ/T 0198.8-1997 Changes to the process documents of the guidelines for the process management of geological instruments
- DZ 0042-1992 Regulations on product drawings and technical documents of geological instruments
- DZ/T 163-1995 Classification and numbering method for product design documents of geological instruments
- DZ/T 0042.4-1992 Geological Instrument Product Drawings and Technical Documents Preservation Method
- DZ/Z 5-1981 General rules for the preparation of product drawings and technical documents of geological instruments
- DZ/T 0042.1-1992 General rules for the preparation of product drawings and technical documents of geological instruments
- DZ/T 0042.3-1992 Method for modifying product drawings and technical documents of geological instruments
- DZ/Z 7-1981 Method for modifying product drawings and technical documents of geological instruments
- DZ/Z 8-1981 Geological Instrument Product Drawings and Technical Documents Preservation Method
- DZ/T 0042.2-1992 Requirements and formats for drawings and technical documents of geological instruments
- DZ/Z 6-1981 Requirements and formats for drawings and technical documents of geological instruments
- DZ/T 0138-1994 Standardization review of geological instrument product drawings and design documents
CZ-CSN, Instrument Life File
- CSN 35 6506-1983 Electronic measuring instruments Documentation supplied with electronic measuring
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Instrument Life File
- GB/T 15966-2017 Primary parameters and general technical conditions for hydrologic instruments
European Association of Aerospace Industries, Instrument Life File
- AECMA PREN 2349-317-1999 Aerospace Series Requirements and Test Procedures for Relays and Contactors Part 317: Service Life of Coil Switching Device Edition 3E
- AECMA PREN 2349-317-2000 Aerospace Series Requirements and Test Procedures for Relays and Contactors Part 317: Service Life of Coil Switching Device Edition P 1
RO-ASRO, Instrument Life File
- STAS 11142-1978 DOCUMENTS SUPPLIED WITH ELECTRONIC MEASURING INSTRUMENTS. SPECIFICATIONS FOR THEIR ELABORATION
KE-KEBS, Instrument Life File
- KS 09-533-1983 KENYA STANDARD SPECIFICATION FOR DOCUMENTATION TO BE SUPPLIED WITH ELECTRONIC MEASURING APPARATUS