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Device Characterization

Device Characterization, Total:5 items.

In the international standard classification, Device Characterization involves: Semiconductor devices, Structure and structure elements.

British Standards Institution (BSI), Device Characterization

• BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor

Institute of Electrical and Electronics Engineers (IEEE), Device Characterization

• IEEE 351-1972 IEEE Trial Use Standard Guide on Solid State Devices: Varactor Measurements Part II - Characterization of Large-Signal Devices
• IEEE Std 351-1972 IEEE Trial Use Standard Guide on Solid State Devices: Varactor Measurements Part II - Characterization of Large-Signal Devices

Society of Automotive Engineers (SAE), Device Characterization

• SAE AIR5396-2001 Characterization of Aircraft Icing Conditions

WRC - Welding Research Council, Device Characterization

• BULLETIN 456-2000 HEAT EXCHANGER FLOW CHARACTERIZATION—HXFLOW SOFTWARE: THEORY DOCUMENT AND USERS MANUAL

Others:   characterize, thin film device, Fiber optic device, Device profile, RF device, Device Oxidation, Magnetic Field Devices, gas device, logic device, Spectral device, discharge device, Ionic device, Coupler, Device Characterization, optical instrument, optical instrument, Flexible device, Optoelectronic devices, Characterization+, Characterization:.