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Device Oxidation
Device Oxidation, Total:12 items.
In the international standard classification, Device Oxidation involves: Piezoelectric and dielectric devices, Integrated circuits. Microelectronics, Semiconductor devices.
Professional Standard - Electron, Device Oxidation
- SJ 20965-2006 Specification for beryllia ceramic carrier used for photocon devices
- SJ 20518-1995 Specification for Ta2O5 films for use in piezoelectric devices
European Committee for Electrotechnical Standardization（CENELEC）, Device Oxidation
- EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Association Francaise de Normalisation, Device Oxidation
- NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
- NF EN 62417:2010 Dispositifs à semiconducteurs - Essais d'ions mobiles pour transistors à semiconducteur à oxyde métallique à effet de champ (MOSFET)
British Standards Institution (BSI), Device Oxidation
- BS EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
- BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
International Electrotechnical Commission (IEC), Device Oxidation
- IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Professional Standard - Medicine, Device Oxidation
- YY/T 0193-1994 Specifications for anodized film on aluminum parts of medical devices
Danish Standards Foundation, Device Oxidation
- DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
German Institute for Standardization, Device Oxidation
- DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
ES-UNE, Device Oxidation
- UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)