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Spectrum Analyzer Technology

Spectrum Analyzer Technology, Total:497 items.

In the international standard classification, Spectrum Analyzer Technology involves: Optics and optical measurements, Fibre optic communications, Electricity. Magnetism. Electrical and magnetic measurements, Special measuring equipment for use in telecommunications, Analytical chemistry, Vocabularies, Metalliferous minerals, Optoelectronics. Laser equipment, Particle size analysis. Sieving, Quality, Pipeline components and pipelines, Water quality, Test conditions and procedures in general, Non-ferrous metals, Surface treatment and coating, Electronic components in general, Laboratory medicine, Power stations in general, Cereals, pulses and derived products, Audio, video and audiovisual engineering, Telecommunication systems, Linear and angular measurements, Testing of metals, Iron and steel products, Ferrous metals, Protection against crime, Fuels, Physics. Chemistry, ENVIRONMENT. HEALTH PROTECTION. SAFETY, Farming and forestry, Lubricants, industrial oils and related products, Non-destructive testing, Equipment for petroleum and natural gas industries, Electrical equipment for working in special conditions, Nuclear energy engineering, Products of the chemical industry, Refractories, Coals, Company organization and management, Petroleum products in general, Air quality, Thermodynamics and temperature measurements, Photography, Electromagnetic compatibility (EMC), Medical equipment, Mining equipment, Industrial automation systems, Elements of buildings, Ceramics, Measurement of time, velocity, acceleration, angular velocity, Geology. Meteorology. Hydrology, Vacuum technology, Small craft, Protection against fire, Measurement of volume, mass, density, viscosity, Optical equipment.

German Institute for Standardization, Spectrum Analyzer Technology

DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN 10315:2006 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique; German version EN 10315:2006
DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN EN 10315:2006-10 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique; German version EN 10315:2006
DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
DIN EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
DIN EN IEC 61290-1-1:2019 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1563/CD:2018); Text in German and English
DIN EN 61290-10-4:2008-02 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007 / Note: Applies in conjunction with DIN EN 61291...
DIN EN IEC 61290-1-1:2022-07 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020); German version EN IEC 61290-1-1:2020 / Note: DIN EN 61290-1-1 (2016-03) remains valid alongside this standard until 2023-10...
DIN 51008-2:2001-12 Optical Emission Spectrometry (OES) - Part 2: Terms for flame and plasma systems
DIN EN 61290-1-2:2006-07 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005 / Note: DIN EN 61290-1-2 (1999-08) remains valid alongside this standard until 2008-10-0...
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN EN 61290-1-2:2006 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005
DIN 51008-1:2004 Optical emission spectrometry (OES) - Part 1: Terms for systems with sparks and low pressure discharges
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN 61290-5-2:2004-12 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN 51008-2:2001 Optical Emission Spectrometry (OES) - Part 2: Terms for flame and plasma systems
DIN EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
DIN 58960-2:1997 Photometer for analytical tests - Part 2: Technical design; classification, components, concepts
DIN 51008-1 Bb.1:2004 Optical emission spectrometry (OES) - Part 1: Terms for systems with sparks and low pressure discharges; Explanations
DIN EN 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2015); German version EN 61290-1-1:2015
DIN ISO 18115-1:2017 Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy (ISO 18115-1:2013)

Taiwan Provincial Standard of the People's Republic of China, Spectrum Analyzer Technology

CNS 14341-1999 Optical spectrum analyzer

U.S. Air Force, Spectrum Analyzer Technology

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

European Committee for Standardization (CEN), Spectrum Analyzer Technology

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers
EN 10315:2006 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique
EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
prEN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)
EN 725-4:2006 Advanced technical ceramics - Methods of test for ceramic powders - Part 4: Determination of oxygen content in aluminium nitride by XRF analysis

Association Francaise de Normalisation, Spectrum Analyzer Technology

NF C93-845:2006 Calibration of optical spectrum analyzers.
NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF A07-830:1973 Zinc for galvanizing purposes. Technical specification for emission spectral analysis.
NF EN 61290-5-1:2006 Amplificateurs optiques - Méthodes d'essais - Partie 5-1 : paramètres de réflectance - Méthode d'analyseur de spectre optique
NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
NF EN 61290-3-1:2004 Amplificateurs optiques - Méthodes d'essai - Partie 3-1 : paramètres du facteur de bruit - Méthode d'analyseur du spectre optique
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
NF EN IEC 61290-1-1:2020 Amplificateurs optiques - Méthodes d'essai - Partie 1-1 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre optique
NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
NF C93-845-2*NF EN 62150-2:2011 Fibre optic active components and devices - Test and measurement procedures - Part 2 : ATM-PON transceivers.
NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
NF EN 61290-5-2:2004 Amplificateurs optiques - Méthodes d'essai - Partie 5-2 : paramètres du facteur de réflexion - Méthode de l'analyseur de spectre électrique
NF A06-377*NF EN 10315:2006 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near by technique.
NF EN ISO 23674:2022 Cosmétiques - Méthodes d'analyse - Dosage direct des traces de mercure dans les cosmétiques par décomposition thermique et spectrométrie d'absorption atomique (analyseur de mercure)
NF EN 61290-3-2:2009 Amplificateurs optiques - Méthodes d'essais - Partie 3-2 : paramètres du facteur de bruit - Méthode de l'analyseur spectral électrique
NF EN 61290-10-1:2009 Amplificateurs optiques - Méthodes d'essai - Partie 10-1 : paramètres à canaux multiples - Méthode d'impulsion utilisant un interrupteur optique et un analyseur de spectre optique
NF X21-069-1:2010 Surface chemical analysis - Vocabulary - Part 1 : general terms and terms used in spectroscopy.
NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
NF EN 61290-10-2:2008 Amplificateurs optiques - Méthodes d'essai - Partie 10-2 : paramètres à canaux multiples - Méthode d'impulsion utilisant un analyseur de spectre optique stroboscopique
NF C93-805-10-4*NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4 : multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
NF EN 61290-10-4:2007 Amplificateurs optiques - Méthodes d'essai - Partie 10-4 : paramètres à canaux multiples - Méthode par soustraction de source interpolée en utilisant un analyseur de spectre optique
NF C93-805-10-2:2003 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer.
NF C93-805-10-2*NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer
NF EN 61290-1-2:2006 Amplificateurs optiques - Méthodes d'essai - Partie 1-2 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre électrique
NF T75-612*NF ISO 12787:2012 Cosmetics - Analytical methods - Validation criteria for analytical results using chromatographic techniques
NF ISO 12787:2012 Cosmétiques - Méthodes analytiques - Critères de validation pour les résultats analytiques utilisant des techniques chromatographiques
NF C42-691:1988 E techniques and apparatus. Pulse measurement and analysis, general considerations.
NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.
NF C93-805-5-3*NF EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3 : test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser.
NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).

British Standards Institution (BSI), Spectrum Analyzer Technology

BS EN 62129:2006 Calibration of optical spectrum analyzers
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
PD IEC TR 61292-2:2003 Optical amplifier technical reports. Theoretical background for noise figure evaluation using the electrical spectrum analyzer
BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS DD ISO/TS 11251:2010 Nanotechnologies. Characterization of volatile components in single-wall carbon nanotube samples using evolved gas analysis/gas chromatograph-mass spectrometry
BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS EN 10315:2006 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near by technique
BS EN 10315:2006(2010) Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near by technique
BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 18115-1:2010 Surface chemical analysis - Vocabulary - General terms and terms used in spectroscopy
BS ISO 18115-1:2013 Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy
BS EN ISO 23674:2022 Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
19/30398879 DC BS EN 61290-1-1. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
BS IEC 61832:1999 Analyser systems. Guide to technical enquiry and bid evaluation
18/30387381 DC BS EN 61290-1-1 Ed.4.0. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS ISO 12787:2012 Cosmetics. Analytical methods. Validation criteria for analytical results using chromatographic techniques
BS ISO 12787:2011 Cosmetics. Analytical methods. Validation criteria for analytical results using chromatographic techniques
BS EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1:Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS EN 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
BS EN 61290-1-2:2007 Optical amplifiers. Test methods. Power and gain parameters. Electrical spectrum analyzer method
21/30387777 DC BS EN ISO 23674. Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition. Atomic absorption spectrometry (mercury analyzer)
BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
PD IEC TR 63176:2019 Process analysis technology systems as part of safety instrumented systems
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
DD ENV 725-4-1994 Advanced technical ceramics. Methods of test for ceramic powders. Determination of oxygen content in aluminium nitride by XRF analysis
BS ISO 5-3:1996 Photography - Density measurements - Spectral conditions
BS ISO 18115-1:2023 Tracked Changes. Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
22/30433735 DC BS ISO 18115-1. Surface chemical analysis. Vocabulary - Part 1. General terms and terms used in spectroscopy

International Electrotechnical Commission (IEC), Spectrum Analyzer Technology

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers
IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC TR 61292-2:2003 Optical amplifier technical reports - Part 2: Theoretical background for noise figure evaluation using the electrical spectrum analyzer
IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61207-3:2002/COR2:2003 Gas analyzers - Expression of performance - Part 3：Paramagnetic oxygen analyzers; Technical Corrigendum 2
IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
IEC TR 61832:1999 Analyser systems - Guide to technical enquiry and bid evaluation
IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
IEC 61290-10-1:2003 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters; Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-1-1:1998 Optical fibre amplifiers - Basic specification - Part 1-1: Test methods for gain parameters - Optical spectrum analyzer
IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
IEC 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-2-2:1998 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
IEC 61290-10-2:2007 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
IEC 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyser
IEC 61342:1995 Nuclear instrumentation - Multichannel pulse height analyzers - Main characteristics, technical requirements and test methods
IEC TR 63176:2019 Process analysis technology systems as part of safety instrumented systems
IEC 61290-1-2:1998 Optical fibre amplifiers - Basic specification - Part 1-2: Test methods for gain parameters - Electrical spectrum analyzer

Danish Standards Foundation, Spectrum Analyzer Technology

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
DS/EN 10315:2006 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique
DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
DS/ISO 12787:2012 Cosmetics - Analytical methods - Validation criteria for analytical results using chromatographic techniques
DS/EN 61290-1-2:2006 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method

Japanese Industrial Standards Committee (JISC), Spectrum Analyzer Technology

JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS K 0214:2006 Technical terms for analytical chemistry (Chromatography part)
JIS K 0214:2013 Technical terms for analytical chemistry (Chromatography part)
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS K 0212:1990 Technical terms for analytical chemistry (optical part)
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
JIS C 6122-10-2:2010 Optical amplifiers -- Test methods -- Part 10-2: Multichannel parameters -- Pulse method using a gated optical spectrum analyzer
JIS C 6122-1-2:2011 Optical amplifiers -- Test methods -- Part 1-2: Power and gain parameters -- Electrical spectrum analyzer method
JIS C 6122-10-4:2012 Optical amplifiers -- Test methods -- Part 10-4: Multichannel parameters -- Interpolated source subtraction method using an optical spectrum analyzer
JIS K 0147-1:2017 Surface chemical analysis -- Vocabulary -- Part 1: General terms and terms used in spectroscopy

National Metrological Verification Regulations of the People's Republic of China, Spectrum Analyzer Technology

JJG 1035-2022 Communication Spectrum Analyzer
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Spectrum Analyzer Technology

GB/T 11461-1989 Generic specification of spectrum analzers
GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
GB/T 32199-2015 Infrared Spectroscopy Qualitative Analysis Technique General Rules
GB/T 32198-2015 General Rules for Quantitative Analysis Techniques of Infrared Spectroscopy
GB/T 41949-2022 Particle─Laser particle size analyser─Technical requirements
GB/T 9259-1988 Terminology of emission spectochemical analysis
GB/T 12519-1990 General specification of analytical instruments
GB/T 12519-2010 General specification of analytical instruments
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 33252-2016 Nanotechnology—Performance testing for laser confocal microscope Raman spectrometers
GB/T 31493-2015 Technical requirements for digital audio video analyzer
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 4470-1998 Analytical spectroscopic methods-Flame emission,atomic absorption and atomic fluorescence-Vocabulary
GB/T 23804-2009 General specifications for routine core analysis instruments
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 15471-1995 General specification and test method for logic analyzers
GB/T 27991-2011 Fundamental technical requirements for sediment measurement and particle size analysis instrument in open channel
GB/T 18294.1-2001 Technical identification method for fire Part 1:Ultraviolet spectrum analysis
GB/T 18294.6-2012 Technical indentification methods for fire.Part 6:Infrared spectroscopy analysis
GB/T 18294.1-2013 Technical identification methods for fire.Part 1:Ultraviolet spectrometry
GB/T 19267.3-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 3:Molecular fluorospectrometry
GB/T 19267.3-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 3: Molecular fluorospectrometry

Korean Agency for Technology and Standards (KATS), Spectrum Analyzer Technology

KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
KS M 0124-2017 Technical terms for analytical chemistry(Analytical instrument part)
KS M 0124-2017(2022) Technical terms for analytical chemistry(Analytical instrument part)
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS M 0127-2017 Technical terms for analytical chemistry(Chromatography part)
KS M 0127-2017(2022) Technical terms for analytical chemistry(Chromatography part)
KS C IEC 61290-5-1-2007(2022) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-5-1-2007(2017) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS C IEC 61290-3-1-2005(2020) Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C IEC 61290-3-1:2005 Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C IEC 61290-10-1-2005(2020) Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
KS C IEC 61290-10-2-2005(2020) Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS C IEC 61290-3-2-2005(2020) Optical amplifiers－Part 3－2：Test methods for noise figure parameters－Electrical spectrum analyzer method
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS C IEC 61290-10-1:2005 Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS D ISO 15471:2005 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS M ISO 12787:2014 Cosmetics — Analytical methods — Validation criteria for analytical results using chromatographic techniques
KS M ISO 12787-2014(2019) Cosmetics — Analytical methods — Validation criteria for analytical results using chromatographic techniques
KS C IEC 61290-10-2:2005 Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS C IEC 60469-2-2013(2018) Pulse techniques and apparatus－Part 2：Pulse measurement and analysis, general considerations
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B 50061-1-2006(2021) Automatic gravimetric filling instruments－Part 1：Metrological and technical requirements－Tests
KS B ISO 10934-2:2011 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy

Group Standards of the People's Republic of China, Spectrum Analyzer Technology

T/SHDSGY 031-2023 Technical specification for high-resolution spectrometer
T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
T/CIS 17006-2022 General technical specification of Fourier transform near-infrared spectrometer
T/CASME 133-2022 General technical requirements for sheet metal housing for mobile analyzers
T/CEC 426.2-2021 General Specifications for Electric Power Oil Testing Instruments Part 2: Gas Chromatograph

ZA-SANS, Spectrum Analyzer Technology

SANS 62129:2008 Calibration of optical spectrum analyzers
SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method

Professional Standard - Electron, Spectrum Analyzer Technology

SJ/T 10606-1994 Generic specification for video spectrum analyzers
SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum

Lithuanian Standards Office , Spectrum Analyzer Technology

LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 10315-2006 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique
LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
LST EN 61290-1-1-2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006)
LST EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
LST EN 61290-10-1-2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009)
LST EN 61290-5-2-2004 Optical amplifiers. Test methods. Part 5-2: Reflectance parameters. Electrical spectrum analyser method (IEC 61290-5-2:2003)
LST EN 61290-10-2-2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007)
LST EN 61290-10-4-2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007)
LST EN 61290-1-2-2006 Optical amplifiers. Test methods. Part 1-2: Power and gain parameters. Electrical spectrum analyzer method (IEC 61290-1-2:2005)
LST EN 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008)

American Society for Testing and Materials (ASTM), Spectrum Analyzer Technology

ASTM E168-92 Standard Practice for General Techniques of Infrared Quantitative Analysis
ASTM E2105-00(2016) Standard Practice for General Techniques of Thermogravimetric Analysis (TGA) Coupled With Infrared Analysis (TGA/IR)
ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1086-94(2005) Standard Test Method for Optical Emission Vacuum Spectrometric Analysis of Stainless Steel by the Point-to-Plane Excitation Technique
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D7941/D7941M-23 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM D7941/D7941M-14 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM E27-64(1981)e1 Method for Spectrographic Analysis of Zinc and Zinc Alloys by the Solution-Residue Technique
ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
ASTM E1009-95(2000) Standard Practice for Evaluating an Optical Emission Vacuum Spectrometer to Analyze Carbon and Low-Alloy Steel
ASTM E1252-98 Standard Practice for General Techniques for Obtaining Infrared Spectra for Qualitative Analysis
ASTM E1252-98(2002) Standard Practice for General Techniques for Obtaining Infrared Spectra for Qualitative Analysis
ASTM E402-95 Standard Test Method for Spectrographic Analysis of Uranium Oxide (U₃O₈)by Gallium Oxide-Carrier Technique
ASTM E1252-98(2021) Standard Practice for General Techniques for Obtaining Infrared Spectra for Qualitative Analysis
ASTM E1252-98(2013)e1 Standard Practice for General Techniques for Obtaining Infrared Spectra for Qualitative Analysis
ASTM E485-94(1999)e1 Standard Test Method for Optical Emission Vacuum Spectrometric Analysis of Blast Furnace Iron by the Point-to-Plane Technique
ASTM E2056-04(2010) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
ASTM E2056-04(2016) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
ASTM E485-94(2005) Standard Test Method for Optical Emission Vacuum Spectrometric Analysis of Blast Furnace Iron by the Point-to-Plane Technique
ASTM D6122-21 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20a Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-22 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM E1086-08 Standard Test Method for Optical Emission Vacuum Spectrometric Analysis of Stainless Steel by the Point-to-Plane Excitation Technique
ASTM E1086-94(2000) Standard Test Method for Optical Emission Vacuum Spectrometric Analysis of Stainless Steel by the Point-to-Plane Excitation Technique
ASTM E327-94 Test Method for Optical Emission Spectrometric Analysis of Stainless Type 18-8 Steels by the Point-To-Plane Technique (Withdrawn 1999)
ASTM UOP709-70 Gas Analysis by Gas Chromatography Using a Two - Injection Technique
ASTM E227-90(1996) Standard Test Method for Optical Emission Spectrometric Analysis of Aluminum and Aluminum Alloys by the Point-to-Plane Technique (Withdrawn 2002)
ASTM D7417-17 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D7417-10 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
ASTM E2106-00 Standard Practice for General Techniques of Liquid Chromatography-Infrared (LC/IR) and Size Exclusion Chromatography-Infrared (SEC/IR) Analyses
ASTM E2106-00(2006) Standard Practice for General Techniques of Liquid Chromatography-Infrared (LC/IR) and Size Exclusion Chromatography-Infrared (SEC/IR) Analyses
ASTM E1642-00(2005) Standard Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis
ASTM E1642-00 Standard Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis
ASTM E402-02 Standard Test Method for Spectrographic Analysis of Uranium Oxide (U3O8)by Gallium Oxide-Carrier Technique (Withdrawn 2007)
ASTM E169-04(2009) Standard Practices for General Techniques of Ultraviolet-Visible Quantitative Analysis
ASTM E1642-00(2010) Standard Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis
ASTM E1642-00(2016) Standard Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis
ASTM E400-97 Standard Test Method for Analysis of Ores, Minerals, and Rocks by the Fire Assay Preconcentration Optical Emission Spectroscopy

IEC - International Electrotechnical Commission, Spectrum Analyzer Technology

PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

European Committee for Electrotechnical Standardization（CENELEC）, Spectrum Analyzer Technology

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)
EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
EN 61290-5-2:2004 Optical amplifiers Test methods Part 5-2: Reflectance parameters Electrical spectrum analyser method

ES-UNE, Spectrum Analyzer Technology

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
UNE-EN 61290-1-2:2005 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (Endorsed by AENOR in March of 2006.)
UNE-EN ISO 23674:2023 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
UNE-EN 61290-10-4:2007 Optical amplifiers - Test methods -- Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007). (Endorsed by AENOR in November of 2007.)

工业和信息化部/国家能源局, Spectrum Analyzer Technology

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques

RO-ASRO, Spectrum Analyzer Technology

STAS 5177-1981 EMISSION SPECTROGRAPHICAL ANALYSIS Terminology
STAS 11564-1982 RAPID STEELS FOR TOOLS Spectrographic analysis in emission
STAS 11607-1981 LOW AND MEDIUM ALLOYED CARBON STEELS Spectrographic analysis

RU-GOST R, Spectrum Analyzer Technology

GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices
GOST 16273.1-2014 Selenium technical. Method of spectral analysis
GOST 9816.4-2014 Tellurium technical. Method of spectral analysis
GOST 4.198-1985 System of product-quality indices. X-ray analytical apparatus. Nomenclature of indices
GOST 17173-1981 Spectral slits and attachments to them. Types, basic parameters and dimensions. Technical requirements
GOST 16865-1979 X-ray apparatus for structural and spectral analyses. Terms and definitions
GOST 4.163-1985 Product-quality index system. Chromatographic liquid and gas analysers. Nomenclature of indices
GOST 4.164-1985 Product-quality index system. Radio spectrometrical analysers. Nomenclature of indices
GOST 27987-1988 Potenciometric analizer of liquid, SSI. General specifications
GOST R 57080-2016 Medical electrical equipment. H-Ray Bone Densitometer (Absorptiometer). Technical requirements for governmental purchases
GOST 24032-1980 Mine instruments for gas analysis. General technical requirements. Testing methods
GOST ISO 12787-2016 Perfumery and cosmetics. Analytical methods. Validation criteria for analytical results using chromatographic techniques
GOST R 55992.1-2014 In vitro diagnostic medical devices for fluorescent and immunofluorescent analysis of ?dried spot? of newborn's blood. Part 1. Instruments and accessories for fluorescent and immunofluorescent analysis of ?dried spot? of newborn's blood. Technical require

Professional Standard - Electricity, Spectrum Analyzer Technology

DL/T 991-2006 Spectral analysis guideline of metal for electrical power equipment
DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer
DL/T 991-2022 Technical Guidelines for Metal Emission Spectroscopy Analysis of Power Equipment (replacing DL/T 991-2006)

Indonesia Standards, Spectrum Analyzer Technology

SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers

CZ-CSN, Spectrum Analyzer Technology

CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
CSN 99 4178-1990 Grain testers. Technical requirements

SE-SIS, Spectrum Analyzer Technology

SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

IN-BIS, Spectrum Analyzer Technology

CN-STDBOOK, Spectrum Analyzer Technology

图书 a-4336 Modern Instrumental Analysis Technology
图书 3-8314 ATC 011 Liquid Chromatography Analysis Technique
图书 3-9090 Review of Analytical Testing Instruments--Viewing the Progress of Analytical Technology from BCEIA2017 Instrument Exhibition

International Organization for Standardization (ISO), Spectrum Analyzer Technology

ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 17054:2010 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO/TS 11251:2010 Nanotechnologies - Characterization of volatile components in single-wall carbon nanotube samples using evolved gas analysis/gas chromatograph-mass spectrometry
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO/TS 10867:2010 Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 18115-1:2010 Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
ISO 18115-1:2013 Surface chemical analysis .Vocabulary.Part 1: General terms and terms used in spectroscopy
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 23674:2022 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
ISO 12787:2011 Cosmetics - Analytical methods - Validation criteria for analytical results using chromatographic techniques
ISO 3930:1976 Road vehicles — Carbon monoxide analyser equipment — Technical specifications
ISO 3028:1974 Photography — Expendable photoflash lamps — Determination of relative spectral energy distribution for calculation of spectral distribution index
ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
ISO/FDIS 18115-1 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 18115-1:2023 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 5-3:1984 Photography; Density measurements; Part 3 : Spectral conditions
ISO/TS 20175:2018 Vacuum technology - Vacuum gauges - Characterization of quadrupole mass spectrometers for partial pressure measurement
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy

National Metrological Technical Specifications of the People's Republic of China, Spectrum Analyzer Technology

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

KR-KS, Spectrum Analyzer Technology

KS D ISO 14707-2003(2023)
KS M 0129-2013(2023) Technical terms for analytical chemistry(Optical part)
KS D ISO 17054-2018(2023) Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
KS D ISO 15472-2003(2023)
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy

Hunan Provincial Standard of the People's Republic of China, Spectrum Analyzer Technology

DB43/T 1897-2020 General technical requirements for reference light sources for chemiluminescence immunoassay analyzers
DB43/T 2452-2022 General technical requirements for heat loss rate analyzer

AT-ON, Spectrum Analyzer Technology

ONORM M 6604-1995 Water analysis - Determination of selenium by atomic absorption spectrometry (hydride technique)
OENORM EN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

Professional Standard - Post and Telecommunication, Spectrum Analyzer Technology

YD/T 966-1998 Technical specification of SDH performance analyser
YD/T 916-1999 ISDN procedure analyzer technical specifications
YD/T 597-1992 Technical conditions of 64kbit/s error code analyzers
YD/T 599-1992 2048, 8448kbit/s error code analyzer technical conditions
YD/T 518-1992 Technical conditions for data communication protocol analyzer
YD/T 520-1992 Technical conditions for 564 992 kbit/s error code analyzer
YD/T 621-1993 2048, 8448, 34368, 139264Kbit/s phase jitter analyzer technical conditions
YD/T 860-1996 Technical conditions of error performance analyzer with or without frame structure

国家市场监督管理总局、中国国家标准化管理委员会, Spectrum Analyzer Technology

GB/T 12519-2021 General specification of analytical instruments

Fujian Provincial Standard of the People's Republic of China, Spectrum Analyzer Technology

DB35/T 1564-2016 Technical Requirements for Portable Rapid Raman Spectroscopy Detector

未注明发布机构, Spectrum Analyzer Technology

BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
DIN IEC 1342:1996 Nuclear instrumentation — Multichannel! pulse height analyzers — Main characteristics, technical requirements and test methods
ISO 7530-1:1990/Cor 1:1992 Nickel alloys — Flame atomic absorption spectrometric analysis — Part 1: General requirements and sample dissolution

Shanxi Provincial Standard of the People's Republic of China, Spectrum Analyzer Technology

DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy

Professional Standard - Environmental Protection, Spectrum Analyzer Technology

HJ/T 96-2003 The technical requirement for water quality automatic analyzer of pH
HJ/T 101-2003 The technical requirement for water quality automatic analyzer of ammonia
HJ/T 102-2003 The technical requirement for water quality automatic analyzer of total nitrogen
HJ/T 103-2003 The technical requirement for water quality automatic analyzer of total phosphorous
HJ/T 97-2003 The technical requirement for water quality automatic analyzer of electroconductivity
HJ/T 99-2003 The technical requirement for water quality automatic analyzer of dissolved oxygen(DO)
HJ/T 104-2003 The technical requirement for water quality automatic analyzer of total organic carbon
HJ/T 100-2003 The technical requirement for water quality automatic analyzer of permanganate index

CENELEC - European Committee for Electrotechnical Standardization, Spectrum Analyzer Technology

EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
EN 61290-1-2:1998 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters Electrical Spectrum Analyzer

Professional Standard - Public Safety Standards, Spectrum Analyzer Technology

GA/T 1154.4-2018 Video Image Analyzer Part 4: Technical Requirements for Face Analysis
GA/T 1154.4-2018(1) Video Image Analyzer Part 4: Technical Requirements for Face Analysis
GA/T 1154.1-2014 Video analysis instrument.Part 1:General technical requirements
GA 1154.1-2014 Video Image Analyzer Part 1: General Technical Requirements
GA/T 1154.2-2014 Video analysis instrument.Part 2:Technical requirements for video abstract
GA/T 1154.3-2017 Video Image Analyzer Part 3 Technical Requirements for Video Image Retrieval
GA 1154.2-2014 Video Image Analyzers Part 2: Video Image Summary Technical Requirements

Professional Standard - Medicine, Spectrum Analyzer Technology

YY/T 0475-2004 General technical requirements for urine analyzer

生态环境部, Spectrum Analyzer Technology

HJ/T 98-2003 Technical requirements for automatic turbidity water quality analyzers

American National Standards Institute （ANSI), Spectrum Analyzer Technology

ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
ANSI/TIA-455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
ANSI/TIA/EIA 455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer
ANSI/TIA-455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer

Standard Association of Australia （SAA）, Spectrum Analyzer Technology

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS 3641.1:1999 Recommended practice for atomic emission spectrometric analysis - Principles and techniques

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Spectrum Analyzer Technology

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 33559-2017 Technical requirement and method of measurement for signal analyzer of digital terrestrial television

AENOR, Spectrum Analyzer Technology

UNE-EN 10315:2007 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique

Shandong Provincial Standard of the People's Republic of China, Spectrum Analyzer Technology

DB37/T 2888-2016 Moderate Resolution Imaging Spectrometer (MODIS) Remote Sensing Image Wheat Growth Monitoring Technical Regulations

Professional Standard - Nuclear Industry, Spectrum Analyzer Technology

EJ/T 594-1991 Technical conditions for on-line analyzers for elements such as tungsten and molybdenum

GB-REG, Spectrum Analyzer Technology

REG NASA-LLIS-0480-1996 Lessons Learned - Landsat Program, Multispectral Scanner (MSS), Technology Development

Professional Standard - Coal, Spectrum Analyzer Technology

MT/T 620-2008 Technique specifications of muffle furnace temperature controller for coal analysis
MT/T 620-1996 Technical specification of muffle furnace temperature controller for coal analysis

(U.S.) Telecommunications Industries Association , Spectrum Analyzer Technology

TIA/EIA-455-209-2000 FOTP-209 IEC 61290-2-1 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
TIA/EIA-455-206-2000 FOTP-206 IEC 61290-1-1 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
TIA/EIA-455-210-2000 FOTP-210 IEC 61290-2-2 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer

PL-PKN, Spectrum Analyzer Technology

PN-EN IEC 61290-1-1-2021-06 E Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)

国家能源局, Spectrum Analyzer Technology

NB/T 10162-2019 General technical conditions for infrared gas analyzers used in coal mines
SH/T 0940-2016 Test methods for analyzing in-service lubricants using specific four-in-one testers (atomic emission spectrometry, infrared spectroscopy, viscosity and laser particle counter)

Professional Standard - Machinery, Spectrum Analyzer Technology

JB/T 9350-1999 Glass length scale for optical instruments technical specifications
JB/T 11939-2014 The technical conditions and test evaluation method for crude oil water analytical instrument by RF

Professional Standard - Grain, Spectrum Analyzer Technology

LS/T 3706-2012 Test instrument of grain and oils.Technical requirements and test method for automatic titration analyzer

Professional Standard - Energy, Spectrum Analyzer Technology

NB/SH/T 0940-2016 Test method for the analysis of in-use lubricants using a specific 4-in-1 tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity and Laser Particle Counter)

Hebei Provincial Standard of the People's Republic of China, Spectrum Analyzer Technology

DB13/T 5645-2022 Technical specification for maintenance of two-port N5242 vector network analyzer

司法部, Spectrum Analyzer Technology

SF/T 0079-2020 Real-time direct analysis of inkblots-technical specifications for high-resolution mass spectrometry inspection

Military Standard of the People's Republic of China-General Armament Department, Spectrum Analyzer Technology

GJB 9492-2018 Technical requirements for military wide-band electromagnetic signal monitoring analyzers

American Society of Heating, Refrigerating and Air-Conditioning Engineers (ASHRAE), Spectrum Analyzer Technology

ASHRAE 4782-2005 Techno-Economic Analysis of a Large-Scale Rooftop Photovoltaic System

Professional Standard - Geology, Spectrum Analyzer Technology

DZ/T 0370-2021 Technical regulations for portable X-ray fluorescence on-site analysis

Professional Standard - Navy, Spectrum Analyzer Technology

HJB 327.1-2006 Repair Technical Requirements for Shipboard Photoelectric Tracker Part 1: H/ZGJ-1 Series Type Four Photoelectric Tracker

TIA - Telecommunications Industry Association, Spectrum Analyzer Technology

TIA/EIA-455-221-2001 FOTP-221-IEC 61290-5-1 - Optical Fiber Amplifiers - Basic Specification - Part 5-1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer (Please refer to IEC 61290-5-1)