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txrf silicon wafer

txrf silicon wafer, Total:3 items.

In the international standard classification, txrf silicon wafer involves: Analytical chemistry.

International Organization for Standardization (ISO), txrf silicon wafer

• ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
• ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Japanese Industrial Standards Committee (JISC), txrf silicon wafer

• JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Others:   silicon surface txrf, standard silicon wafer, silicon wafer, Silicon Wafer Inspection Method, silicon wafer element, Silicon Wafer Resistivity Measurement, txrf silicon wafer, silicon wafer edge, txrf chip.