ZH
RU
ES

resonance structure

resonance structure, Total:12 items.

In the international standard classification, resonance structure involves: Integrated circuits. Microelectronics, Raw materials for rubber and plastics, Semiconductor devices, Electromechanical components for electronic and telecommunications equipment, Plastics.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, resonance structure

• GB/T 38447-2020 Micro-electromechanical system technology—Fatigue testing method of MEMS structure using resonant vibration

工业和信息化部, resonance structure

• SH/T 1832-2020 Determination of microstructure of isoprene rubber by proton nuclear magnetic resonance spectroscopy

Danish Standards Foundation, resonance structure

• DS/EN 62047-12:2012 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

German Institute for Standardization, resonance structure

• DIN EN 62047-12:2012-06 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011); German version EN 62047-12:2011
• DIN EN 62047-12:2012 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011); German version EN 62047-12:2011

ES-UNE, resonance structure

• UNE-EN 62047-12:2011 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (Endorsed by AENOR in February of 2012.)

International Electrotechnical Commission (IEC), resonance structure

• IEC 62047-12:2011 Semiconductor devices - Microelectromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Japanese Industrial Standards Committee (JISC), resonance structure

• JIS C 5630-12:2014 Semiconductor devices.Micro-electromechanical devices.Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Association Francaise de Normalisation, resonance structure

• NF C96-050-12*NF EN 62047-12:2012 Semiconductor devices - Micro-electromechanical devices - Part 12 : bending fatigue testing method of thin film materials using resonant vibration of MEMS structures.

British Standards Institution (BSI), resonance structure

• BS EN 62047-12:2011 Semiconductor devices. Micro-electromechanical devices. Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Lithuanian Standards Office , resonance structure

• LST EN 62047-12-2011 Semiconductor devices - Micro-electromechanical devices -- Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011)

国家能源局, resonance structure

• SH/T 1800-2016 Analysis of monomer content and sequence structure of plastic ethylene-propylene copolymer polypropylene by carbon-13 nuclear magnetic resonance spectroscopy

Others:   magnetic resonance, Resonance, spin resonance, resonance, long-term resonance, phase resonance, resonance spectrum, resonance structure, NMR structure, resonance structure, NMR spectrometer structure, NMR structure, structural resonance, Material Structural Resonance, NMR structural phase, structural resonance, NMR spectrometer structure, Structural NMR, Structural NMR, Structural Resonance Method.