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Mass spec impurity

Mass spec impurity, Total:16 items.

In the international standard classification, Mass spec impurity involves: Non-ferrous metals, Testing of metals, Analytical chemistry, Edible oils and fats. Oilseeds, Semiconducting materials, Nuclear energy engineering, Organic chemicals.

RU-GOST R, Mass spec impurity

• GOST R 57061-2016 Copper. Measurement of impurities mass fraction in copper by an inductively coupled plasma mass spectrometry method
• GOST R 57060-2016 Copper. Measurement of impurities mass fraction in copper by an inductively coupled plasma atomic emission spectrometry method
• GOST 2706.2-1974 Benzene hydrocarbons and allied products. Chromatographic method of determination of main substance and impurities content in benzene, tolyene and xylene

Professional Standard - Non-ferrous Metal, Mass spec impurity

• YS/T 244.9-2008 Chemical analysis methods of high purity aluminum.Part 9: Determination of trace impurities in high purity aluminumby inductively coupled mass spectrometry
• YS/T 34.1-2011 Method for chemical analysis of the high-purity arsenic.Inductive coupling plasma mass spectrum(ICP-MS)for determinating the concentration of elements in the high-purity arsenic

International Organization for Standardization (ISO), Mass spec impurity

• ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
• ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Association Francaise de Normalisation, Mass spec impurity

• NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Mass spec impurity

• GB/T 20176-2006 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of boron atomic concentration in silicon using uniformly doped materials
• GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry

British Standards Institution (BSI), Mass spec impurity

• BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Group Standards of the People's Republic of China, Mass spec impurity

• T/GAIA 007.1-2021 Determination of the Foreign Impurity in Oils PartⅠ: Determination of the Involatile Foreign Impurity by LC-MS/MS

GOSTR, Mass spec impurity

• PNST 499-2020 Nanotechnologies. Сarbon nanotubes. Determination of chemical element impurities by inductively coupled plasma mass spectrometry method

American Society for Testing and Materials (ASTM), Mass spec impurity

• ASTM C1287-95(2001) Standard Test Method for Determination of Impurities in Uranium Dioxide by Inductively Coupled Plasma Mass Spectrometry
• ASTM C1287-18 Standard Test Method for Determination of Impurities in Nuclear Grade Uranium Compounds by Inductively Coupled Plasma Mass Spectrometry
• ASTM C1287-10 Standard Test Method for Determination of Impurities in Nuclear Grade Uranium Compounds by Inductively Coupled Plasma Mass Spectrometry

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