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Mini Spectrum Analyzer

Mini Spectrum Analyzer, Total:305 items.

In the international standard classification, Mini Spectrum Analyzer involves: Optics and optical measurements, Fibre optic communications, Special measuring equipment for use in telecommunications, Analytical chemistry, Metalliferous minerals, Optoelectronics. Laser equipment, Water quality, Test conditions and procedures in general, Electronic components in general, Power stations in general, Linear and angular measurements, Quality, Fuels, Lubricants, industrial oils and related products, Non-ferrous metals, Products of the chemical industry, Testing of metals, Refractories, Electromagnetic compatibility (EMC), Audio, video and audiovisual engineering.

Taiwan Provincial Standard of the People's Republic of China, Mini Spectrum Analyzer

CNS 14341-1999 Optical spectrum analyzer

U.S. Air Force, Mini Spectrum Analyzer

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

European Committee for Standardization (CEN), Mini Spectrum Analyzer

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers
EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
prEN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

Association Francaise de Normalisation, Mini Spectrum Analyzer

NF C93-845:2006 Calibration of optical spectrum analyzers.
NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
NF EN 61290-5-1:2006 Amplificateurs optiques - Méthodes d'essais - Partie 5-1 : paramètres de réflectance - Méthode d'analyseur de spectre optique
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
NF EN 61290-3-1:2004 Amplificateurs optiques - Méthodes d'essai - Partie 3-1 : paramètres du facteur de bruit - Méthode d'analyseur du spectre optique
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
NF EN IEC 61290-1-1:2020 Amplificateurs optiques - Méthodes d'essai - Partie 1-1 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre optique
NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
NF C93-845-2*NF EN 62150-2:2011 Fibre optic active components and devices - Test and measurement procedures - Part 2 : ATM-PON transceivers.
NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
NF EN 61290-5-2:2004 Amplificateurs optiques - Méthodes d'essai - Partie 5-2 : paramètres du facteur de réflexion - Méthode de l'analyseur de spectre électrique
NF EN ISO 23674:2022 Cosmétiques - Méthodes d'analyse - Dosage direct des traces de mercure dans les cosmétiques par décomposition thermique et spectrométrie d'absorption atomique (analyseur de mercure)
NF EN 61290-3-2:2009 Amplificateurs optiques - Méthodes d'essais - Partie 3-2 : paramètres du facteur de bruit - Méthode de l'analyseur spectral électrique
NF EN 61290-10-1:2009 Amplificateurs optiques - Méthodes d'essai - Partie 10-1 : paramètres à canaux multiples - Méthode d'impulsion utilisant un interrupteur optique et un analyseur de spectre optique
NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
NF EN 61290-10-2:2008 Amplificateurs optiques - Méthodes d'essai - Partie 10-2 : paramètres à canaux multiples - Méthode d'impulsion utilisant un analyseur de spectre optique stroboscopique
NF C93-805-10-4*NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4 : multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
NF EN 61290-10-4:2007 Amplificateurs optiques - Méthodes d'essai - Partie 10-4 : paramètres à canaux multiples - Méthode par soustraction de source interpolée en utilisant un analyseur de spectre optique
NF C93-805-10-2:2003 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer.
NF C93-805-10-2*NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer
NF EN 61290-1-2:2006 Amplificateurs optiques - Méthodes d'essai - Partie 1-2 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre électrique
NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.
NF C93-805-5-3*NF EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3 : test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser.
NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif

British Standards Institution (BSI), Mini Spectrum Analyzer

BS EN 62129:2006 Calibration of optical spectrum analyzers
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS EN ISO 23674:2022 Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
19/30398879 DC BS EN 61290-1-1. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
18/30387381 DC BS EN 61290-1-1 Ed.4.0. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1:Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS EN 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
BS EN 61290-1-2:2007 Optical amplifiers. Test methods. Power and gain parameters. Electrical spectrum analyzer method
21/30387777 DC BS EN ISO 23674. Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition. Atomic absorption spectrometry (mercury analyzer)
BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
PD IEC TR 61292-2:2003 Optical amplifier technical reports. Theoretical background for noise figure evaluation using the electrical spectrum analyzer
BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)

International Electrotechnical Commission (IEC), Mini Spectrum Analyzer

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers
IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
IEC 61290-10-1:2003 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters; Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-1-1:1998 Optical fibre amplifiers - Basic specification - Part 1-1: Test methods for gain parameters - Optical spectrum analyzer
IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
IEC 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-2-2:1998 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
IEC 61290-10-2:2007 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
IEC 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyser
IEC 61290-1-2:1998 Optical fibre amplifiers - Basic specification - Part 1-2: Test methods for gain parameters - Electrical spectrum analyzer
IEC TR 61292-2:2003 Optical amplifier technical reports - Part 2: Theoretical background for noise figure evaluation using the electrical spectrum analyzer

Danish Standards Foundation, Mini Spectrum Analyzer

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
DS/EN 61290-1-2:2006 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method

Japanese Industrial Standards Committee (JISC), Mini Spectrum Analyzer

JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
JIS C 6122-10-2:2010 Optical amplifiers -- Test methods -- Part 10-2: Multichannel parameters -- Pulse method using a gated optical spectrum analyzer
JIS C 6122-1-2:2011 Optical amplifiers -- Test methods -- Part 1-2: Power and gain parameters -- Electrical spectrum analyzer method
JIS C 6122-10-4:2012 Optical amplifiers -- Test methods -- Part 10-4: Multichannel parameters -- Interpolated source subtraction method using an optical spectrum analyzer

National Metrological Verification Regulations of the People's Republic of China, Mini Spectrum Analyzer

JJG 1035-2022 Communication Spectrum Analyzer
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication

Korean Agency for Technology and Standards (KATS), Mini Spectrum Analyzer

KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS C IEC 61290-5-1-2007(2022) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-5-1-2007(2017) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS C IEC 61290-3-1-2005(2020) Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C IEC 61290-3-1:2005 Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C IEC 61290-10-1-2005(2020) Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
KS C IEC 61290-10-2-2005(2020) Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS C IEC 61290-3-2-2005(2020) Optical amplifiers－Part 3－2：Test methods for noise figure parameters－Electrical spectrum analyzer method
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS C IEC 61290-10-1:2005 Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS D ISO 15471:2005 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS C IEC 61290-10-2:2005 Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Mini Spectrum Analyzer

GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters

ZA-SANS, Mini Spectrum Analyzer

SANS 62129:2008 Calibration of optical spectrum analyzers
SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method

Lithuanian Standards Office , Mini Spectrum Analyzer

LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
LST EN 61290-1-1-2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006)
LST EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
LST EN 61290-10-1-2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009)
LST EN 61290-5-2-2004 Optical amplifiers. Test methods. Part 5-2: Reflectance parameters. Electrical spectrum analyser method (IEC 61290-5-2:2003)
LST EN 61290-10-2-2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007)
LST EN 61290-10-4-2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007)
LST EN 61290-1-2-2006 Optical amplifiers. Test methods. Part 1-2: Power and gain parameters. Electrical spectrum analyzer method (IEC 61290-1-2:2005)
LST EN 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008)

German Institute for Standardization, Mini Spectrum Analyzer

DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
DIN EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
DIN EN 61290-10-4:2008-02 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007 / Note: Applies in conjunction with DIN EN 61291...
DIN EN IEC 61290-1-1:2019 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1563/CD:2018); Text in German and English
DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
DIN EN IEC 61290-1-1:2022-07 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020); German version EN IEC 61290-1-1:2020 / Note: DIN EN 61290-1-1 (2016-03) remains valid alongside this standard until 2023-10...
DIN EN 61290-1-2:2006-07 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005 / Note: DIN EN 61290-1-2 (1999-08) remains valid alongside this standard until 2008-10-0...
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN EN 61290-1-2:2006 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN 61290-5-2:2004-12 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
DIN EN 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2015); German version EN 61290-1-1:2015

IEC - International Electrotechnical Commission, Mini Spectrum Analyzer

PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

European Committee for Electrotechnical Standardization（CENELEC）, Mini Spectrum Analyzer

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)
EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
EN 61290-5-2:2004 Optical amplifiers Test methods Part 5-2: Reflectance parameters Electrical spectrum analyser method

ES-UNE, Mini Spectrum Analyzer

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
UNE-EN 61290-1-2:2005 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (Endorsed by AENOR in March of 2006.)
UNE-EN ISO 23674:2023 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
UNE-EN 61290-10-4:2007 Optical amplifiers - Test methods -- Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007). (Endorsed by AENOR in November of 2007.)

工业和信息化部/国家能源局, Mini Spectrum Analyzer

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer

Indonesia Standards, Mini Spectrum Analyzer

SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers

Group Standards of the People's Republic of China, Mini Spectrum Analyzer

T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer

CZ-CSN, Mini Spectrum Analyzer

CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters

SE-SIS, Mini Spectrum Analyzer

SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

Professional Standard - Electron, Mini Spectrum Analyzer

SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum

IN-BIS, Mini Spectrum Analyzer

IS 12803-1989

International Organization for Standardization (ISO), Mini Spectrum Analyzer

ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 23674:2022 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

National Metrological Technical Specifications of the People's Republic of China, Mini Spectrum Analyzer

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

KR-KS, Mini Spectrum Analyzer

KS D ISO 14707-2003(2023)
KS D ISO 15472-2003(2023)
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Professional Standard - Electricity, Mini Spectrum Analyzer

DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer

RO-ASRO, Mini Spectrum Analyzer

STAS 11564-1982 RAPID STEELS FOR TOOLS Spectrographic analysis in emission
STAS 11607-1981 LOW AND MEDIUM ALLOYED CARBON STEELS Spectrographic analysis

American Society for Testing and Materials (ASTM), Mini Spectrum Analyzer

ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D7941/D7941M-23 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM D7941/D7941M-14 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
ASTM E1009-95(2000) Standard Practice for Evaluating an Optical Emission Vacuum Spectrometer to Analyze Carbon and Low-Alloy Steel
ASTM E2056-04(2010) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
ASTM E2056-04(2016) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
ASTM D6122-21 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20a Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-22 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D7417-17 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D7417-10 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)

RU-GOST R, Mini Spectrum Analyzer

GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices

未注明发布机构, Mini Spectrum Analyzer

BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method

Shanxi Provincial Standard of the People's Republic of China, Mini Spectrum Analyzer

DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy

CENELEC - European Committee for Electrotechnical Standardization, Mini Spectrum Analyzer

EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
EN 61290-1-2:1998 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters Electrical Spectrum Analyzer

American National Standards Institute （ANSI), Mini Spectrum Analyzer

ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
ANSI/TIA-455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
ANSI/TIA/EIA 455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer
ANSI/TIA-455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer

Standard Association of Australia （SAA）, Mini Spectrum Analyzer

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Mini Spectrum Analyzer

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales

(U.S.) Telecommunications Industries Association , Mini Spectrum Analyzer

TIA/EIA-455-209-2000 FOTP-209 IEC 61290-2-1 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
TIA/EIA-455-206-2000 FOTP-206 IEC 61290-1-1 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
TIA/EIA-455-210-2000 FOTP-210 IEC 61290-2-2 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer

PL-PKN, Mini Spectrum Analyzer

PN-EN IEC 61290-1-1-2021-06 E Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)

Professional Standard - Energy, Mini Spectrum Analyzer

NB/SH/T 0940-2016 Test method for the analysis of in-use lubricants using a specific 4-in-1 tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity and Laser Particle Counter)

国家能源局, Mini Spectrum Analyzer

SH/T 0940-2016 Test methods for analyzing in-service lubricants using specific four-in-one testers (atomic emission spectrometry, infrared spectroscopy, viscosity and laser particle counter)

AT-ON, Mini Spectrum Analyzer

OENORM EN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

TIA - Telecommunications Industry Association, Mini Spectrum Analyzer

TIA/EIA-455-221-2001 FOTP-221-IEC 61290-5-1 - Optical Fiber Amplifiers - Basic Specification - Part 5-1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer (Please refer to IEC 61290-5-1)