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Probe Contact Surface Profiler

Probe Contact Surface Profiler, Total:84 items.

In the international standard classification, Probe Contact Surface Profiler involves: Linear and angular measurements, Gears, Ceramics, Surface treatment and coating, Mechanical testing.


Professional Standard - Machinery, Probe Contact Surface Profiler

TR-TSE, Probe Contact Surface Profiler

  • TS 930-1976 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE BY THE POFILE METHOD CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROF?LE TRANSFORMATION PROF?LE RECORDING INSTRUMENTS
  • TS 2495-1977 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROF?LE METHOD - CONTACT (STYLUS) INSTRUMENTS OF CONSECUTIVE PROF?LE TRANSFORMATION - CONTACT PROF?LE METERS. SYSTEM M

CZ-CSN, Probe Contact Surface Profiler

  • CSN ISO 3274:1994 Instruments for the measurement of surface roughness by the profile method.Contact(stylus)instruments of consecutive profile transformation.Contact profile meters,system M
  • CSN ISO 1880:1993 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments

YU-JUS, Probe Contact Surface Profiler

  • JUS M.A1.034-1980 Instruments for the measurement of surface roughness by tne profil method-contact (stylus) instrument* of profile transformation - Profile reoording instruments
  • JUS M.A1.031-1982 Instruments for the measurement of surface roughness by the profile method — Contactprofile meters, system M

RO-ASRO, Probe Contact Surface Profiler

  • STAS SR ISO 3274:1995 Instruments for the measurements of surface roughness by the profile method - Contact (stylus) instruments of consecutive profile transformation - Contact profile meters, system M

International Organization for Standardization (ISO), Probe Contact Surface Profiler

  • ISO 3274:1975 Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of consecutive profile transformation; Contact profile meters, system M
  • ISO 1880:1974 Title missing - Legacy paper document
  • ISO 1880:1979 Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of progressive profile transformation; Profile recording instruments
  • ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
  • ISO 3274:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
  • ISO 12179:2021 Geometrical product specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments
  • ISO 12179:2000/cor 1:2003 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments; Technical Corrigendum 1
  • ISO 3274:1996/cor 1:1998 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments; Technical Corrigendum 1
  • ISO 18452:2005 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
  • ISO 25178-605:2014 Geometrical product specifications (GPS) - Surface texture: Areal - Part 605: Nominal characteristics of non-contact (point autofocus probe) instruments
  • ISO 8503-4:2012 Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 4: Method for the calibration of ISO surface profile comparators and for the determination of su
  • ISO 8503-4:1988 Preparation of steel substrates before application of paints and related products; surface roughness characteristics of blast-cleaned steel substrates; part 4: method for the calibration of ISO surface profile comparators and for the determination of surf
  • ISO/DIS 25178-602:2023 Geometrical product specifications (GPS) — Surface texture: Areal — Part 602: Design and characteristics of non-contact (confocal chromatic probe) instruments

Danish Standards Foundation, Probe Contact Surface Profiler

  • DS/ISO 3274:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of consecutive profile transformation. Contact profile meters, system M
  • DS/ISO 1880:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments
  • DS/EN ISO 3274/Corr. 1:2007 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
  • DS/EN ISO 3274:1998 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments

British Standards Institution (BSI), Probe Contact Surface Profiler

  • BS EN ISO 12179:2022 Geometrical product specifications (GPS). Surface texture: Profile method. Calibration of contact (stylus) instruments
  • BS EN ISO 12179:2001 Geometrical product specifications (GPS). Surface texture. Profile method. Calibration of contact (stylus) instruments
  • 20/30397768 DC BS EN ISO 12179. Geometrical product specifications (GPS). Surface texture: Profile method. Calibration of contact (stylus) instruments
  • BS ISO 3274:1997 Geometric product specifications (GPS). Surface texture. Profile method. Nominal characteristics of contact (stylus) instruments
  • BS EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer
  • BS EN ISO 8503-4:2012 Preparation of steel substrates before application of paints and related products. Surface roughness characteristics of blast-cleaned steel substrates. Method for the calibration of ISO surface profile comparators and for the determination of surface prof
  • BS EN ISO 25178-602:2010 Geometrical product specifications (GPS) - Surface texture - Areal - Nominal characteristics of non-contact (confocal chromatic probe) instruments
  • BS EN ISO 25178-605:2014 Geometrical product specifications (GPS). Surface texture: Areal. Nominal characteristics of non-contact (point autofocus probe) instruments
  • BS EN ISO 25178-601:2010 Geometrical product specifications (GPS) - Surface texture - Areal - Nominal characteristics of contact (stylus) instruments

ES-UNE, Probe Contact Surface Profiler

  • UNE-EN ISO 12179:2023 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
  • UNE-EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005) (Endorsed by AENOR in June of 2016.)

German Institute for Standardization, Probe Contact Surface Profiler

  • DIN EN ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000); German version EN ISO 12179:2000
  • DIN EN ISO 12179:2023 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
  • DIN EN ISO 12179:2023-04 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021); German version EN ISO 12179:2022
  • DIN EN ISO 3274:1998-04 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996); German version EN ISO 3274:1997
  • DIN EN ISO 18452:2016-09 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005); German version EN ISO 18452:2016
  • DIN EN 1071-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer; German version EN 1071-1:2003
  • DIN EN ISO 8503-4:2012 Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 4: Method for the calibration of ISO surface profile comparators and for the determination of su

Korean Agency for Technology and Standards (KATS), Probe Contact Surface Profiler

  • KS B 0501-2016 Instruments for the measurement of surfaceroughness by the stylus method-Profile method
  • KS B ISO 12179:2004 Geometrical Product Specifications(GPS)-Surface texture:Profile method-Calibration of contact(stylus) instruments
  • KS B ISO 12179:2014 Geometrical Product Specifications(GPS) — Surface texture: Profile method — Calibration of contact(stylus) instruments
  • KS A ISO 3274:2019 Geometrical product specifications(GPS)-Surface texture:Profile method-Nominal characteristics of contact(stylus) instruments
  • KS A ISO 3274:2002 Geometrical product specifications(GPS)-Surface texture:Profile method-Nominal characteristics of contact(stylus) instruments
  • KS A ISO 3274:2014 Geometrical product specifications(GPS)-Surface texture:Profile method-Nominal characteristics of contact(stylus) instruments
  • KS B ISO 12179-2014(2019) Geometrical Product Specifications(GPS) — Surface texture: Profile method — Calibration of contact(stylus) instruments
  • KS M ISO 8503-4:2012 Preparation of steel substrates before application of paints and related products-Surface roughness characteristics of blast-cleaned steel substrates-Part 4:Method for the calibration of ISO surface profile comparators and for the determination of surface

未注明发布机构, Probe Contact Surface Profiler

  • BS EN ISO 3274:1998(1999) Geometric Product Specifications (GPS) — Surface texture : Profile method — Nominal characteristics of contact (stylus) instruments —
  • DIN EN ISO 8503-4:1995 Surface roughness characteristics of blast-cleaned steel substrates Method for the calibration of ISO surface profile comparators and for the DIN determination of surface profile using a stylus instrument

Association Francaise de Normalisation, Probe Contact Surface Profiler

  • NF EN ISO 12179:2022 Spécification géométrique des produits (GPS) - États de surface : méthode du profil - Étalonnage des instruments à contact (palpeur)
  • NF E05-056:2000 Geometrical Product Specifications (GPS) - Surface texture : profil method - Calibration of contact (stylus) instruments.
  • NF E05-052*NF EN ISO 3274:1998 Geometrical product specifications (GPS) - Surface texture : profile method - Nominal characteristics of contact (stylus) instruments
  • NF A92-810*NF EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
  • NF A92-801-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1 : determination of coating thickness by contact probe filometer.
  • NF E05-031-605*NF EN ISO 25178-605:2014 Geometrical product specifications (GPS) - Surface texture : areal - Part 605 : nominal characteristics of non-contact (point autofocus probe) instruments
  • FD X21-063*FD ISO/TR 22335:2008 Surface chemical analysis - Depth profiling - Measurement of sputtering rate : mesh-replica method using a mechanical stylus profilometer

European Committee for Standardization (CEN), Probe Contact Surface Profiler

  • EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
  • EN ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface Texture: Profile Method - Calibration of Contact (Stylus) Instruments
  • EN ISO 3274:1997 Geometrical Product Specifications (GPS) - Surface Texture: Profile Method - Nominal Characteristics of Contact (Stylus) Instruments
  • DD ENV 1071-1-1993 Advanced Technical Ceramics - Methods of Test for Ceramic Coatings - Part 1 : Determination of Coating Thickness by Contact Probe Profilometer
  • EN ISO 25178-601:2010 Geometrical product specifications (GPS) - Surface texture: Areal - Part 601: Nominal characteristics of contact (stylus) instruments (ISO 25178-601:2010)
  • EN ISO 25178-605:2014 Geometrical product specifications (GPS) - Surface texture: Areal - Part 605: Nominal characteristics of non-contact (point autofocus probe) instruments (ISO 25178-605:2014)
  • EN ISO 8503-4:1995 Preparation of Steel Substrates Before Application of Paints and Related Products - Surface Roughness Characteristics of Blast -Cleaned Steel Substrates - Part 4: Method for the Calibration of ISO Surface Profile Comparators and for the Determination of
  • EN ISO 8503-4:2012 Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 4: Method for the calibration of ISO surface profile comparators and for the determination of su

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Probe Contact Surface Profiler

  • GB/T 19600-2004 Geometrical Product Specifications(GPS)Surface texture:Profile method-Calibration of contact(stylus)instruments
  • GB/T 6062-2009 Geometrical Product Specifications(GPS).Surface texture:Profile method.Nominal characteristic of contact(stylus) instruments
  • GB/T 6062-2002 Geometrical product specifications (GPS)--Surface texture:Profile method--Nominal characteristics of contact(stylus)instruments

RU-GOST R, Probe Contact Surface Profiler

  • GOST 19300-1986 Instruments for measurement of surface roughness by the profile method. Contact profilographs and profilometers. Types and main parameters

KR-KS, Probe Contact Surface Profiler

  • KS A ISO 3274-2019 Geometrical product specifications(GPS)-Surface texture:Profile method-Nominal characteristics of contact(stylus) instruments

AT-ON, Probe Contact Surface Profiler

  • ONORM M 1114-1982 Measurement of surface roughness with contact (Stylus) Instruments
  • ONORM ENV 1071-1-1993 Advanced technical ceramics. Methods of test for ceramic coatings. Part 1: Determination of coating thickness by contact probe profilometer

Japanese Industrial Standards Committee (JISC), Probe Contact Surface Profiler

  • JIS B 0670:2002 Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Calibration of contact (stylus) instruments
  • JIS B 0651:2001 Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Nominal characteristics of contact (stylus) instruments
  • JIS B 0651 ERRATUM 1:2001 Geometrical Product Specification (GPS) -- Surface texture: Profile method -- Nominal characteristics of contact (stylus) instruments (Erratum 1)
  • JIS B 0651 ERRATUM 2:2002 Geometrical Product Specification (GPS) -- Surface texture: Profile method -- Nominal characteristics of contact (stylus) instruments (Erratum 2)
  • JIS B 0651 AMD 1:2022 Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Nominal characteristics of contact (stylus) instruments (Amendment 1)

Association of German Mechanical Engineers, Probe Contact Surface Profiler

  • VDI/VDE 2615-2006 Surface roughness measurement of cylindrical gears and bevel gears by means on stylus-type instruments
  • VDI/VDE 2602 Blatt 2-2008 Roughness measurement - Roughness measurement using contact (stylus) instruments - Profile method - Setup, measurement conditions, procedure
  • VDI/VDE 2612 Blatt 5-2015 Measurement and testing of gearings - Surface roughness measurement of cylindrical gears and bevel gears by means of stylus-type instruments

SE-SIS, Probe Contact Surface Profiler

  • SIS SS-ISO 8503-4:1992 Preparation of steel substrates before application of paints and related products — Surface roughness characteristics of blast- cleaned steel substrates — Part 3: Method for the calibration of ISO surface profile comparators and for




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