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Probe Contact Profiler
Probe Contact Profiler, Total:30 items.
In the international standard classification, Probe Contact Profiler involves: Ceramics, Linear and angular measurements.
German Institute for Standardization, Probe Contact Profiler
- DIN EN ISO 18452:2016-09 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005); German version EN ISO 18452:2016
- DIN EN 1071-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer; German version EN 1071-1:2003
- DIN EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005); German version EN ISO 18452:2016
- DIN EN ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000); German version EN ISO 12179:2000
- DIN EN ISO 12179:2023 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
British Standards Institution (BSI), Probe Contact Profiler
- BS EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer
- BS EN ISO 12179:2022 Geometrical product specifications (GPS). Surface texture: Profile method. Calibration of contact (stylus) instruments
- BS EN ISO 12179:2001 Geometrical product specifications (GPS). Surface texture. Profile method. Calibration of contact (stylus) instruments
International Organization for Standardization (ISO), Probe Contact Profiler
- ISO 18452:2005 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
- ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
ES-UNE, Probe Contact Profiler
- UNE-EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005) (Endorsed by AENOR in June of 2016.)
- UNE-EN ISO 12179:2023 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
European Committee for Standardization (CEN), Probe Contact Profiler
- DD ENV 1071-1-1993 Advanced Technical Ceramics - Methods of Test for Ceramic Coatings - Part 1 : Determination of Coating Thickness by Contact Probe Profilometer
- EN 1071-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe filometer
- EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
- EN ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface Texture: Profile Method - Calibration of Contact (Stylus) Instruments
Association Francaise de Normalisation, Probe Contact Profiler
- NF A92-801-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1 : determination of coating thickness by contact probe filometer.
AT-ON, Probe Contact Profiler
- ONORM ENV 1071-1-1993 Advanced technical ceramics. Methods of test for ceramic coatings. Part 1: Determination of coating thickness by contact probe profilometer
Professional Standard - Machinery, Probe Contact Profiler
TR-TSE, Probe Contact Profiler
- TS 2495-1977 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROF?LE METHOD - CONTACT (STYLUS) INSTRUMENTS OF CONSECUTIVE PROF?LE TRANSFORMATION - CONTACT PROF?LE METERS. SYSTEM M
- TS 930-1976 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE BY THE POFILE METHOD CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROF?LE TRANSFORMATION PROF?LE RECORDING INSTRUMENTS
CZ-CSN, Probe Contact Profiler
- CSN ISO 3274:1994 Instruments for the measurement of surface roughness by the profile method.Contact(stylus)instruments of consecutive profile transformation.Contact profile meters,system M
- CSN ISO 1880:1993 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments
YU-JUS, Probe Contact Profiler
- JUS M.A1.034-1980 Instruments for the measurement of surface roughness by tne profil method-contact (stylus) instrument* of profile transformation - Profile reoording instruments
RO-ASRO, Probe Contact Profiler
- STAS SR ISO 3274:1995 Instruments for the measurements of surface roughness by the profile method - Contact (stylus) instruments of consecutive profile transformation - Contact profile meters, system M
Association of German Mechanical Engineers, Probe Contact Profiler
- VDI/VDE 2602-1983 Roughness measurement with electric contact (stylus) profile meters
Korean Agency for Technology and Standards (KATS), Probe Contact Profiler
- KS B ISO 12179:2004 Geometrical Product Specifications(GPS)-Surface texture:Profile method-Calibration of contact(stylus) instruments
- KS B ISO 12179:2014 Geometrical Product Specifications(GPS) — Surface texture: Profile method — Calibration of contact(stylus) instruments
未注明发布机构, Probe Contact Profiler
- BS EN ISO 3274:1998(1999) Geometric Product Specifications (GPS) — Surface texture : Profile method — Nominal characteristics of contact (stylus) instruments —
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Probe Contact Profiler
- GB/T 19600-2004 Geometrical Product Specifications(GPS)Surface texture:Profile method-Calibration of contact(stylus)instruments