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Atomic Force Microscopy Sample Preparation

Atomic Force Microscopy Sample Preparation, Total:18 items.

In the international standard classification, Atomic Force Microscopy Sample Preparation involves: Physics. Chemistry, Optics and optical measurements, Linear and angular measurements, Ceramics, Analytical chemistry, Protection against dangerous goods, Air quality.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Atomic Force Microscopy Sample Preparation

GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon nanomaterials involving biological effect

Professional Standard - Petroleum, Atomic Force Microscopy Sample Preparation

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

国家能源局, Atomic Force Microscopy Sample Preparation

SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Atomic Force Microscopy Sample Preparation

GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope

PL-PKN, Atomic Force Microscopy Sample Preparation

PN H87903-1972 Irwestigations o? copper alloys castings Preparation and sampling ot ?es? pieces for microscopis examinations

American Society for Testing and Materials (ASTM), Atomic Force Microscopy Sample Preparation

ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM D6480-05(2010) Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
ASTM D6480-99 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
ASTM E1741-00 Standard Practice for Preparation of Airborne Particulate Lead Samples Collected During Abatement and Construction Activities for Subsequent Analysis by Atomic Spectrometry
ASTM D6480-05 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy

Japanese Industrial Standards Committee (JISC), Atomic Force Microscopy Sample Preparation

JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

International Electrotechnical Commission (IEC), Atomic Force Microscopy Sample Preparation

IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

NL-NEN, Atomic Force Microscopy Sample Preparation

NVN 5770-1993 Soil and sludge. Sample preparation of soil and sludge for the determination of elements by atomic spectrometry. Destruction with nitric acid and hydrochloric acid in a microwave oven