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Atomic Force Microscopy Sample Preparation
Atomic Force Microscopy Sample Preparation, Total:45 items.
In the international standard classification, Atomic Force Microscopy Sample Preparation involves: Physics. Chemistry, Analytical chemistry, Materials for aerospace construction, Thermodynamics and temperature measurements, Linear and angular measurements, Test conditions and procedures in general, Optics and optical measurements, Nuclear energy engineering, Ceramics, Protection against dangerous goods.
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Atomic Force Microscopy Sample Preparation
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
ESDU - Engineering Sciences Data Unit, Atomic Force Microscopy Sample Preparation
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
- SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
- SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM
- SPB-M14-1-2010 Sept.10: Interactions and rheological properties of Asphaltenes studied by Atomic Force Microscopy
- SPB-M6-2-2010 Apr.08: Colloidal Interactions Between Asphaltene and Different Surfaces Measured by Atomic force microscopy (AFM)
International Organization for Standardization (ISO), Atomic Force Microscopy Sample Preparation
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
- ISO/DIS 19606:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy
British Standards Institution (BSI), Atomic Force Microscopy Sample Preparation
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
- 23/30461942 DC BS ISO 19606. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy
Group Standards of the People's Republic of China, Atomic Force Microscopy Sample Preparation
American Society for Testing and Materials (ASTM), Atomic Force Microscopy Sample Preparation
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps
- ASTM D6480-05(2010) Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
- ASTM D6480-99 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
- ASTM D6480-05 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
German Institute for Standardization, Atomic Force Microscopy Sample Preparation
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Atomic Force Microscopy Sample Preparation
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 32189-2015 Atomic Force Microscopy Examination of Surface Roughness of Gallium Nitride Single Crystal Substrate
- GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic steps
国家市场监督管理总局、中国国家标准化管理委员会, Atomic Force Microscopy Sample Preparation
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
Professional Standard - Nuclear Industry, Atomic Force Microscopy Sample Preparation
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
RU-GOST R, Atomic Force Microscopy Sample Preparation
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
Japanese Industrial Standards Committee (JISC), Atomic Force Microscopy Sample Preparation
- JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
- JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
- JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
International Electrotechnical Commission (IEC), Atomic Force Microscopy Sample Preparation
- IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy