ZH
RU
ES

X-ray energy spectrometer measurement

X-ray energy spectrometer measurement, Total:22 items.

In the international standard classification, X-ray energy spectrometer measurement involves: Nuclear energy engineering, Non-destructive testing, Analytical chemistry, Radiation measurements.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray energy spectrometer measurement

GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales

IN-BIS, X-ray energy spectrometer measurement

IS 12737-1988

RU-GOST R, X-ray energy spectrometer measurement

GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope

CZ-CSN, X-ray energy spectrometer measurement

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

Korean Agency for Technology and Standards (KATS), X-ray energy spectrometer measurement

KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers

SE-SIS, X-ray energy spectrometer measurement

SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers

National Metrological Technical Specifications of the People's Republic of China, X-ray energy spectrometer measurement

JJF 2024-2023

Institute of Electrical and Electronics Engineers (IEEE), X-ray energy spectrometer measurement

ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Japanese Industrial Standards Committee (JISC), X-ray energy spectrometer measurement

JIS Z 4328:1984 Radiation survey meters for X and gamma rays

International Organization for Standardization (ISO), X-ray energy spectrometer measurement

ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

German Institute for Standardization, X-ray energy spectrometer measurement

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English

工业和信息化部/国家能源局, X-ray energy spectrometer measurement

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray energy spectrometer measurement

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales

KR-KS, X-ray energy spectrometer measurement

KS D ISO 15472-2003(2023)