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The basics of a spectrum analyzer

The basics of a spectrum analyzer, Total:304 items.

In the international standard classification, The basics of a spectrum analyzer involves: Optics and optical measurements, Fibre optic communications, Special measuring equipment for use in telecommunications, Optoelectronics. Laser equipment, Non-ferrous metals, Radiation measurements, Analytical chemistry, Linear and angular measurements, Manufacturing processes in the rubber and plastics industries, Vocabularies, Testing of metals, Fuels, Products of the chemical industry, Lubricants, industrial oils and related products, Medical equipment, Metalliferous minerals, Surface treatment and coating, Optical equipment, Audio, video and audiovisual engineering, Petroleum products in general, Ceramics, Radiation protection, Milk and milk products, Wastes, Soil quality. Pedology, Plastics, Test conditions and procedures in general, Water quality.


British Standards Institution (BSI), The basics of a spectrum analyzer

  • BS EN 62129:2006 Calibration of optical spectrum analyzers
  • BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
  • BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
  • BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
  • BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
  • BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
  • BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
  • BS ISO 24417:2022 Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
  • BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
  • 21/30405786 DC BS ISO 24417. Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
  • BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
  • BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
  • BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
  • BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
  • BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
  • BS DD ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectromerty (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix
  • BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
  • BS EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1:Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
  • PD IEC TR 61292-2:2003 Optical amplifier technical reports. Theoretical background for noise figure evaluation using the electrical spectrum analyzer
  • 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
  • PD ISO/TR 19319:2013 Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
  • 21/30433033 DC BS EN IEC 80601-2-71. Medical electrical equipment. Part 2-71. Particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (NIRS) equipment
  • BS 6783-6:1986 Sampling and analysis of nickel, ferronickel and nickel alloys. Method for determination of sulphur in nickel by methylene blue molecular absorption spectrometry after generation of hydrogen sulphide

International Electrotechnical Commission (IEC), The basics of a spectrum analyzer

  • IEC PAS 62129:2004 Calibration of optical spectrum analyzers
  • IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
  • IEC 61290-1-1:1998 Optical fibre amplifiers - Basic specification - Part 1-1: Test methods for gain parameters - Optical spectrum analyzer
  • IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
  • IEC 61290-2-2:1998 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
  • IEC 61290-5-3:2002 Optical fibre amplifiers - Basic specifications - Part 5-3: Test methods for reflectance parameters; Reflectance tolerance test method using electrical spectrum analyzer
  • IEC 61290-1-2:1998 Optical fibre amplifiers - Basic specification - Part 1-2: Test methods for gain parameters - Electrical spectrum analyzer
  • IEC 61290-10-1:2003 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters; Pulse method using an optical switch and optical spectrum analyzer
  • IEC 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
  • IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
  • IEC 61290-10-2:2007 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
  • IEC 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyser
  • IEC TR 61292-2:2003 Optical amplifier technical reports - Part 2: Theoretical background for noise figure evaluation using the electrical spectrum analyzer

Danish Standards Foundation, The basics of a spectrum analyzer

  • DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
  • DS/EN 62129:2006 Calibration of optical spectrum analyzers
  • DS/EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3: Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
  • DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
  • DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
  • DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer

Japanese Industrial Standards Committee (JISC), The basics of a spectrum analyzer

  • JIS C 6192:2008 Calibration of optical spectrum analyzers
  • JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
  • JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
  • JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
  • JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
  • JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • JIS C 6122-10-2:2010 Optical amplifiers -- Test methods -- Part 10-2: Multichannel parameters -- Pulse method using a gated optical spectrum analyzer
  • JIS C 6122-10-4:2012 Optical amplifiers -- Test methods -- Part 10-4: Multichannel parameters -- Interpolated source subtraction method using an optical spectrum analyzer
  • JIS B 7263-1:2007 Optics and optical instruments -- Test methods for telescopic systems -- Part 1: Test methods for basic characteristics

CENELEC - European Committee for Electrotechnical Standardization, The basics of a spectrum analyzer

  • EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
  • EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
  • EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
  • EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
  • EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
  • EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
  • EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
  • EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
  • EN 61290-1-2:1998 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters Electrical Spectrum Analyzer

ZA-SANS, The basics of a spectrum analyzer

  • SANS 62129:2008 Calibration of optical spectrum analyzers
  • SANS 61280-1-3:1998 Fibre optic communication subsystem basic test procedures Part 1-3: Test procedures for general communication subsystems - Central wavelength and spectral width measurement

Korean Agency for Technology and Standards (KATS), The basics of a spectrum analyzer

  • KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
  • KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
  • KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
  • KS C IEC 61290-5-3:2003 Basic specification for optical amplifier test methods-Part 5-3:Test methods for reflectance parameters-Reflectance tolerance using an electrical spectrum analyser
  • KS C IEC 61290-5-3-2003(2018)
  • KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D 1702-2015 Platium-Determination of trace-element content by inductively coupled plasma spectrometric analysis-Matrix matching method
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 17974-2011(2021) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 15471:2005 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS C IEC 61290-3-2-2005(2020) Optical amplifiers-Part 3-2:Test methods for noise figure parameters-Electrical spectrum analyzer method
  • KS C IEC 60601-2-39:2008 Peritoneal dialysis equipment
  • KS C IEC 60601-2-39:2017 Medical electrical equipment — Part 2-39: Particular requirements for basic safety and essential performance of peritoneal dialysis equipment
  • KS E ISO 9208:2001 Aluminium ores-Determination of vanadium content-BPHA spectrophotometric method
  • KS D ISO 17974:2011 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS C IEC 61290-10-1:2005 Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
  • KS C IEC 61290-10-2:2005 Optical amplifiers-Test methods-Part 10-2:Multichannel parameters-Pulse method using a gated optical spectrum analyzer
  • KS C IEC 60601-2-22:2011 Medical electrical equipment-Part 2-22:Particular requirements for basic safety and essential performance of surgical, cosmetic,therapeutic and diagnostic laser equipment
  • KS C IEC 61280-1-3:2003 Fiber optic communication subsystem basic test procedures-Part 1-3:Test procedures for general communication subsystems-Central wavelength and spectral width measurement

American National Standards Institute (ANSI), The basics of a spectrum analyzer

  • ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
  • ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
  • ANSI/TIA/EIA 455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
  • ANSI/TIA/EIA 455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
  • ANSI/TIA-455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
  • ANSI/TIA/EIA 455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer
  • ANSI/TIA-455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
  • ANSI/TIA-455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
  • ANSI/TIA-455-207-2000 FOTP207 - IEC 61290-1-2- Optical Fiber Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer
  • ANSI/TIA-455-122-A-2002 Polarization-Mode Dispersion Measurement for Single Mode Optical Fibers by Jones Matrix Eigenanalysis

Association Francaise de Normalisation, The basics of a spectrum analyzer

  • NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
  • NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
  • NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
  • NF EN 61290-5-3:2002 Amplificateurs à fibres optiques - Spécification de base - Partie 5-3 : méthodes d'essai des paramètres de réflectance - Tolérance de réflectance en utilisant un analyseur de spectre électrique
  • NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
  • NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.
  • NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
  • NF C93-805-5-3*NF EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3 : test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser.
  • NF EN 61290-10-2:2008 Amplificateurs optiques - Méthodes d'essai - Partie 10-2 : paramètres à canaux multiples - Méthode d'impulsion utilisant un analyseur de spectre optique stroboscopique
  • NF EN 61290-10-1:2009 Amplificateurs optiques - Méthodes d'essai - Partie 10-1 : paramètres à canaux multiples - Méthode d'impulsion utilisant un interrupteur optique et un analyseur de spectre optique
  • NF C93-805-10-4*NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4 : multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
  • NF EN 61290-10-4:2007 Amplificateurs optiques - Méthodes d'essai - Partie 10-4 : paramètres à canaux multiples - Méthode par soustraction de source interpolée en utilisant un analyseur de spectre optique
  • NF C93-805-10-2:2003 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer.
  • NF C93-805-10-2*NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer
  • NF EN IEC 80601-2-71:2018 Appareils électromédicaux - Partie 2-71 : exigences particulières pour la sécurité de base et les performances essentielles des appareils d'imagerie spectroscopique proche infrarouge (NIRS)
  • NF C74-391*NF EN IEC 80601-2-71:2018 Medical electrical equipment - Part 2-71 : particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (NIRS) equipment
  • NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif
  • NF EN 63005-1:2017 Enregistreurs de données vidéo pour l'identification et l'analyse des causes des accidents des véhicules routiers - Partie 1 : exigences de bases
  • NF B41-105*NF EN 15979:2011 Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation.
  • NF C74-327*NF EN 60601-2-39:2008 Medical electrical equipment - Part 2-39 : particular requirements for basic safety and essential performance of peritoneal dialysis equipment
  • NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
  • NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
  • FD T90-187-1:2010 Water quality - Determination of glyphosate and aminomethylphosphonic acid (AMPA) - Part 1 : analysis method by liquid chromatography with fluorimetric detection using post-column derivation

Lithuanian Standards Office , The basics of a spectrum analyzer

  • LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
  • LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
  • LST EN 61290-5-3-2003 Optical fibre amplifiers. Basic specification. Part 5-3: Test methods for reflectance parameters. Reflectance tolerance using an electrical spectrum analyzer (IEC 61290-5-3:2002)
  • LST EN 61290-10-1-2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009)
  • LST EN 61290-10-2-2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007)
  • LST EN 61290-10-4-2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007)

German Institute for Standardization, The basics of a spectrum analyzer

  • DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
  • DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
  • DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
  • DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
  • DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
  • DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
  • DIN EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3: Test methods for reflectance parameters; Reflectance tolerance using an electrical spectrum analyser (IEC 61290-5-3:2002); German version EN 61290-5-3:2002
  • DIN V ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES) without separation of the lead matrix; German version ENV 13800:2000
  • DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
  • DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
  • DIN EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
  • DIN EN 61290-10-4:2008-02 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007 / Note: Applies in conjunction with DIN EN 61291...
  • DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
  • DIN 58960-1:1988-05 Photometers for analytical tests; used physical-chemical basic processes
  • DIN EN 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2015); German version EN 61290-1-1:2015
  • DIN EN 61290-10-1:2010 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009
  • DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51790-7:2002-01 Testing of liquid fuels - Determination of the vanadium and nickel content - Part 7: Analysis by wavelength dispersive X-ray spectrometry (XRS) and Fundamental-Parameter-Method
  • DIN EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
  • DIN EN 62703:2014 Expression of performance of fluorometric oxygen analyzers in liquid media (IEC 62703:2013); German version EN 62703:2013
  • DIN 51577-4:2023-07 Testing of mineral oil hydrocarbons and similar products - Determination of chlorine and bromine content - Analysis by energy dispersive X-ray spectrometry with low cost instruments / Note: Date of issue 2023-06-09*Intended as replacement for DIN 51577...
  • DIN 51790-7:2002 Testing of liquid fuels - Determination of the vanadium and nickel content - Part 7: Analysis by wavelength dispersive X-ray spectrometry (XRS) and Fundamental-Parameter-Method
  • DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
  • DIN 51577-4:1994-02 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
  • DIN ISO 14490-1:2006 Optics and optical instruments - Test methods for telescopic systems - Part 1: Test methods for basic characteristics (ISO 14490-1:2005) English version of DIN ISO 14490-1:2006-08
  • DIN 51577-4:2023-11 Testing of mineral oil hydrocarbons and similar products - Determination of chlorine and bromine content - Part 4: Analysis by energy dispersive X-ray spectrometry with low cost instruments
  • DIN EN ISO 23674:2022-12 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022); German version EN ISO 23674:2022
  • DIN EN 16424:2015 Characterization of waste - Screening methods for the element composition by portable X-ray fluorescence instruments; German version EN 16424:2014
  • DIN 38407-14:1994 German standard methods for the examination of water, waste water, and sludge - Jointly determinable substances (group F) - Part 14: Determination of phenoxyalkyl carbonic acids by gas chromatography and mass-spectrometric detection after solid-liquid-ext

IEC - International Electrotechnical Commission, The basics of a spectrum analyzer

  • PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

American Society for Testing and Materials (ASTM), The basics of a spectrum analyzer

  • ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D6122-21 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
  • ASTM D6122-20a Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
  • ASTM D6122-20 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
  • ASTM D6122-22 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
  • ASTM D6247-10 Standard Test Method for Determination of Elemental Content of Polyolefins by Wavelength Dispersive X-ray Fluorescence Spectrometry
  • ASTM D7941/D7941M-23 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
  • ASTM E2465-19 Standard Test Method for Analysis of Ni-Base Alloys by X-ray Fluorescence Spectrometry
  • ASTM D7941/D7941M-14 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
  • ASTM E158-86(1996)e1 Standard Practice for Fundamental Calculations to Convert Intensities into Concentrations in Optical Emission Spectrochemical Analysis (Withdrawn 2004)
  • ASTM E1009-95(2000) Standard Practice for Evaluating an Optical Emission Vacuum Spectrometer to Analyze Carbon and Low-Alloy Steel
  • ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
  • ASTM E2465-11e1 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
  • ASTM E2056-04(2010) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
  • ASTM E2056-04(2016) Standard Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
  • ASTM E2465-11 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength-Dispersive X-Ray Fluorescence Spectrometry
  • ASTM E2465-13 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
  • ASTM D7165-10(2015) Standard Practice for Gas Chromatograph Based On-line/At-line Analysis for Sulfur Content of Gaseous Fuels
  • ASTM E1010-16 Standard Practice for Preparation of Disk Specimens of Steel and Iron by Remelting for Spectrochemical Analysis
  • ASTM D7417-17 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
  • ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM D7417-10 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
  • ASTM E2994-21 Standard Test Method for Analysis of Titanium and Titanium Alloys by Spark Atomic Emission Spectrometry and Glow Discharge Atomic Emission Spectrometry (Performance-Based Method)
  • ASTM D6122-10 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, and Laboratory Infrared Spectrophotometer Based Analyzer Systems
  • ASTM D6122-13 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, and Laboratory Infrared Spectrophotometer Based Analyzer Systems
  • ASTM D6122-15 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, and Laboratory Infrared Spectrophotometer Based Analyzer Systems
  • ASTM D8470-22 Standard Practice for Development and Implementation of Instrument Performance Tests for Use on Multivariate Online, At-Line and Laboratory Spectroscopic Based Analyzer Systems
  • ASTM E2994-16 Standard Test Method for Analysis of Titanium and Titanium Alloys by Spark Atomic Emission Spectrometry and Glow Discharge Atomic Emission Spectrometry (Performance-Based Method)
  • ASTM E2823-11 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Mass Spectrometry (Performance-Based Method)
  • ASTM E2594-20 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry (Performance-Based)
  • ASTM E2594-09(2014) Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry 40;Performance-Based Method41;
  • ASTM D7235-16 Standard Guide for Establishing a Linear Correlation Relationship Between Analyzer and Primary Test Method Results Using Relevant ASTM Standard Practices
  • ASTM E2594-09 Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry (Performance-Based Method)

European Committee for Electrotechnical Standardization(CENELEC), The basics of a spectrum analyzer

  • EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
  • EN 61290-5-3:2002 Optical Fibre Amplifiers - Basic Specification Part 5-3: Test Methods for Reflectance Parameters - Reflectance Tolerance Using an Electrical Spectrum Analyser
  • EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
  • EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
  • EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
  • EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
  • EN IEC 80601-2-71:2018 Medical electrical equipment - Part 2-71: Particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (NIRS) equipment
  • EN 61290-1-2:2005 Optical amplifiers - Test methods Part 1-2: Power and gain parameters - Electrical spectrum analyzer method

ES-UNE, The basics of a spectrum analyzer

  • UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
  • UNE-EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification -- Part 5-3: Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser. (Endorsed by AENOR in October of 2002.)
  • UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
  • UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
  • UNE-EN ISO 23674:2023 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
  • UNE-EN 61290-10-4:2007 Optical amplifiers - Test methods -- Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007). (Endorsed by AENOR in November of 2007.)
  • UNE-EN IEC 80601-2-71:2018 Medical electrical equipment - Part 2-71: Particular requirements for the basic safety and essential performance of functional Near-Infrared Spectroscopy (NIRS) equipment (Endorsed by Asociación Española de Normalización in August of 2018.)

(U.S.) Telecommunications Industries Association , The basics of a spectrum analyzer

  • TIA/EIA-455-209-2000 FOTP-209 IEC 61290-2-1 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
  • TIA/EIA-455-206-2000 FOTP-206 IEC 61290-1-1 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
  • TIA/EIA-455-210-2000 FOTP-210 IEC 61290-2-2 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer

IN-BIS, The basics of a spectrum analyzer

RU-GOST R, The basics of a spectrum analyzer

  • GOST 26874-1986 Ionizing radiation power spectrometers. Methods of basic parameters measurement
  • GOST 18230-1972 Power supplies spectrometric semiconductor radiation detectors. Types and basic parameters
  • GOST R 8.743-2011 State system for ensuring the uniformity of measurements. Optics and photonics. Interferometric measurement of optical elements and systems. Part 1. Terms, definitions and fundamental relationships

TIA - Telecommunications Industry Association, The basics of a spectrum analyzer

  • TIA/EIA-455-221-2001 FOTP-221-IEC 61290-5-1 - Optical Fiber Amplifiers - Basic Specification - Part 5-1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer (Please refer to IEC 61290-5-1)
  • TIA/EIA-455-207-2000 FOTP-207 IEC 61290-1-2 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters - Electrical Spectrum Analyzer (Please refer to IEC 61290-1-2)

国家市场监督管理总局、中国国家标准化管理委员会, The basics of a spectrum analyzer

  • GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GB/T 38939-2020 Nickel-based alloy—Determination of multi-element contents—Spark discharge atomic emission spectrometric method(routine method)
  • GB/T 4698.6-2019 Methods for chemical analysis of titanium sponge,titanium and titanium alloys—Part 6:Determination of boron content—Methylene blue spectrophotometry and inductively coupled plasma atomic emission spectrometry

International Organization for Standardization (ISO), The basics of a spectrum analyzer

  • ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • ISO 24417:2022 Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
  • ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
  • ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
  • ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
  • ISO 23674:2022 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • ISO 14490-1:2005 Optics and optical instruments - Test methods for telescopic systems - Part 1: Test methods for basic characteristics
  • ISO/TR 14999-1:2005 Optics and photonics - Interferometric measurement of optical elements and optical systems - Part 1: Terms, definitions and fundamental relationships
  • IEC 80601-2-71:2015 Medical electrical equipment — Part 2-71: Particular requirements for the basic safety and essential performance of functional Near-Infrared Spectroscopy (NIRS) equipment
  • IEC/CD 80601-2-71 Medical electrical equipment — Part 2-71: Particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (functional NIRS) equipment
  • IEC/DIS 80601-2-71:2011 Medical electrical equipment — Part 2-71: Particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (functional NIRS) equipment

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, The basics of a spectrum analyzer

  • GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
  • GB/T 29559-2013 Surface chemical analysis.Analysis of zinc and/or aluminium based metallic coatings by glow discharge optical emission spectrometry
  • GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
  • GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
  • GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
  • GB/T 12689.5-2004 The methods for chemical analysis of zinc and zinc alloys-The determination of iron content-The sultosalicylic acid spectrometric method and the flame atomic absorption spectrometric method
  • GB/T 12689.4-2004 The methods for chemical analysis of zinc and zinc alloys-The determination of copper content-The lead diethyldithio-carbamate spectrophotometric method and the flame atomic absorption spectrometric method and the electrolytic method
  • GB 9706.271-2022 Medical electrical equipment—Part 2-71: Particular requirements for the basic safety and essential performance of functional near-infrared spectroscopy (NIRS) equipment
  • GB/T 3884.9-2012 Methods for chemical analysis of copper concentrates.Part 9:Determination of arsenic and bismuth contents.Hydride generation-atomic fluorescence spectrometry method The potassium bromate titration method and The silver diethyl dithiocarbamate photometric
  • GB/T 31836-2015 Radiation protection instrumentation.Spectroscopy-based portal monitors used for the detection and identification of illicit trafficking of radioactive material
  • GB/T 13747.18-2022 Methods for chemical analysis of zirconium and zirconium alloys—Part 18:Determination of vanadium content—N-benzoyl-N-phenyl hydroxylamine spectrophotometry and inductively coupled plasma atomic emiss

American Bureau of Shipping , The basics of a spectrum analyzer

  • ABS 125-2004 GUIDANCE NOTES ON SPECTRAL-BASED FATIGUE ANALYSIS FOR VESSELS (FOR THE 慡FA?OF 慡FA (years)?CLASSIFICATION NOTATION)
  • ABS 104-2010 GUIDE FOR SPECTRAL-BASED FATIGUE ANALYSIS FOR FLOATING PRODUCTION, STORAGE AND OFFLOADING (FPSO) INSTALLATIONS
  • ABS 125 CORR-2008 GUIDANCE NOTES ON SPECTRAL-BASED FATIGUE ANALYSIS FOR VESSELS (FOR THE 慡FA?OF 慡FA (years)?CLASSIFICATION NOTATION)

VN-TCVN, The basics of a spectrum analyzer

  • TCVN 5270-2008 Honey.Determination of hydroxymetylfurfural by spectrophotometric method
  • TCVN 1674-1-2009 Iron ores.Determination of vanadium.Prat1:BPHA spectrophotometric method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, The basics of a spectrum analyzer

  • GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales

KR-KS, The basics of a spectrum analyzer

  • KS D ISO 15472-2003(2023)
  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Standard Association of Australia (SAA), The basics of a spectrum analyzer

  • AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • AS/NZS 3580.15:2014
  • AS 2300.1.8.2:1991 Methods of chemical and physical testing for the dairying industry - General methods and principles - Assessment of instrumental methods - Infrared spectrometric analysis of milk
  • AS 4479.4:1999 Analysis of soils - Determination of metals in aqua regia extracts of soil by inductively coupled plasma-atomic emission spectrometry

RO-ASRO, The basics of a spectrum analyzer

ABS - American Bureau of Shipping, The basics of a spectrum analyzer

  • ABS 125-2016 GUIDE FOR SPECTRAL-BASED FATIGUE ANALYSIS FOR VESSELS (FOR THE ‘SFA (years)’ CLASSIFICATION NOTATION)
  • ABS 125 NOTICE 4-2012 GUIDANCE NOTES ON SPECTRAL-BASED FATIGUE ANALYSIS FOR VESSELS (FOR THE ‘SFA (years)’ CLASSIFICATION NOTATION)
  • ABS 125 NOTICE 2-2007 GUIDANCE NOTES ON SPECTRAL-BASED FATIGUE ANALYSIS FOR VESSELS (FOR THE ‘SFA’ OF ‘SFA (years)’ CLASSIFICATION NOTATION)
  • ABS 125 NOTICE 1-2006 GUIDANCE NOTES ON SPECTRAL-BASED FATIGUE ANALYSIS FOR VESSELS (FOR THE ‘SFA’ OF ‘SFA (years)’ CLASSIFICATION NOTATION)
  • ABS 125 CORR-2012 GUIDANCE NOTES ON SPECTRAL-BASED FATIGUE ANALYSIS FOR VESSELS (FOR THE ‘SFA’ OF ‘SFA (years)’ CLASSIFICATION NOTATION)

未注明发布机构, The basics of a spectrum analyzer

  • DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method

Professional Standard - Energy, The basics of a spectrum analyzer

  • NB/SH/T 0940-2016 Test method for the analysis of in-use lubricants using a specific 4-in-1 tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity and Laser Particle Counter)

国家能源局, The basics of a spectrum analyzer

  • SH/T 0940-2016 Test methods for analyzing in-service lubricants using specific four-in-one testers (atomic emission spectrometry, infrared spectroscopy, viscosity and laser particle counter)

European Committee for Standardization (CEN), The basics of a spectrum analyzer

  • EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
  • prEN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

Professional Standard - Machinery, The basics of a spectrum analyzer

  • JB/T 8425-1996 Standard test method of X-ray fluorescence spectrometric analysis of content of chromium, nickel, molybdenum and vanadium in iron base dusty spray

International Commission on Illumination (CIE), The basics of a spectrum analyzer

  • CIE 170-2-2015 Fundamental Chromaticity Diagram with Physiological Axes - Part 2: Spectral Luminous Efficiency Functions and Chromaticity Diagrams

CZ-CSN, The basics of a spectrum analyzer

AT-ON, The basics of a spectrum analyzer

  • OENORM EN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)
  • ONORM M 6282-1987 Water analysis; determination ofnitrite; 4-aminobenzene Sulfonamide — N-(l-naphthyl)-1,2-diaminoethane-dihydrochloride spectrometric method

Professional Standard - Non-ferrous Metal, The basics of a spectrum analyzer

  • YS/T 990.8-2014 Methods for chemical analysis of copper matte.Part 8:Determination of arsenic content.Hydride generation-atomic fluorescence spectrometry、silver diethyldithiocarbamate spectrophotometry and potassium bromate titrimetry
  • YS/T 953.6-2014 Methods for chemical analysis of fire smelting nickel substrate material.Part 6:Determination of cobalt content.5-CI-PADAB spectrophotometric method and flame atomic absorption spectrometric method
  • YS/T 746.4-2010 Methods for chemical analysis of lead-free tin-based solders- Part 4: Determination of lead content- Flame atomic absorption spectrometric method
  • YS/T 746.6-2010 Methods for chemical analysis of lead-free tin-based solders- Part 6: Determination of antimony content- Flame atomic absorption spectrometric method
  • YS/T 746.7-2010 Methods for chemical analysis of lead-free tin-based solders- Part 7: Determination of iron content- Flame atomic absorption spectrometric method
  • YS/T 746.10-2010 Methods for chemical analysis of lead-free tin-based solders- Part 10: Determination of aluminum content- Electrothermal atomic absorption spectrometric method
  • YS/T 746.11-2010 Methods for chemical analysis of lead-free tin-based solders- Part 11: Determination of Cadmium content- Flame atomic absorption spectrometric method
  • YS/T 746.13-2010 Methods for chemical analysis of tin-based lead-free solders- Part 13: Determination of nickel content- Flame atomic absorption spectrometric method
  • YS/T 953.7-2014 Methods for chemical analysis of fire smelting nickel substrate material.Part 7: Determination of copper content.BCO spectrophotometric method and flame atomic absorption spectrometric method

Professional Standard - Medicine, The basics of a spectrum analyzer

  • YY 0792.2-2010 Ophthalmic instruments.Endoilluminators.Part 2 : Fundamental requirements and test methods for optical radiation safety

Jiangxi Provincial Standard of the People's Republic of China, The basics of a spectrum analyzer

  • DB36/T 687-2012 Yttrium-based rare earth nodulizer chemical analysis method for the determination of yttrium inductively coupled plasma emission spectrometry

NZ-SNZ, The basics of a spectrum analyzer

  • AS/NZS 3580.17:2016 Methods for sampling and analysis of ambient air Method 17: Determination of gaseous compounds in ambient air-Direct-reading cavity ring-down spectroscopy instrumental method




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