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semiconductor gap

semiconductor gap, Total:8 items.

In the international standard classification, semiconductor gap involves: Surface treatment and coating, Semiconductor devices, Radiation measurements, Integrated circuits. Microelectronics.

Association Francaise de Normalisation, semiconductor gap

• NF C80-204*NF EN 62418:2011 Semiconductor devices - Metallization stress void test

International Electrotechnical Commission (IEC), semiconductor gap

• IEC 62418:2010 Semiconductor devices - Metallization stress void test

British Standards Institution (BSI), semiconductor gap

• BS EN 62418:2010 Semiconductor devices. Metallization stress void test

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., semiconductor gap

• IEEE N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

American National Standards Institute （ANSI), semiconductor gap

• ANSI N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

Institute of Electrical and Electronics Engineers (IEEE), semiconductor gap

• IEEE/ANSI N42.31-2003 American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

German Institute for Standardization, semiconductor gap

• DIN EN 62418:2010 Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010

Professional Standard - Electron, semiconductor gap

• SJ/T 10255-1991 Detail specification for electronic components.Semiconductor integrated circuit-CW1403 type precision energy-gap voltage reference

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