ZH
RU
ES
The structure of the electron microscope
The structure of the electron microscope, Total:84 items.
In the international standard classification, The structure of the electron microscope involves: Testing of metals, Optical equipment, Optics and optical measurements, Welding, brazing and soldering, Analytical chemistry, Air quality, Electronic components in general, Production of metals, Microbiology, Coals, Electronic display devices, Linear and angular measurements, Surface treatment and coating, Construction materials, Raw materials for rubber and plastics, Protection against dangerous goods, Protection against crime.
IT-UNI, The structure of the electron microscope
- UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.
- UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
International Organization for Standardization (ISO), The structure of the electron microscope
- ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
- ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
British Standards Institution (BSI), The structure of the electron microscope
- BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
- BS ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Association Francaise de Normalisation, The structure of the electron microscope
- NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, The structure of the electron microscope
- GB/Z 21738-2008 Fundamental structures of one dimensional nano-materials.High resolution
transmission electron microscopy characterization
- GB/T 5594.8-1985 Test methods for properties of structure ceramic used in electronic components--Determination of microstructure
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/Z 26083-2010 Determination for Copper(Ⅱ) octaakoxyl-substituted phthalocyanine on graphite surface(scanning tunneling microscope)
- GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device.Part 8:Test method for microstructure
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
Korean Agency for Technology and Standards (KATS), The structure of the electron microscope
Association of German Mechanical Engineers, The structure of the electron microscope
Japanese Industrial Standards Committee (JISC), The structure of the electron microscope
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS M 8816:1992 Solid mineral fuels -- Methods of microscopical measurement for the macerals and reflectance
American Society for Testing and Materials (ASTM), The structure of the electron microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D7658-17(2021) Standard Test Method for Direct Microscopy of Fungal Structures from Tape
- ASTM D5061-07 Standard Test Method for Microscopical Determination of the Textural Components of Metallurgical Coke
- ASTM D5061-19 Standard Test Method for Microscopical Determination of the Textural Components of Metallurgical Coke
- ASTM D8075-16 Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
- ASTM D8075-16(2021) Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
- ASTM D7658-17 Standard Test Method for Direct Microscopy of Fungal Structures from Tape
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM D5755-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM D5755-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM D5755-03 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-09 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-09(2014)e1 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D5061-92(2004) Standard Test Method for Microscopical Determination of Volume Percent of Textural Components in Metallurgical Coke
- ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D6480-05(2010) Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
Institute of Interconnecting and Packaging Electronic Circuits (IPC), The structure of the electron microscope
国家市场监督管理总局、中国国家标准化管理委员会, The structure of the electron microscope
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
- GB/T 36175-2018 Special design external micrometer with electronic digital display
International Electrotechnical Commission (IEC), The structure of the electron microscope
KR-KS, The structure of the electron microscope
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
工业和信息化部, The structure of the electron microscope
- YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
German Institute for Standardization, The structure of the electron microscope
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
SE-SIS, The structure of the electron microscope
RU-GOST R, The structure of the electron microscope
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
Danish Standards Foundation, The structure of the electron microscope
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
ES-UNE, The structure of the electron microscope
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)