ZH
RU
ES
Basic structure of electron microscope
Basic structure of electron microscope, Total:53 items.
In the international standard classification, Basic structure of electron microscope involves: Optics and optical measurements, Coals, Testing of metals, Optical equipment, Linear and angular measurements, Semiconductor devices, Integrated circuits. Microelectronics, Air quality, Analytical chemistry, Protection against dangerous goods, Microprocessor systems, Applications of information technology, Mechanical structures for electronic equipment.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Basic structure of electron microscope
- GB/Z 21738-2008 Fundamental structures of one dimensional nano-materials.High resolution
transmission electron microscopy characterization
- GB/Z 26083-2010 Determination for Copper(Ⅱ) octaakoxyl-substituted phthalocyanine on graphite surface(scanning tunneling microscope)
- GB/T 5594.8-1985 Test methods for properties of structure ceramic used in electronic components--Determination of microstructure
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device.Part 8:Test method for microstructure
Professional Standard - Machinery, Basic structure of electron microscope
- JB/T 5586-1991 Classification and basic parameter of transmission electron microscope
Japanese Industrial Standards Committee (JISC), Basic structure of electron microscope
- JIS M 8816:1992 Solid mineral fuels -- Methods of microscopical measurement for the macerals and reflectance
SE-SIS, Basic structure of electron microscope
Association Francaise de Normalisation, Basic structure of electron microscope
- NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
IT-UNI, Basic structure of electron microscope
- UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.
International Organization for Standardization (ISO), Basic structure of electron microscope
- ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
- ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
未注明发布机构, Basic structure of electron microscope
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
British Standards Institution (BSI), Basic structure of electron microscope
- BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
- BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
- BS ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
- BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
American Society for Testing and Materials (ASTM), Basic structure of electron microscope
- ASTM D5755-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM D5755-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM D5755-03 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-09 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-09(2014)e1 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D6480-05(2010) Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
- ASTM D6480-99 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
- ASTM D6480-05 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
- ASTM D6480-19 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Surface Loading by Transmission Electron Microscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Basic structure of electron microscope
- GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon nanomaterials involving biological effect
- GB/T 34002-2017 Microbeam analysis—Analytical transmission electron microscopy—Methods for calibrating image magnification by using reference materials having periodic structures
European Telecommunications Standards Institute (ETSI), Basic structure of electron microscope
- ETSI TR 102 438-2006 Electronic Signatures and Infrastructures (ESI); Application of Electronic Signature Standards in Europe
- ETSI TS 102 734-2007 Electronic Signatures and Infrastructures; Profiles of CMS Advanced Electronic Signatures based on TS 101 733 (CAdES)
- ETSI SR 002 176-2003 Electronic Signatures and Infrastructures (ESI); Algorithms and Parameters for Secure Electronic Signatures
- ETSI TS 102 904-2007 Electronic Signatures and Infrastructures; Profiles of XML Advanced Electronic Signatures based on TS 101 903 (XAdES) (V1.1.1)
- ETSI TR 102 153-2003 Electronic Signatures and Infrastructures (ESI); Pre-study on certificate profiles (V1.1.1)
- ETSI TR 102 272-2003 Electronic Signatures and Infrastructures (ESI); ASN.1 format for signature policies (V1.1.1)
- ETSI SR 003 232-2011 Electronic Signatures and Infrastructures (ESI); PDF Advanced Electronic Signature Profiles (PAdES); Printable Representations of Electronic Signatures (V1.1.1)
- ETSI TS 101 456-2005 Electronic Signatures and Infrastructures (ESI); Policy requirements for certification authorities issuing qualified certificates V1.3.1
- ETSI TS 101 456-2006 Electronic Signatures and Infrastructures (ESI); Policy requirements for certification authorities issuing qualified certificates (V1.4.2)
- ETSI TR 102 038-2002 TC Security - Electronic Signatures and Infrastructures (ESI); XML Format for Signature Policies (V1.1.1)
- ETSI TR 102 045-2003 Electronic Signatrues and Infrastructures (ESI); Signature policy for extended business model (V1.1.1)
- ETSI TS 102 778-2009 Electronic Signatures and Infrastructures (ESI); PDF Advanced Electronic Signature Profiles; CMS Profile based on ISO 32000-1 (V1.1.1)
- ETSI TR 102 317-2004 Electronic Signatures and Infrastructures (ESI); Process and tools for maintenance of ETSI deliverables (V1.1.1)
- ETSI TS 102 778-2-2009 Electronic Signatures and Infrastructures (ESI); PDF Advanced Electronic Signature Profiles; Part 2: PAdES Basic - Profile based on ISO 32000-1 (V1.2.1)
RU-GOST R, Basic structure of electron microscope
- GOST 25122-1982 The unified system of electronic computers. Base constructions of hardware. Basic dimensions
- GOST R 57720-2017 Information and communication technologies in education. E-Portfolio information basic structure
- GOST R 59631-2021 Basic carrying structures of the third level for stationary radioelectronic means. Design and dimensions
Professional Standard - Electron, Basic structure of electron microscope
- SJ 20370-1993 General specification for military electronic test equipment.Basic requirements for design and construction
GOSTR, Basic structure of electron microscope
- GOST R 58240-2018 Low voltage systems. Cable systems. Horizontal subsystem of structured cable system. Basic principles
- GOST R 58241-2018 Low voltage systems. Cable systems. Backbone subsystem of structured cable system. Basic principles
BELST, Basic structure of electron microscope
- STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements
- STB 2209-2011 Nano-sized carbon and non-carbon materials and composites based on them. The technique for determining elemental composition using scan electron microscopy measurements