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Field Electron Probe Analyzer

Field Electron Probe Analyzer, Total:104 items.

In the international standard classification, Field Electron Probe Analyzer involves: Optics and optical measurements, Analytical chemistry, Vocabularies, Protection against fire, Test conditions and procedures in general, Optical equipment, Testing of metals, Ceramics.


National Metrological Verification Regulations of the People's Republic of China, Field Electron Probe Analyzer

  • JJG 901-1995 Verification Regulation of Electron Probe Microanalyzer

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Field Electron Probe Analyzer

  • GB/T 15075-1994 Method for testing EPMA instrument
  • GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
  • GB/T 15074-2008 General guide of quantitative analysis by EPMA
  • GB/T 15074-1994 General guide for EPMA quantitative analysis
  • GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
  • GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
  • GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
  • GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
  • GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
  • GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
  • GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
  • GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
  • GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
  • GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
  • GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
  • GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
  • GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
  • GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
  • GB/T 17506-1998 The method of electron probe micro analysis as corrosive layer on ferrous metals of ship
  • GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
  • GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
  • GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
  • GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
  • GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
  • GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis
  • GB/T 15247-1994 Electron probe quantitative analysis method of carbon in carbon steel and low alloy steel--Sensitivity curve method (detection limit method)

Korean Agency for Technology and Standards (KATS), Field Electron Probe Analyzer

  • KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
  • KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
  • KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
  • KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 16592:2011 Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D ISO 16592-2011(2016) Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D ISO 16592-2011(2021) Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D ISO 22489:2012 Microbeam analysis-Electron probe microanalysis-Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
  • KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

KR-KS, Field Electron Probe Analyzer

  • KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
  • KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
  • KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
  • KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会, Field Electron Probe Analyzer

  • GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
  • GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
  • GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer

International Organization for Standardization (ISO), Field Electron Probe Analyzer

  • ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
  • ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
  • ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
  • ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
  • ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
  • ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
  • ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
  • ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
  • ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
  • ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy

Association Francaise de Normalisation, Field Electron Probe Analyzer

  • NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
  • NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
  • NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
  • NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
  • NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
  • NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
  • NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.

British Standards Institution (BSI), Field Electron Probe Analyzer

  • BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
  • BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
  • 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
  • BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
  • BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
  • BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
  • 20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
  • 22/30430960 DC BS ISO 14595. Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
  • BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
  • 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
  • BS EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Determination of chemical composition by electron probe microanalysis (EPMA)

Professional Standard - Petroleum, Field Electron Probe Analyzer

  • SY/T 6027-2012 Quantitative analysis method of rock and mineral by electron probe microanalysis
  • SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals

国家能源局, Field Electron Probe Analyzer

  • SY/T 6027-2019 Electron probe quantitative analysis method of rock minerals

Yunnan Provincial Standard of the People's Republic of China, Field Electron Probe Analyzer

  • DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

National Metrological Technical Specifications of the People's Republic of China, Field Electron Probe Analyzer

  • JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe

Professional Standard - Aviation, Field Electron Probe Analyzer

  • HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys

Japanese Industrial Standards Committee (JISC), Field Electron Probe Analyzer

  • JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy

Fujian Provincial Standard of the People's Republic of China, Field Electron Probe Analyzer

  • DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

German Institute for Standardization, Field Electron Probe Analyzer

  • DIN ISO 16592:2015 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012)




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