ZH
RU
ES

Field electron probe use

Field electron probe use, Total:66 items.

In the international standard classification, Field electron probe use involves: Optics and optical measurements, Radiation measurements, Analytical chemistry, Thermodynamics and temperature measurements, Components and accessories for telecommunications equipment, Diagnostic, maintenance and test equipment, Ceramics, Semiconducting materials, Electromechanical components for electronic and telecommunications equipment, Radiation protection.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Field electron probe use

GB/T 4930-1993 General specification of electron probe microanalysis standard specimen

National Metrological Technical Specifications of the People's Republic of China, Field electron probe use

JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe

German Institute for Standardization, Field electron probe use

DIN 6800-1:1980 Procedures in dosimetry; principles of photon and electron dosimetry with probe-type detectors
DIN 6800-1:2016-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
DIN 6800-5:2005 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 5: Thermoluminescence dosimetry
DIN ISO 16592:2015 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012)
DIN EN 60512-16-1:2009 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008

Association Francaise de Normalisation, Field electron probe use

NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF C93-400-16-1*NF EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1 : mechanical tests on contacts and terminations - Test 16a : probe damage
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF EN 50364:2018 Norme de produit pour l'exposition du corps humain aux champs électromagnétiques émis par les dispositifs fonctionnant dans la gamme de fréquences de 0 Hz à 300 GHz, utilisés pour la surveillance électronique des objets (EAS), l'identification...

British Standards Institution (BSI), Field electron probe use

BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations — Test 16a: Probe damage
BS EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Determination of chemical composition by electron probe microanalysis (EPMA)
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS EN 50364:2010 Limitation of human exposure to electromagnetic fields from devices operating in the frequency range 0 Hz to 300 GHz, used in electronic article surveillance (EAS), radio frequency identification (RFID) and similar applications
BS EN 50364:2002 Limitation of human exposure to electromagnetic fields from devices operating in the frequency range 0 Hz to 10 GHz, used in electronic article surveillance (EAS), radio frequency identification (RFID) and similar applications

International Organization for Standardization (ISO), Field electron probe use

ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO/TR 10305-2:2003 Road vehicles - Calibration of electromagnetic field strength measuring devices - Part 2: IEEE standard for calibration of electromagnetic field sensors and probes, excluding antennas, from 9 kHz to 40 GHz
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

American Society for Testing and Materials (ASTM), Field electron probe use

ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
ASTM F374-00a Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure

Korean Agency for Technology and Standards (KATS), Field electron probe use

KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

US-FCR, Field electron probe use

FCR NE-F-11-4T-1972 DETERMINATION OF A FIGURE OF MERIT FOR PUO2-UO2 FUEL PELLET HOMOGENEITY BY USE OF AN ELECTRON MICROPROBE (INACTIVE FOR NEW DESIGN)

American National Standards Institute （ANSI), Field electron probe use

ANSI/SCTE 48-2-2008 Test Procedure for Measuring Relative Shielding Properties of Active and Passive Coaxial Cable Devices Using Agilent Magnetic Close Field Probe

Japanese Industrial Standards Committee (JISC), Field electron probe use

JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

PT-IPQ, Field electron probe use

NP 3136/2-1985

European Committee for Electrotechnical Standardization（CENELEC）, Field electron probe use

EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
EN 50364:2010 Limitation of human exposure to electromagnetic fields from devices operating in the frequency range 0 Hz to 300 GHz, used in Electronic Article Surveillance (EAS), Radio Frequency Identification (RFID) and similar applications

KR-KS, Field electron probe use

KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

International Electrotechnical Commission (IEC), Field electron probe use

IEC 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

CENELEC - European Committee for Electrotechnical Standardization, Field electron probe use

EN 50364:2001 Limitation of Human Exposure to Electromagnetic Fields from Devices Operating in the Frequency Range 0 Hz to 10 GHz@ Used in Electronic Article Surveillance (EAS)@ Radio Frequency Identification (RFID) and Similar Applications

US-CFR-file, Field electron probe use

CFR 7-1710.127-2014 Agriculture. Part1710:General and preloan policies and procedures common to electric loans and guarantees. SubpartC:Loan purposes and basic policies. Section1710.127:Drug free workplace.