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Classification of Electron Microscopes
Classification of Electron Microscopes, Total:195 items.
In the international standard classification, Classification of Electron Microscopes involves: Iron and steel products, Analytical chemistry, Optics and optical measurements, Air quality, Vocabularies, Optical equipment, Welding, brazing and soldering, Education, Testing of metals, Electronic components in general, Medical equipment, Electronic display devices, Protection against crime, Materials for the reinforcement of composites, Linear and angular measurements, Surface treatment and coating, Raw materials for rubber and plastics, Construction materials.
American Society for Testing and Materials (ASTM), Classification of Electron Microscopes
- ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM D3849-02 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-04 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D8075-16 Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
- ASTM D8075-16(2021) Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
- ASTM D3849-95a(2000) Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
- ASTM D3849-07 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-22 Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
- ASTM D3849-14a Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
International Organization for Standardization (ISO), Classification of Electron Microscopes
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
- ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
- ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- ISO/CD 20263:2023 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
- ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
- ISO 10312:1995 Ambient air - Determination of asbestos fibres - Direct-transfer transmission electron microscopy method
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 13794:2019 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
- ISO 10312:2019 Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method
- ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
Professional Standard - Machinery, Classification of Electron Microscopes
- JB/T 5586-1991 Classification and basic parameter of transmission electron microscope
- JB/T 5585-1991 Test method of transmission electron microscope resolution
Association Francaise de Normalisation, Classification of Electron Microscopes
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
- NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
- NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
- NF ISO 10312:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert direct
- NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
- NF EN ISO 21363:2022 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à transmission
British Standards Institution (BSI), Classification of Electron Microscopes
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
- BS ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
- 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- 15/30292710 DC BS ISO 19214. Guidelines for growth direction determination of wirelike crystals by transmission electron microscopy
- BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 13794:2019 Ambient air. Determination of asbestos fibres. Indirect-transfer transmission electron microscopy method
- BS ISO 10312:2019 Ambient air. Determination of asbestos fibres. Direct transfer transmission electron microscopy method
- BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
- BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
Japanese Industrial Standards Committee (JISC), Classification of Electron Microscopes
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
- JIS K 3850-2:2000 Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method
Korean Agency for Technology and Standards (KATS), Classification of Electron Microscopes
KR-KS, Classification of Electron Microscopes
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
- KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Classification of Electron Microscopes
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
- GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope
Association of German Mechanical Engineers, Classification of Electron Microscopes
Professional Standard - Education, Classification of Electron Microscopes
- JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
国家市场监督管理总局、中国国家标准化管理委员会, Classification of Electron Microscopes
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Classification of Electron Microscopes
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
- GB/Z 21738-2008 Fundamental structures of one dimensional nano-materials.High resolution
transmission electron microscopy characterization
- GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
- GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
- GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
- GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
工业和信息化部, Classification of Electron Microscopes
- YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
Institute of Interconnecting and Packaging Electronic Circuits (IPC), Classification of Electron Microscopes
Professional Standard - Petroleum, Classification of Electron Microscopes
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
国家能源局, Classification of Electron Microscopes
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
International Electrotechnical Commission (IEC), Classification of Electron Microscopes
German Institute for Standardization, Classification of Electron Microscopes
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
- DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
Danish Standards Foundation, Classification of Electron Microscopes
- DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
Group Standards of the People's Republic of China, Classification of Electron Microscopes
- T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
European Committee for Standardization (CEN), Classification of Electron Microscopes
- EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
- prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
- prEN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
SE-SIS, Classification of Electron Microscopes
RU-GOST R, Classification of Electron Microscopes
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
IT-UNI, Classification of Electron Microscopes
- UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
- UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.
ES-UNE, Classification of Electron Microscopes
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)
- UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
PH-BPS, Classification of Electron Microscopes
- PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
AENOR, Classification of Electron Microscopes
- UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
- UNE 77236:1999 AMBIENT AIR. DETERMINATION OF ASBESTOS FIBRES. DIRECT-TRANSFER TRANSMISSION ELECTRON MICROSCOPY METHOD.
Lithuanian Standards Office , Classification of Electron Microscopes
- LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Classification of Electron Microscopes
- GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method
Military Standard of the People's Republic of China-General Armament Department, Classification of Electron Microscopes
- GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy
- GJB 8684.23-2015 Test methods for pyrotechnic properties - Part 23: Determination of particle size distribution of smoke solid particles by electron microscopy
AT-ON, Classification of Electron Microscopes
- OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
- OENORM EN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
Professional Standard - Public Safety Standards, Classification of Electron Microscopes
- GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
- GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
HU-MSZT, Classification of Electron Microscopes