ZH
RU
ES

scanning electron microscope

scanning electron microscope, Total:38 items.

In the international standard classification, scanning electron microscope involves: Linear and angular measurements, Optical equipment, Air quality, Optics and optical measurements, Education, Vocabularies, Analytical chemistry, Protection against crime, Thermodynamics and temperature measurements.

BE-NBN, scanning electron microscope

• NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

British Standards Institution (BSI), scanning electron microscope

• 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
• BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

German Institute for Standardization, scanning electron microscope

• DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994

International Organization for Standardization (ISO), scanning electron microscope

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
• ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
• ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
• ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

Korean Agency for Technology and Standards (KATS), scanning electron microscope

• KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
• KS M 0044-1999
• KS I 0051-1999(2019) General rules for scanning electron microscopy
• KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
• KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
• KS I 0051-1999 General rules for scanning electron microscopy
• KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

Association Francaise de Normalisation, scanning electron microscope

• NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

Japanese Industrial Standards Committee (JISC), scanning electron microscope

• JIS K 0132:1997 General rules for scanning electron microscopy

American Society for Testing and Materials (ASTM), scanning electron microscope

• ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
• ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
• ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

National Metrological Technical Specifications of the People's Republic of China, scanning electron microscope

• JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery, scanning electron microscope

• JB/T 6842-1993 Test method of scanning electron microscope
• JB/T 5384-1991 Scanning electron microscope - Technical specification

National Metrological Verification Regulations of the People's Republic of China, scanning electron microscope

• JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
• JJG 550-1988 Verification Regulation of Scanning Electron Microscope

KR-KS, scanning electron microscope

• KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Professional Standard - Education, scanning electron microscope

• JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
• JY/T 010-1996 General principles of analytical scanning electron microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, scanning electron microscope

• GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens

Professional Standard - Public Safety Standards, scanning electron microscope

• GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy

Professional Standard - Petroleum, scanning electron microscope

• SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
• SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
• SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, scanning electron microscope

• DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局, scanning electron microscope

• SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

Professional Standard - Judicatory, scanning electron microscope

• SF/T 0139-2023

Group Standards of the People's Republic of China, scanning electron microscope

• T/QGCML 1940-2023

Others:   scanning electron microscope, SEM, electronic scanning, microscope electronic scanning, Electron SEM, Scanning Electron Microscope, Electronic scanning, SEM gold, metal scanning electron microscope, electronic scanning x, electronic scanner, in vitro electronic scanning, Field Electron Scanning Microscope, scanning electron microscope, scanning electron microscope in, Scanning Electron Microscopy, electronic scan, Field Electron Scanning Electron Microscopy, electronic scanning equipment, Scanning Electron Microscopy.