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Scanning Electron Microscopy

Scanning Electron Microscopy, Total:21 items.

In the international standard classification, Scanning Electron Microscopy involves: Optical equipment, Education, Vocabularies, Analytical chemistry, Linear and angular measurements, Optics and optical measurements.

Professional Standard - Machinery, Scanning Electron Microscopy

• JB/T 6842-1993 Test method of scanning electron microscope

Korean Agency for Technology and Standards (KATS), Scanning Electron Microscopy

• KS I 0051-1999 General rules for scanning electron microscopy

Professional Standard - Education, Scanning Electron Microscopy

• JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
• JY/T 010-1996 General principles of analytical scanning electron microscopy

Professional Standard - Petroleum, Scanning Electron Microscopy

• SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
• SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
• SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

国家能源局, Scanning Electron Microscopy

• SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

International Organization for Standardization (ISO), Scanning Electron Microscopy

• ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Scanning Electron Microscopy

• GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
• GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles

SE-SIS, Scanning Electron Microscopy

• SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Scanning Electron Microscopy

• GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens

ES-UNE, Scanning Electron Microscopy

• UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

RU-GOST R, Scanning Electron Microscopy

• GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
• GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
• GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification

Shanghai Provincial Standard of the People's Republic of China, Scanning Electron Microscopy

• DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Association Francaise de Normalisation, Scanning Electron Microscopy

• XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
• XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image

British Standards Institution (BSI), Scanning Electron Microscopy

• BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM

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