ZH
RU
ES
electron diffraction plane
electron diffraction plane, Total:122 items.
In the international standard classification, electron diffraction plane involves: Analytical chemistry, Testing of metals, Vocabularies, Optical equipment, Optics and optical measurements, Linear and angular measurements, Protection against fire, Aerosol containers, Nuclear energy engineering, Printed circuits and boards, Internal combustion engines for road vehicles.
Association Francaise de Normalisation, electron diffraction plane
- NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
- NF S10-049*NF ISO 15368:2021 Optics and photonics - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- NF ISO 15368:2021 Optique et photonique - Mesurage du facteur de réflexion des surfaces planes et du facteur de transmission des éléments à plan parallèle
- NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
- NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- NF S10-048*NF ISO 19962:2019 Optics and photonics - Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
- NF ISO 19962:2019 Optique et photonique - Méthodes de mesure spectroscopique pour la diffusion intégrée par des éléments optiques à plans parallèles
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, electron diffraction plane
- GB/T 36165-2018 Determination of average grain size of metal.Electron backscatter diffraction (EBSD)method
- GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 30703-2014 Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
- GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
International Organization for Standardization (ISO), electron diffraction plane
- ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
- ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
- ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO/FDIS 10110-16 Optics and photonics — Preparation of drawings for optical elements and systems — Part 16: Diffractive surfaces
- ISO 10110-16:2023 Optics and photonics — Preparation of drawings for optical elements and systems — Part 16: Diffractive surfaces
- ISO 19962:2019 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
- ISO 23018:2022 Group-averaged neutron and gamma-ray cross sections for radiation protection and shielding calculations for nuclear reactors
- ISO 23703:2022 Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
German Institute for Standardization, electron diffraction plane
- DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
- DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
- DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
- DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
- DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN EN 14107:2003-10 Fat and oil derivatives - Fatty acid methylesters (FAME) - Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry; German version EN 14107:2003
British Standards Institution (BSI), electron diffraction plane
- BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- 19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- 20/30352222 DC BS ISO 15368. Optics and photonics. Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- BS ISO 15368:2021 Tracked Changes. Optics and photonics. Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 10110-16:2023 Optics and photonics. Preparation of drawings for optical elements and systems. Diffractive surfaces
- BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- 21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
- 23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
- BS ISO 19962:2019 Optics and photonics. Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
- 22/30430316 DC BS ISO 10110-16. Optics and photonics. Preparation of drawings for optical elements and systems - Part 16. Diffractive surfaces
- BS ISO 23703:2022 Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
- 21/30370212 DC BS ISO 23018. Group-averaged neutron and gamma-ray cross sections for radiation protection and shielding calculations for nuclear reactors
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- 21/30395106 DC BS ISO 23703. Microbeam analysis. Guideline for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS EN 123100:1992 Harmonized system of quality assessment for electronic components: Sectional specification: Single and double sided printed boards with plain holes
- BS CECC 23100-801:1998 Harmonized system of quality assessment for electronic components - Capability detail specification: single and double-sided printed boards with plain holes
United States Navy, electron diffraction plane
RU-GOST R, electron diffraction plane
- GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer
- GOST R ISO 13067-2016 State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- GOST R 8.697-2010 State system for ensuring the uniformity of measurements. Interpenar spacings in crystals. Method for measurement by means of a transmission electron microscope
Group Standards of the People's Republic of China, electron diffraction plane
- T/CASAS 014-2021 Measuring method for basal plane bending of SiC substrate — High resolution X-ray diffractometry
Professional Standard - Energy, electron diffraction plane
- NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method
工业和信息化部, electron diffraction plane
- YB/T 4677-2018 Determination of Texture in Steel Electron Backscattered Diffraction (EBSD) Method
Shanghai Provincial Standard of the People's Republic of China, electron diffraction plane
- DB31/T 1156-2019 Electron backscatter diffraction method for technical identification of electrical fire melt marks
国家市场监督管理总局、中国国家标准化管理委员会, electron diffraction plane
- GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
- GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
- GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
American Society for Testing and Materials (ASTM), electron diffraction plane
- ASTM E2627-13 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
- ASTM E2627-13(2019) Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
- ASTM E2627-10 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
- ASTM E2872-14 Standard Guide for Determining Cross-Section Averaged Characteristics of a Spray Using Laser-Diffraction Instruments in a Wind Tunnel Apparatus
- ASTM E2872-14(2019) Standard Guide for Determining Cross-Section Averaged Characteristics of a Spray Using Laser-Diffraction Instruments in a Wind Tunnel Apparatus
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, electron diffraction plane
- GB/T 34172-2017 Microbeam analysis—Electron backscatter diffraction—Phase analysis method of metal and alloy
American Nuclear Society (ANS), electron diffraction plane
- ANS 6.1.2-2013 Group-Averaged Neutron and Gamma-Ray Cross Sections for Radiation Protection and Shielding Calculations for Nuclear Power Plants
- ANS 6.1.2-1999 Neutron and Gamma-Ray Cross Sections for Nuclear Radiation Protection Calculations for Nuclear Power Plants
ANS - American Nuclear Society, electron diffraction plane
- 6.1.2-2013 Group-Averaged Neutron and Gamma-Ray Cross Sections for Radiation Protection and Shielding Calculations for Nuclear Power Plants
- 6.1.2-1999 Neutron and Gamma-Ray Cross Sections for Nuclear Radiation Protection Calculations for Nuclear Power Plants
- 6.1.2-1989 Neutron and Gamma-Ray Cross Sections for Nuclear Radiation Protection Calculations for Nuclear Power Plants
- 6.1.2-1983 NEUTRON AND GAMMA-RAY CROSS SECTIONS FOR NUCLEAR RADIATION PROTECTION CALCULATIONS FOR NUCLEAR POWER PLANTS
Professional Standard - Commodity Inspection, electron diffraction plane
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method
Military Standard of the People's Republic of China-General Armament Department, electron diffraction plane
- GJB 1446.3-1992 Ship system interface requirements electronic information radio frequency
- GJB 1446.3A-2021 Ship system interface requirements Part 3: Electronic information radio frequency
IX-IX-IEC, electron diffraction plane
- IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy
Japanese Industrial Standards Committee (JISC), electron diffraction plane
- JIS B 7081:2017 Optics and photonics -- Spectroscopic measurement methods for integrated scattering by plane optical elements
National Metrological Verification Regulations of the People's Republic of China, electron diffraction plane
- JJG(核工) 16-1991 Test method for measuring surface emissivity of α-plane source by grid ionization chamber standard device
American National Standards Institute （ANSI), electron diffraction plane
- ANSI/ANS 6.1.2-2013 Neutron and Gamma-Ray Cross Sections for Nuclear Radiation Protection and Shielding Calculations for Nuclear Power Plants
Defense Logistics Agency, electron diffraction plane
- DLA MIL-W-3970/22 A-2009 WAVEGUIDE ASSEMBLIES, RIGID, CAST, 90-DEGREE E-PLANE BEND, FULL CORRAL
- DLA MIL-DTL-83528/12 D-2013 GASKETING MATERIAL, CONDUCTIVE, SHIELDING GASKET, ELECTRONIC, ELASTOMER, ELECTRICAL, EMI/RFI, FLAT CIRCULAR WASHER
IT-UNI, electron diffraction plane
Korean Agency for Technology and Standards (KATS), electron diffraction plane
- KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS R 3045-2-1999(2004) Diesel engines－Mounting dimensions of fuel injection pumps－Part 2：Base-mounted in-line pumps
Society of Automotive Engineers (SAE), electron diffraction plane
- SAE ARINC840A-2019 ELECTRONIC FLIGHT BAG (EFB) APPLICATION CONTROL INTERFACE (ACI) FOR TABLET DEVICES
GOSTR, electron diffraction plane
- GOST R EN 14107-2009 Fat and oil derivatives. Fatty acid methylesters (FAME). Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry
AENOR, electron diffraction plane
- UNE-EN 14107:2003 Fat and oil derivatives. Fatty Acid Methyl Esters (FAME). Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry
未注明发布机构, electron diffraction plane
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
AT-ON, electron diffraction plane
- ONORM S 5271-1997 Planar scintigraphy and Single photon emission computed tomography - Constancy tests of functional Performance characteristics