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Spectrometer Diagram

Spectrometer Diagram, Total:491 items.

In the international standard classification, Spectrometer Diagram involves: Analytical chemistry, Optics and optical measurements, Space systems and operations, Fibre optic communications, Special measuring equipment for use in telecommunications, Geology. Meteorology. Hydrology, Vocabularies, Non-ferrous metals, Metalliferous minerals, Medical equipment, Metrology and measurement in general, Radiation measurements, Graphic technology, Computer graphics, Non-destructive testing, Rubber and plastics products, Testing of metals, Technical drawings, Products of the chemical industry, Optoelectronics. Laser equipment, Linear and angular measurements, Laboratory medicine, Water quality, Test conditions and procedures in general, Quality, Optical equipment, Thermodynamics and temperature measurements, Electronic components in general, Ferrous metals, Nuclear energy engineering, Paint ingredients, Organic chemicals, Astronomy. Geodesy. Geography, Welding, brazing and soldering, Power stations in general, Electricity. Magnetism. Electrical and magnetic measurements, Photography, Radiation protection, Particle size analysis. Sieving, Physics. Chemistry, Document imaging applications, Lamps and related equipment, Air quality, Surface treatment and coating, Petroleum products in general, Fuels, Ceramics, Lubricants, industrial oils and related products, Leather technology, Character sets and information coding.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Spectrometer Diagram

GB/T 21191-2007 Atomic fluorescence spectrometer
GB/T 42027-2022 Gas-phase molecular absorption spectrometer
GB/T 32266-2015 Method of performance testing for atomic fluorescence spectrometer
GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
GB/T 21186-2007 Fourier transform infrared spectrometer
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/T 33252-2016 Nanotechnology—Performance testing for laser confocal microscope Raman spectrometers
GB/Z 42358-2023 Determination of Accuracy of Wavelength Dispersive X-ray Fluorescence Spectrometer for Iron Ore
GB/T 42650-2023 Lossless and near-lossless compression of multispectral and hyperspectral images in spatial data and information transmission systems
GB/T 19437-2004 Graphic technology-Spectral measurement and colorimetric computation for graphic arts images
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales

Jilin Provincial Standard of the People's Republic of China, Spectrometer Diagram

DB22/T 2414-2015 Micro fiber optic spectrometer

National Metrological Verification Regulations of the People's Republic of China, Spectrometer Diagram

JJG 768-2005 Emission Spectrometer
JJG 1035-2022 Communication Spectrum Analyzer
JJG(教委) 02-1992 Laser Raman Spectrometer Verification Regulations
JJG 867-1994 Verification Regulation of Spectrocolorimeter
JJG 768-1994 Verification Regulation of Emission Spectrometer
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
JJG 1151-2018 Liquid Chromatograph-Atomic Fluorescence Spectrometers
JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
JJG 810-1993 Verification Regulation for Wavelength Dispersive X-Ray Fluorescence Spectrometers
JJG(地质) 1011-1990 Verification regulations for one-meter planar grating spectrograph
JJG(地质) 1012-1990 Verification rules for two-meter planar grating spectrograph
JJG(教委) 01-1992 Verification Regulations for Fourier Transform Infrared Spectrometer
JJG(地质) 1015-1990 Verification regulations for inductively coupled plasma direct reading spectrometer

Taiwan Provincial Standard of the People's Republic of China, Spectrometer Diagram

CNS 14341-1999 Optical spectrum analyzer

Professional Standard - Machinery, Spectrometer Diagram

JB/T 9322-1999 Spectrum projector
JB/T 5590-1991 Optical filter of optical spectrum instrument
JB/T 11145-2011 X-ray fluorescence spectrometer
JB/T 9320-1999 Plane-gratings spectrographs
JB/T 9331-1999 Slits for optical spectrum instruments
JB/T 5478-1991 Manual scanning photoelectric direct-reading spectrometer
JB/T 8231-1999 The basic parameters of the plane-gratings spectrographs
JB/T 6176-1992 Basic parameter of photographic plate cassette and cassette frame for spectrograph

U.S. Air Force, Spectrometer Diagram

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

Group Standards of the People's Republic of China, Spectrometer Diagram

T/ZZB 0673-2018 Emission spectrometer
T/QGCML 1522-2023 FLA Micro Fiber Spectrometer
T/CAIA YQ004-2018 Performance testing method for liquid chromatograph coupled with atomic fluorescence spectrometer
T/SHDSGY 031-2023 Technical specification for high-resolution spectrometer
T/CSTM 00445-2021 Calibration specification for glow discharge mass spectrometry
T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
T/CSTM 00159-2020 Calibration methods of portable Raman spectroscopy
T/CAIA YQ003-2016 Testing Methods for Optical/Electrical Characteristics of Linear Charge Coupled Imaging Device for Spectrometer
T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
T/CAQI 108-2020 Specification for verification and evaluation of portable Raman spectrometer
T/CIS 17006-2022 General technical specification of Fourier transform near-infrared spectrometer
T/CSTM 00962-2022 Evaluation method for spectrometer performance of spark discharge atomic emission

Consultative Committee for Space Data Systems (CCSDS), Spectrometer Diagram

CCSDS 123.0-B-1-2012 Lossles multispectral and hyperspectral image compression
CCSDS 123.0-B-2 Technical Corrigendum 3-2021 Low-Complexity Lossless and Near-Lossless Multispectral and Hyperspectral Image Compression; Technical Corrigendum 3

Korean Agency for Technology and Standards (KATS), Spectrometer Diagram

KS C 1802-1986 Photic stimulators for electroencephalographs
KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS X ISO 13655-2006(2016) Graphic technology－Spectral measurement and colorimetric computation for graphic arts images
KS X ISO 13655:2021 Graphic technology — Spectral measurement and colorimetric computation for graphic arts images
KS X ISO 13655-2006(2021) Graphic technology－Spectral measurement and colorimetric computation for graphic arts images
KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
KS B ISO 8599:2004 Optics and optical instruments-Contact lenses-Determination of the spectral and luminous transmittance
KS B ISO 8599:2014 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
KS B ISO 8599-2014(2019) Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
KS A ISO 9959-2:2013 Numerically controlled draughting machines-Draughting test for evaluation of performance-Part 2:Monochrome raster plotters
KS A ISO 9959-2-2003(2008) Numerically controlled draughting machines－Draughting test for evaluation of performance－Part 2：Monochrome raster plotters
KS M ISO 6286:2010 Molecular absorption spectrometry-Vocabulary-General-Apparatus
KS M ISO 6286-2010(2020) Molecular absorption spectrometry－Vocabulary－General－Apparatus
KS D 1683-2004 Method for emission spectrochemical analysis of silver ingot
KS X ISO 13655:2006 Graphic technology-Spectral measurement and colorimetric computation for graphic arts images
KS D ISO 10701:2002 Steel and iron－Determination of sulfur content－Methylene blue spectrophotometric method
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS B ISO 10110-1:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 1：General
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS B ISO 10110-6:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 6：Centering tolerances
KS B ISO 10110-11:2013 Optics and optical instruments ― Preparation of drawings for optical elements and systems ― Part 11: Non-toleranced data
KS B ISO 10110-12:2008 Optics and optical instruments-Preparation of drawings for optical elements and systems-Part 12:Aspheric surfaces
KS B ISO 10110-12:2013 Optics and optical instruments ― Preparation of drawings for optical elements and systems ― Part 12: Aspheric surfaces
KS B ISO 10110-11:2008 Optics and optical instruments-Preparation of drawings for optical elements and systems-Part 11:Non-toleranced data
KS B ISO 13653-2006(2021) Optics and optical instruments — General optical test methods —Measurement of relative irradiance in the image field
KS B ISO 10110-8:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 8：Surface texture
KS B ISO 10110-6:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 6：Centering tolerances
KS B ISO 13653-2006(2016) Optics and optical instruments — General optical test methods —Measurement of relative irradiance in the image field
KS B ISO 10110-6-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 6：Centering tolerances
KS B ISO 10110-8-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 8：Surface texture
KS B ISO 10110-17:2006 Optics and photonics－Preparation of drawings for optical elements and systems－Part 17：Laser irradiation damage threshold
KS B ISO 10110-5:2013 Optics and optical instruments ― Preparation of drawings for optical elements and systems ― Part 5: Surface form tolerances
KS B ISO 10110-7:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS B ISO 10110-5:2008 Optics and optical instruments-Preparation of drawings for optical elements and systems-Part 5:Surface form tolerances
KS C IEC 61290-5-1-2007(2022) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-5-1-2007(2017) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS B ISO 10110-9:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS B ISO 10110-14:2010 Optics and photonics-Preparation of drawings for optical elements and systems-Part 14:Wavefront deformation tolerance
KS B ISO 10110-7:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS B ISO 10110-7-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS A ISO 5-3-2011(2016) Photography and graphic technology－Density measurements－Part 3：Spectral conditions
KS A ISO 5-3-2011(2021) Photography and graphic technology－Density measurements－Part 3：Spectral conditions
KS B ISO 10110-9-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS B ISO 10110-9:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS C IEC 61452-2017(2022) Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
KS C IEC 61290-3-1-2005(2020) Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS E ISO 15247:2012 Zinc sulfide concentrates-Determination of silver content-Acid dissolution and flame atomic absorption spectrometric method
KS D ISO 3497-2002(2017) Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
KS C IEC 61290-3-1:2005 Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS C IEC 61290-10-1-2005(2020) Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS B ISO 10110-10:2008 Optics and optical instruments-Preparation of drawings for optical elements and systems-Part 10:Table representing data of a lens element
KS B ISO 10110-10:2013 Optics and optical instruments ― Preparation of drawings for optical elements and systems ― Part 10: Table representing data of a lens element
KS B ISO 10110-2-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence
KS B ISO 10110-2:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence
KS C IEC 61290-3-2:2005 Optical amplifiers－Part 3－2：Test methods for noise figure parameters－Electrical spectrum analyzer method
KS P ISO 9913-1-2014(2019) Optics and optical instruments — Contact lenses — Part 1: Determination of oxygen permeability and transmissibility with the polarographic method
KS B ISO 10110-2:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence
KS B ISO 10110-3:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 3：Material imperfections－Bubbles and inclusions
KS B ISO 10110-3-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 3：Material imperfections－Bubbles and inclusions
KS B ISO 10110-3:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 3：Material imperfections－Bubbles and inclusions
KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
KS C IEC 61290-10-2-2005(2020) Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS B ISO 10110-8:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 8：Surface texture
KS B ISO 10110-4-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 4：Material imperfections－Inhomogeneity and striae
KS B ISO 10110-4:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 4：Material imperfections－Inhomogeneity and striae
KS B ISO 10110-4:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 4：Material imperfections－Inhomogeneity and striae

European Committee for Standardization (CEN), Spectrometer Diagram

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers
EN ISO 8599:1996 Optics and Optical Instruments - Contact Lenses - Determination of the Spectral and Luminous Transmittance ISO 8599 : 1994
prEN ISO 7921 Ophthalmic optics and instruments - Near reading charts (ISO/DIS 7921:2023)

Association Francaise de Normalisation, Spectrometer Diagram

NF C93-845:2006 Calibration of optical spectrum analyzers.
NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF S11-687:1997 Optics and optical instruments. Contact lenses. Determination of the spectral and luminous transmittance.
NF S10-008-10:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 10 : table representing data of a lens element.
NF S10-008-1:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 1 : general.
NF S10-008-6:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 6 : centring tolerances.
NF S10-008-11:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 11 : non-toleranced data.
NF S10-008-7:2008 Optics and photonics - Preparation of drawings for optical elements and systems - Part 7 : surface imperfection tolerances.
NF S10-008-5:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 5 : surface form tolerances.
NF S10-008-7:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 7 : surface imperfection tolerances.
NF M60-827:2014 Water quality - Uranium isotopes - Test method using alpha-spectrometry
NF S10-008-9:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 9 : surface treatment and coating.
NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
NF EN 61290-5-1:2006 Amplificateurs optiques - Méthodes d'essais - Partie 5-1 : paramètres de réflectance - Méthode d'analyseur de spectre optique
NF C43-890-1*NF EN 62471-5:2015 Photobiological safety of lamps and lamp systems - Part 5 : image projectors
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
NF EN 61290-3-1:2004 Amplificateurs optiques - Méthodes d'essai - Partie 3-1 : paramètres du facteur de bruit - Méthode d'analyseur du spectre optique
NF C74-224*NF EN 61262-4:1994 Medical electrical equipment. Characteristics of electro-optical X-ray image intensifiers. Part 4 : determination of the image distorsion.
NF S10-008-3:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 3 : material imperfections. Bubbles and inclusions.
NF C93-805-3-2*NF EN 61290-3-2:2009 Optical amplifiers - Test methods - Part 3-2 : noise figure parameters - Electrical spectrum analyzer method
NF EN 62471-5:2015 Sécurité photobiologique des lampes et des appareils utilisant des lampes - Partie 5 : projecteurs d'images
NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
NF EN IEC 61290-1-1:2020 Amplificateurs optiques - Méthodes d'essai - Partie 1-1 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre optique
NF S10-008-2:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 2 : material imperfections. Stress birefringence.
NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
NF C93-845-2*NF EN 62150-2:2011 Fibre optic active components and devices - Test and measurement procedures - Part 2 : ATM-PON transceivers.
NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.

British Standards Institution (BSI), Spectrometer Diagram

BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 13655:2017 Graphic technology. Spectral measurement and colorimetric computation for graphic arts images
BS ISO 18381:2013 Space data and information transfer systems. Lossless multispectral and hyperspectral image compression
20/30391483 DC BS ISO 24121. Space data and information transfer systems. Spectral preprocessing transform for multispectral and hyperspectral image compression
BS ISO 10110-17:2004 Optics and optical instruments - Preparation of drawings for optical elements and systems - Laser irradiation damage threshold
BS ISO 10110-8:1998 Optics and optical instruments - Preparation of drawings for optical elements and systems - Surface texture
BS ISO 10110-8:2010 Optics and photonics. Preparation of drawings for optical elements and systems. Surface texture; roughness and waviness
BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
BS EN 62471-5:2015 Photobiological safety of lamps and lamp systems - Image projectors
BS ISO 10110-11:1996 Optics and photonics - Preparation of drawings for optical elements and systems - Non-toleranced data
BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
BS ISO 10110-13:1998 Optics and optical instruments. Preparation of drawings for optical elements and systems. Laser irradiation damage threshold
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
BS ISO 10110-6:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Centring tolerances
BS ISO 15795:2002 Optics and photonics - Quality evaluation of optical systems - Assessing the image quality degradation due to chromatic aberrations
BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
BS ISO 13166:2014 Water quality. Uranium isotopes. Test method using alpha-spectrometry
BS ISO 10110-9:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Surface treatment and coating
BS ISO 11698-2:2000 Micrographics. Methods of measuring image quality produced by aperture card scanners - Quality criteria and control
BS ISO 13655:2010 Graphic technology. Spectral measurement and colorimetric computation for graphic arts images
BS ISO 13655:2009 Graphic technology - Spectral measurement and colorimetric computation for graphic arts images
18/30382086 DC BS EN 61452. Nuclear instrumentation. Measurement of gamma-ray emission rates of radionuclides. Calibration and use of germanium spectrometers
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS EN ISO 20884:2011 Petroleum products. Determination of sulfur content of automotive fuels. Wavelength-dispersive X-ray fluorescence spectrometry
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
20/30412413 DC BS EN IEC 61452. Nuclear instrumentation. Measurement of gamma-ray emission rates of radionuclides. Calibration and use of germanium spectrometers
BS ISO 10110-2:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Material imperfections - Stress birefringence
BS ISO 10110-3:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Material imperfections - Bubbles and inclusions
BS ISO 19618:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
BS ISO/IEC 19794-3:2006 Information technology - Biometric data interchange formats - Finger pattern spectral data
BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
BS ISO 10110-4:1997 Optics and optical instruments - Preparation of drawings for optical elements and systems - Material imperfections - Inhomogeneity and striae
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method

CZ-CSN, Spectrometer Diagram

CSN 99 7101-1990 System EAN. Bar Code UCC/EAN 128. Application Identifiers
CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
CSN 75 7554-1998 Water quality - Determination of selected polynuclear aromatic hydrocarbons (PAH) - HPLC (FLD) and GC (MSD) methods

International Electrotechnical Commission (IEC), Spectrometer Diagram

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers
IEC 61976:2000 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe nuclear gamma-ray spectrometry
IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC 61239:1993 Nuclear instrumentation; portable gamma radiation meters and spectrometers used for prospecting; definitions, requirements and calibration
IEC 61455:1995 Nuclear instrumentation - MCA histogram data interchange format for nuclear spectroscopy
IEC TR3 61276:1994 Nuclear instrumentation - Guidelines for selection of metrologically supported nuclear radiation spectrometry systems
IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer

Danish Standards Foundation, Spectrometer Diagram

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
DS/EN 15483:2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer

IN-BIS, Spectrometer Diagram

Japanese Industrial Standards Committee (JISC), Spectrometer Diagram

JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS T 1213:1984 Photic stimulators for electroencephalographs
JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
JIS H 1632-3:2014 Titanium.ICP atomic emission spectrometry.Part 3: Determination of boron
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

中国气象局, Spectrometer Diagram

QX/T 532-2019 Brewer spectrometer calibration specifications
QX/T 565-2020 Laser drop spectrum precipitation phenomenon meter

RU-GOST R, Spectrometer Diagram

GOST 27176-1986 Spectroscopic optical instruments. Terms and definitions
GOST 12550.2-1982 Palladium-iridium alloys. Methods of spectrografic analysis
GOST 12559.2-1982 Rlatinum-iridium alloys. Methods of spectrografic analysis
GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
GOST 14828-1969 Instruments for physical-chemical quantities measurement. Radiospectrometers. Terms
GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices
GOST 8.197-2013 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring of the spectral radiance, spectral radiant power, spectral irradiance, spectral radiant intensity, power and radiant intensity in spectral range
GOST 17173-1981 Spectral slits and attachments to them. Types, basic parameters and dimensions. Technical requirements
GOST 26874-1986 Ionizing radiation power spectrometers. Methods of basic parameters measurement
GOST R EN ISO 14596-2008 Petroleum products. Determination of sulfur content by method of wavelength-dispersive X-ray fluorescence spectrometry

RO-ASRO, Spectrometer Diagram

STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry
STAS 11564-1982 RAPID STEELS FOR TOOLS Spectrographic analysis in emission
STAS 11607-1981 LOW AND MEDIUM ALLOYED CARBON STEELS Spectrographic analysis

Professional Standard - Ocean, Spectrometer Diagram

HY/T 175-2014 Optical suspended sediment particle size analyzer
HY/T 125-2009 Test method of ocean color spectrograph

National Metrological Technical Specifications of the People's Republic of China, Spectrometer Diagram

JJF 1544-2015 Calibration Specification for Raman Spectrometers
JJF 1329-2011 Calibration Specification for Instantaneous Spectral Instruments
JJF 1601-2016 Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement
JJF 2024-2023
JJF 1603-2016 Calibration Specification for (0.1~2.5) THz Terahertz Spectrometers
JJF 1818-2020 Calibration Specification for Calibration Device of Raman Spectrometers
JJF 1319-2011 Calibration Specification for Fourier Transform Infrared Spectrometers
JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
JJF 1929-2021 Calibration Specification for Rotating Disc Electrode Atomic Emission Spectrometers
JJF 1953-2021 Calibration Specification for Gas Chromatographs with Sulfur Chemiluminescence Detector

Military Standard of the People's Republic of China-General Armament Department, Spectrometer Diagram

GJB 8472-2015 Verification regulation for field spectrometer
GJB 9726-2020 Specifications for spaceborne hyperspectral imagers
GJB 4531-2002 Monitor chemical standard infrared spectrum
GJB 8662-2015 Calibration procedures for Fourier transform infrared spectrometers
GJB 4293-2001 Specification for universal automatic interpretation of ballistic photometric image information

国家市场监督管理总局、中国国家标准化管理委员会, Spectrometer Diagram

GB/T 40219-2021 General specification for Raman spectrometers
GB/T 41211-2021 General specifications for moon and planetary in-situ spectral detection instrument

American Society for Testing and Materials (ASTM), Spectrometer Diagram

ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
ASTM E1507-98 Standard Guide for Describing and Specifying the Spectrometer of an Optical Emission Direct-Reading Instrument
ASTM E388-04(2015) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
ASTM E3029-15(2023) Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E356-78(1996) Practices for Describing and Specifying the Spectrograph
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E3029-15 Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
ASTM E1866-97(2007) Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1866-97(2002) Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1866-97 Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E958-13 Standard Practice for Estimation of the Spectral Bandwidth of Ultraviolet-Visible Spectrophotometers
ASTM E2529-06(2022) Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM E2529-06e1 Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM E1770-95 Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
ASTM E1770-95(2006) Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
ASTM E2911-23 Standard Guide for Relative Intensity Correction of Raman Spectrometers
ASTM E2911-13 Standard Guide for Relative Intensity Correction of Raman Spectrometers
ASTM D5381-93(2014) Standard Guide for X-Ray Fluorescence 40;XRF41; Spectroscopy of Pigments and Extenders
ASTM E2529-06 Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM E2529-06(2014) Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM E1840-96(2022) Standard Guide for Raman Shift Standards for Spectrometer Calibration
ASTM E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1016-07(2020) Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
ASTM E932-89(2002) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E932-89(1997) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E1840-96(2002) Standard Guide for Raman Shift Standards for Spectrometer Calibration
ASTM E932-89(2021) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E932-89(2013) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E1770-14 Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
ASTM E1260-95 Standard Test Method for Determining Liquid Drop Size Characteristics in a Spray Using Optical Nonimaging Light-Scattering Instruments
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1812-96 Standard Practice for Optimization of Flame Atomic Absorption Spectrometric Equipment
ASTM E1329-00 Standard Practice for Verification and Use of Control Charts in Spectrochemical Analysis
ASTM E1329-00(2005) Standard Practice for Verification and Use of Control Charts in Spectrochemical Analysis
ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
ASTM G138-96 Standard Test Method for Calibration of a Spectroradiometer Using a Standard Source of Irradiance
ASTM E1260-03 Standard Test Method for Determining Liquid Drop Size Characteristics in a Spray Using Optical Nonimaging Light-Scattering Instruments
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1009-95(2000) Standard Practice for Evaluating an Optical Emission Vacuum Spectrometer to Analyze Carbon and Low-Alloy Steel
ASTM D6122-21 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20a Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-20 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM D6122-22 Standard Practice for Validation of the Performance of Multivariate Online, At-Line, Field and Laboratory Infrared Spectrophotometer, and Raman Spectrometer Based Analyzer Systems
ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
ASTM E932-89(2007) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
ASTM E1770-19 Standard Practice for Optimization of Instrumentation for Graphite Furnace Atomic Absorption Spectrometry
ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer

International Organization for Standardization (ISO), Spectrometer Diagram

ISO/FDIS 7921:2011 Ophthalmic optics and instruments — Near reading charts
ISO 8599:1994 Optics and optical instruments - Contact lenses - Determination of the spectral and luminous transmittance
ISO 18381:2013 Space data and information transfer systems - Lossless multispectral and hyperspectral image compression
ISO 6286:1982 Molecular absorption spectrometry; Vocabulary; General; Apparatus
ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 10110-1:2006 Optics and photonics - Preparation of drawings for optical elements and systems - Part 1: General
ISO 10110-1:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 1: General
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 10110-6:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 6: Centring tolerances
ISO 10110-17:2004 Optics and photonics - Preparation of drawings for optical elements and systems - Part 17: Laser irradiation damage threshold
ISO 10110-11:1996 Optics and photonics - Preparation of drawings for optical elements and systems - Part 11: Non-toleranced data
ISO 13655:1996 Graphic technology - Spectral measurement and colorimetric computation for graphic arts images
ISO 10110-7:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 7: Surface imperfection tolerances
ISO 10110-5:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 5: Surface form tolerances
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 10110-14:2003 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 14: Wavefront deformation tolerance
ISO 10110-9:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 9: Surface treatment and coating
ISO 10110-7:2017 Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 7: Surface imperfection tolerances
ISO 13166:2014 Water quality - Uranium isotopes - Test method using alpha-spectrometry
ISO 10110-10:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 10: Table representing data of a lens element
ISO 21501-1:2009 Determination of particle size distribution - Single particle light interaction methods - Part 1: Light scattering aerosol spectrometer
ISO/TS 10867:2010 Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
ISO 13655:2009 Graphic technology - Spectral measurement and colorimetric computation for graphic arts images
ISO 13655:2017 Graphic technology - Spectral measurement and colorimetric computation for graphic arts images
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 10110-10:2004 Optics and photonics - Preparation of drawings for optical elements and systems - Part 10: Table representing data of optical elements and cemented assemblies
ISO 10110-6:1996/Cor 1:1999 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 6: Centring tolerances; Technical Corrigendum 1
ISO 19618:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 10110-11:1996/cor 1:2006 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 11: Non-toleranced data; Technical Corrigendum 1
ISO 10110-2:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 2: Material imperfections - Stress birefringence
ISO 10110-3:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 3: Material imperfections - Bubbles and inclusions
ISO 10110-8:2010 Optics and photonics - Preparation of drawings for optical elements and systems - Part 8: Surface texture; roughness and waviness
ISO 10110-5:1996/Cor 1:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 5: Surface form tolerances; Technical Corrigendum 1

ZA-SANS, Spectrometer Diagram

SANS 62129:2008 Calibration of optical spectrum analyzers
SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method

GM Daewoo, Spectrometer Diagram

GMKOREA EDS-T-7826-2006 FTIR ? ??? ????,???? ???? ????

Professional Standard - Meteorology, Spectrometer Diagram

QX/T 159-2012 Specification for atmospheric spectrum measurement by ground-based high spectral resolution Fourier transform spectroscopy
QX/T 172-2012 Observation method of total column ozone with Brewer spectrophotometer
QX/T 206-2013 Calculation Method of Performance Index of Satellite Low Spectral Resolution Infrared Instrument

Lithuanian Standards Office , Spectrometer Diagram

LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 15483-2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)

Professional Standard - Military and Civilian Products, Spectrometer Diagram

WJ 2300-1995 Verification Regulations for Plane Grating Spectrograph
WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

German Institute for Standardization, Spectrometer Diagram

DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
DIN 51866-1:2000 Temperature measurement - Part 1: Survey of laser spectroscopic methods
DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
DIN ISO 10110-6:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 6: Centring tolerances (ISO 10110-6:1996)
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 9358:2021 Optics and optical instruments - Veiling glare of image-forming systems - Definitions and methods of measurement (ISO 9358:1994)
DIN ISO 9358:2020 Optics and optical instruments - Veiling glare of image forming systems - Definitions and methods of measurement (ISO 9358:1994); Text in German and English
DIN ISO 10110-11:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 11: Non-toleranced data (ISO 10110-11:1996)
DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
DIN IEC 62484:2014 Radiation protection instrumentation - Spectroscopy-based portal monitors used for the detection and identification of illicit trafficking of radioactive material (IEC 62484:2010)
DIN ISO 10110-9:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 9: Surface treatment and coating (ISO 10110-9:1996)
DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
DIN 51008-2:2001-12 Optical Emission Spectrometry (OES) - Part 2: Terms for flame and plasma systems
DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN ISO 10110-2:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 2: Material imperfections; stress birefringence (ISO 10110-2:1996)
DIN ISO 10110-3:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 3: Material imperfections; bubbles and inclusions (ISO 10110-3:1996)
DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
DIN EN 15483:2009-02 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy; German version EN 15483:2008
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15795:2006 Optics and optical instruments - Quality evaluation of optical systems - Assessing the image quality degradation due to chromatic aberrations (ISO 15795:2002);English version of DIN ISO 15795-2006-03
DIN ISO 10110-4:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 4: Material imperfections; inhomogenity and striae (ISO 10110-4:1997)

Professional Standard - Agriculture, Spectrometer Diagram

JJG(教委) 023-1996 Verification Regulations for Atomic Absorption Spectrometer
JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
JJG(教委) 022-1996 Verification Regulations for Ultraviolet and Visible Absorption Spectrometers
JJG(教委) 001-1996 Verification Regulations for Fourier Transform Infrared Spectrometer
JJG(教委) 015-1996 Verification Regulations for Inductively Coupled Plasma Atomic Emission Spectrometer

American National Standards Institute （ANSI), Spectrometer Diagram

ANSI CGATS.5-2009 Graphic technology - Spectral measurement and colorimetric computation for graphic arts images
ANSI/OEOSC OP1.0110-1-2011 Optics and Electro-Optical Instruments - Preparation of drawings for optical elements and systems - Part 1: General
ANSI/ASTM D6645:2001 Test Methods for Methyl (Comonomer) Content in Polyethylene by Infrared Spectrophotometry
ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer

KR-KS, Spectrometer Diagram

KS X ISO 13655-2021 Graphic technology — Spectral measurement and colorimetric computation for graphic arts images
KS D ISO 14707-2003(2023)
KS B ISO 9358-2023 Optics and optical instruments — Veiling glare of image forming systems — Definitions and methods of measurement
KS B ISO 10110-6-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 6：Centering tolerances
KS B ISO 10110-8-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 8：Surface texture
KS B ISO 10110-7-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS B ISO 10110-9-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS B ISO 15795-2023 Optics and optical instruments — Quality evaluation of optical systems — Assessing the image quality degradation due to chromatic aberrations
KS C IEC 61452-2017 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
KS B ISO 10110-2-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence
KS B ISO 10110-3-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 3：Material imperfections－Bubbles and inclusions
KS B ISO 10110-4-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 4：Material imperfections－Inhomogeneity and striae
KS D ISO 15472-2003(2023)

European Committee for Electrotechnical Standardization（CENELEC）, Spectrometer Diagram

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)
EN 62471-5:2015 Photobiological safety of lamps and lamp systems - Part 5: Image projectors
EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer

ES-UNE, Spectrometer Diagram

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
UNE-EN 62471-5:2016 Photobiological safety of lamps and lamp systems - Part 5: Image projectors
UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)

工业和信息化部/国家能源局, Spectrometer Diagram

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques

Hainan Provincial Standard of the People's Republic of China, Spectrometer Diagram

DB46/T 519-2020 Rapid Detection Method of Infrared Spectroscopy/Raman Spectroscopy Fingerprint of Fully Biodegradable Plastic Products

Professional Standard - Aviation, Spectrometer Diagram

HB/Z 359-2005 Reference photographs of indication for fluorescent penetrant testing
HB 5490-1991 Standard Spectrum Atlas of Infrared Spectrum of Aeronautical Non-metallic Materials Commodities

IEC - International Electrotechnical Commission, Spectrometer Diagram

PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

Standard Association of Australia （SAA）, Spectrometer Diagram

AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO/IEC 19794.3:2007 Information technology - Biometric data interchange formats - Finger pattern spectral data

未注明发布机构, Spectrometer Diagram

BS EN ISO 8599:1997 Optics and optical instruments — Contact lenses — Determination ofthe spectral and luminous transmittance
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS IEC 61428:1998(1999) Nuclear instrumentation — Sample containers for gamma - ray spectrometry with Ge - detectors
BS ISO 10110-13:1997(1999) Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 13 : Laser irradiation damage threshold
BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
BS ISO 10110-2:1996(1999) Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 2 : Material imperfections — Stress birefringence
DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
BS ISO 10110-3:1996(1999) Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 3 : Material imperfections — Bubbles and inclusions
BS ISO 10110-4:1997(2000) Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 4 : Material imperfections — Inhomogeneity and striae

Heilongjiang Provincial Standard of the People's Republic of China, Spectrometer Diagram

DB23/T 1530-2013 Spectrum calibrator for food safety rapid testing equipment

国家药监局, Spectrometer Diagram

YY/T 1740.2-2021 Medical Mass Spectrometry Part 2: Matrix-Assisted Laser Desorption Ionization Time-of-Flight Mass Spectrometry

International Commission on Illumination (CIE), Spectrometer Diagram

CIE 170-2-2015 Fundamental Chromaticity Diagram with Physiological Axes - Part 2: Spectral Luminous Efficiency Functions and Chromaticity Diagrams
CIE 214-2014 Effect of Instrumental Bandpass Function and Measurement Interval on Spectral Quantities

Professional Standard - Medicine, Spectrometer Diagram

YY 91060-1999 Vocabulary of biochemical instruments.UV-VIS spectrophotometry

Indonesia Standards, Spectrometer Diagram

SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers
SNI 12-7181-2006 Test methods of total chromium content in leather by atomic absorption spectrophotometers (AAS)

SE-SIS, Spectrometer Diagram

SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

Professional Standard - Electron, Spectrometer Diagram

SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

Shanxi Provincial Standard of the People's Republic of China, Spectrometer Diagram

DB14/T 1435-2017 Data preprocessing of ground laser raindrop spectrometer detection
DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy

ESDU - Engineering Sciences Data Unit, Spectrometer Diagram

ESDU 17009-2018 A Practical Guide to Turbulence and Flow Measurement by Thermal Anemometry (CTA)@ Laser-Doppler Anemometry (LDA) and Particle-Image Velocimetry (PIV) Part 4: Particle-Image Velocimetry
ESDU 17008-2018 A Practical Guide to Turbulence and Flow Measurement by Thermal Anemometry (CTA)@ Laser-Doppler Anemometry (LDA) and Particle-Image Velocimetry (PIV) Part 3: Laser-Doppler Anemometry
ESDU 16002-2018 A Practical Guide to Turbulence and Flow Measurement by Thermal Anemometry (CTA)@ Laser-Doppler Anemometry (LDA) and Particle-Image Velocimetry (PIV) Part 2: Constant-Temperature Anemometry

Fujian Provincial Standard of the People's Republic of China, Spectrometer Diagram

JJF（闽）1085-2018 Calibration Specification for Portable Raman spectrum fast detection instruments
DB35/T 1564-2016 Technical Requirements for Portable Rapid Raman Spectroscopy Detector

GB-REG, Spectrometer Diagram

REG NASA-LLIS-0903-2000 Lessons Learned ?High Energy Spectroscopic Imager Test Mishap
REG NASA-LLIS-0480-1996 Lessons Learned - Landsat Program, Multispectral Scanner (MSS), Technology Development

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Spectrometer Diagram

IPC TM-650 2.2.14.2-1995 Solder Powder Particle Size Distribution - Optical Image Analyzer Method

Professional Standard - Electricity, Spectrometer Diagram

DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer

(U.S.) Ford Automotive Standards, Spectrometer Diagram

FORD WSS-M1H1161-A1-2014 FABRIC, SPECTRAL PATTERN, JACQUARD WOVEN, UNLAMINATED ***TO BE USED WITH FORD WSS-M99P1111-A***

CENELEC - European Committee for Electrotechnical Standardization, Spectrometer Diagram

EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer

AENOR, Spectrometer Diagram

UNE-EN 15483:2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy

工业和信息化部, Spectrometer Diagram

YB/T 4997-2022 Rules for the use of calibration and quality control charts in spectrochemical analysis

BE-NBN, Spectrometer Diagram

NBN EN 1138-1995 Fruit and vegetable juices - Enzymatic determination of L-malic acid (L-malate) content - NADH spectrometric method

Professional Standard - Energy, Spectrometer Diagram

NB/SH/T 0940-2016 Test method for the analysis of in-use lubricants using a specific 4-in-1 tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity and Laser Particle Counter)

国家能源局, Spectrometer Diagram

SH/T 0940-2016 Test methods for analyzing in-service lubricants using specific four-in-one testers (atomic emission spectrometry, infrared spectroscopy, viscosity and laser particle counter)

Institute of Electrical and Electronics Engineers (IEEE), Spectrometer Diagram

IEEE Std 1214-1992 IEEE Standard Multichannel Analyzer (MCA) Histogram Data Interchange Format for Nuclear Spectroscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Spectrometer Diagram

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