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photoelectron spectroscopy xps
photoelectron spectroscopy xps, Total:8 items.
In the international standard classification, photoelectron spectroscopy xps involves: Analytical chemistry.
Association Francaise de Normalisation, photoelectron spectroscopy xps
- NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, photoelectron spectroscopy xps
- GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）
RU-GOST R, photoelectron spectroscopy xps
- GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
International Organization for Standardization (ISO), photoelectron spectroscopy xps
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
British Standards Institution (BSI), photoelectron spectroscopy xps
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS