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xps photoelectron spectroscopy
xps photoelectron spectroscopy, Total:9 items.
In the international standard classification, xps photoelectron spectroscopy involves: Analytical chemistry.
Association Francaise de Normalisation, xps photoelectron spectroscopy
- NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
British Standards Institution (BSI), xps photoelectron spectroscopy
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
International Organization for Standardization (ISO), xps photoelectron spectroscopy
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, xps photoelectron spectroscopy
- GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）
RU-GOST R, xps photoelectron spectroscopy
- GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
American Society for Testing and Materials (ASTM), xps photoelectron spectroscopy
- ASTM E2735-13 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments