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x ray molecule
x ray molecule, Total:58 items.
In the international standard classification, x ray molecule involves: Analytical chemistry, Non-destructive testing, Optics and optical measurements, Nuclear energy engineering, Medical equipment, Education, Linear and angular measurements.
Korean Agency for Technology and Standards (KATS), x ray molecule
Japanese Industrial Standards Committee (JISC), x ray molecule
- JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
British Standards Institution (BSI), x ray molecule
- BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
International Organization for Standardization (ISO), x ray molecule
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
- ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x ray molecule
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
Association Francaise de Normalisation, x ray molecule
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
- NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
American Society for Testing and Materials (ASTM), x ray molecule
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E2108-10 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E2108-00 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E2108-05 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
国家市场监督管理总局、中国国家标准化管理委员会, x ray molecule
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
Professional Standard - Nuclear Industry, x ray molecule
- EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
Professional Standard - Medicine, x ray molecule
German Institute for Standardization, x ray molecule
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, x ray molecule
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
Standard Association of Australia （SAA）, x ray molecule
- AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
KR-KS, x ray molecule
Professional Standard - Education, x ray molecule
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
IN-BIS, x ray molecule
未注明发布机构, x ray molecule
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale