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x-ray molecular spectroscopy

x-ray molecular spectroscopy, Total:48 items.

In the international standard classification, x-ray molecular spectroscopy involves: Non-destructive testing, Analytical chemistry, Optics and optical measurements, Medical equipment, Surface treatment and coating, Corrosion of metals, Linear and angular measurements.

American Society for Testing and Materials (ASTM), x-ray molecular spectroscopy

ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

International Organization for Standardization (ISO), x-ray molecular spectroscopy

ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray molecular spectroscopy

GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale

British Standards Institution (BSI), x-ray molecular spectroscopy

BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale

Association Francaise de Normalisation, x-ray molecular spectroscopy

NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)

国家市场监督管理总局、中国国家标准化管理委员会, x-ray molecular spectroscopy

GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

Korean Agency for Technology and Standards (KATS), x-ray molecular spectroscopy

KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale

Japanese Industrial Standards Committee (JISC), x-ray molecular spectroscopy

JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS T 0306:2002 Analysis of state for passive film formed on metallic biomaterials by X-ray photoelectron spectroscopy

Standard Association of Australia （SAA）, x-ray molecular spectroscopy

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

German Institute for Standardization, x-ray molecular spectroscopy

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, x-ray molecular spectroscopy

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales

KR-KS, x-ray molecular spectroscopy

KS D ISO 15472-2003(2023)

未注明发布机构, x-ray molecular spectroscopy

BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale