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Semiconductor Instruments

Semiconductor Instruments, Total:500 items.

In the international standard classification, Semiconductor Instruments involves: Semiconductor devices, Medical equipment, Analytical chemistry, Optoelectronics. Laser equipment, Nuclear energy engineering, Electricity. Magnetism. Electrical and magnetic measurements, Quality, Integrated circuits. Microelectronics, Kitchen equipment, Thermodynamics and temperature measurements, Rectifiers. Convertors. Stabilized power supply, Measurement of force, weight and pressure, Graphical symbols, Audio, video and audiovisual engineering, Products of non-ferrous metals, Vocabularies, Mechanical structures for electronic equipment, Electrical accessories, Radiation measurements, Environmental testing, Transformers. Reactors, Software development and system documentation, Electromechanical components for electronic and telecommunications equipment, Radiation protection, Colour coding, Glass, Electronic components in general.

British Standards Institution (BSI), Semiconductor Instruments

• BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
• BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
• BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
• BS EN 62047-20:2014 Semiconductor devices. Micro-electromechanical devices. Gyroscopes
• BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
• BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
• BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
• BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
• BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
• BS IEC 60747-14-1:2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors
• BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
• BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
• BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
• BS IEC 60747-1:2006+A1:2010 Semiconductor devices - General
• PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
• BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
• BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
• BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
• 19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
• 13/30264591 DC BS EN 60747-14-6. Semiconductor devices. Part 14-6. Semiconductor sensor. Humidity sensor
• 13/30264596 DC BS EN 60747-14-7. Semiconductor devices. Part 14-7. Semiconductor sensor. Flow meter
• BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
• BS 6493-1.1:1984 Semiconductor devices - Part 1: Discrete devices - Section 1.1 General
• 23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
• BS EN IEC 62969-1:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. General requirements of power interface for automotive vehicle sensors
• BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
• BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
• BS IEC 60747-7:2011 Semiconductor devices. Discrete devices. Bipolar transistors
• BS IEC 60747-7:2010 Semiconductor devices. Discrete devices. Bipolar transistors
• BS IEC 60747-7:2010+A1:2019 Semiconductor devices. Discrete devices - Bipolar transistors
• BS EN IEC 63287-1:2021 Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
• BS IEC 60747-14-10:2019 Semiconductor devices. Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
• 13/30264600 DC BS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid
• BS 3934-1:1992 Mechanical standardization of semiconductor devices - Recommendations for the preparation of drawings of semiconductor devices
• BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
• BS EN 62779-3:2016 Semiconductor devices. Semiconductor interface for human body communication. Functional type and its operational conditions
• BS IEC 60747-8:2010+A1:2021 Semiconductor devices. Discrete devices - Field-effect transistors
• BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
• BS EN IEC 62969-4:2018 Semiconductor devices. Semiconductor interface for automotive vehicles. Evaluation method of data interface for automotive vehicle sensors
• BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
• BS EN 13604:2013 Copper and copper alloys. Semiconductor devices, electronic and vacuum products made from high conductivity copper
• BS IEC 62951-1:2017 Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
• BS EN IEC 60747-5-5:2020 Semiconductor devices. Optoelectronic devices. Photocouplers
• BS IEC 60748-1:2002 Semiconductor devices - Integrated circuits - General
• BS 6493-2.1:1985 Semiconductor devices - Integrated circuits - General
• BS EN 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
• 18/30363340 DC BS IEC 62779-4. Semiconductor devices. Semiconductor interface for human body communication. Part 4. Semiconductor interface for capsule endoscopy using human body communication
• BS EN IEC 63244-1:2021 Semiconductor devices. Semiconductor devices for wireless power transfer and charging. General requirements and specifications
• BS EN 62258-1:2006 Semiconductor die products - Requirements for procurement and use
• BS EN 62258-1:2010 Semiconductor die products. Procurement and use
• BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
• BS IEC 60747-18-4:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
• BS EN IEC 62969-3:2018 Semiconductor devices. Semiconductor interface for automotive vehicles - Shock driven piezoelectric energy harvesting for automotive vehicle sensors
• 14/30297227 DC BS EN 62880-1. Semiconductor devices. Wafer level reliability for semiconductor devices. Copper stress migration test method
• BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
• BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
• BS EN 60747-16-1:2002+A1:2007 Semiconductor devices — Part 16-1: Microwave integrated circuits — Amplifiers
• BS IEC 60747-2:2016 Semiconductor devices. Discrete devices. Rectifier diodes
• BS EN 60747-16-5:2013+A1:2020 Semiconductor devices - Microwave integrated circuits. Oscillators
• BS EN 60747-16-3:2002+A2:2017 Semiconductor devices - Microwave integrated circuits. Frequency converters
• BS EN 60747-16-1:2002+A2:2017 Semiconductor devices - Microwave integrated circuits. Amplifiers
• BS EN IEC 60747-16-6:2019 Semiconductor devices. Microwave integrated circuits. Frequency multipliers
• BS IEC 60747-18-2:2020 Semiconductor devices. Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
• BS EN IEC 62435-6:2018 Electronic components. Long-term storage of electronic semiconductor devices - Packaged or finished devices
• BS EN 60191-4:2014 Mechanical standardization of semiconductor devices. Coding system and classification into forms of package outlines for semiconductor device packages
• BS EN 62830-3:2017 Semiconductor devices. Semiconductor devices for energy harvesting and generation - Vibration based electromagnetic energy harvesting
• BS EN 60191-4:2014+A1:2018 Mechanical standardization of semiconductor devices - Coding system and classification into forms of package outlines for semiconductor device packages
• BS IEC 62830-7:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Linear sliding mode triboelectric energy harvesting
• BS IEC 62830-1:2017 Semiconductor devices. Semiconductor devices for energy harvesting and generation - Vibration based piezoelectric energy harvesting
• BS IEC 60747-8:2010 Semiconductor devices. Discrete devices. Field-effect transistors
• BS EN 62258-2:2011 Semiconductor die products. Exchange data formats
• BS EN 62258-2:2005 Semiconductor die products - Exchange data formats
• BS IEC 62899-203:2018 Printed electronics. Materials. Semiconductor ink
• BS EN 60146-2:2000 Semiconductor convertors. General requirements and line commutated convertors. Self-commutated semiconductor converters including direct d.c. converters

Group Standards of the People's Republic of China, Semiconductor Instruments

• T/CASME 698-2023 Semiconductor laser therapy apparatus
• T/JGXH 008-2020 Diode pump solid state laser
• T/CECA 35-2019 Metal oxide semiconductor gas sensor

CZ-CSN, Semiconductor Instruments

• CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
• CSN 35 1531-1973 Silicon semiconductor rectifiers
• CSN 35 1530-1979 Power semiconductor converters
• CSN 35 1560-1969 Power semiconductor Rectifiers
• CSN 01 3347-1989 Graphical symbols for semiconductor devices
• CSN 34 5910-1986 Gold bonding wire for semiconductor devices
• CSN 01 3368-1990 Graphical symbols for semiconductor devices
• CSN 35 1540-1979 Tests of power semiconductor converters
• CSN 34 5175-1979 Terminology of power semiconductor convenors
• CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
• CSN 35 4714-1983 Low-voltage fusos for tho protection of semiconductor devices
• CSN 35 8740-1973 Semiconduotor deviees. Transistore. Measurement of saturation voltage
• CSN 35 1609-1983 Power semiconductor devices. Heat sinks. Testing methodo

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor Instruments

• GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
• GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
• GB/T 20522-2006 Semiconductor devices. Part 14-3: Semiconductor sensors. Pressure sensors
• GB/T 20521-2006 Semiconductor devices. Part 14-1: Semiconductor sensors. General and classification
• GB/T 3859.2-1993 Semiconductor convertors.Application guide
• GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
• GB/T 13974-1992 Test methods for semiconductor deviece curve tracers
• GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
• GB/T 3859.4-2004 Semiconductor converter-Self-commutated semiconductor converters including direct d.c.converters
• GB/T 29299-2012 General specification of semiconductor laser rangefinder
• GB/T 31358-2015 General specification for semiconductor lasers
• GB/T 8750-1997 Gold wire for semiconductor devices lead bonding
• GB/T 7678-1987 Semiconductor self-commutated convertors
• GB/T 8446.1-1987 Heat sink for power semiconductor device
• GB/T 13973-1992 General specification for semiconductor deviece curve tracers
• GB/T 3436-1996 Semiconductor integrated circuits. Series and products of operational amplifier
• GB/T 4855-1984 Families and products of linear amplifier for semiconductor integrated circuits
• GB/T 4376-1994 Series and products of voltage regulators for semiconductor integrated circuits
• GB/T 31359-2015 Test methods of semiconductor lasers
• GB/T 8750-2007 Gold bonding wire for semiconductor devices
• GB/T 7677-1987 Semiconductor direct d.c. convertors
• GB/T 7423.2-1987 Heat sink of semiconductor devices--Heat sink, Extruded shapes
• GB/T 3859.3-1993 Semiconductor convertors.Transformers and reactors
• GB 7423.2-1987 Semiconductor device heat sink profile heat sink
• GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
• GB/T 17950-2000 Semiconductor converter-Part 6:Application guide for the protection of semiconductor converters against overcurrent by fuses
• GB/T 7423.3-1987 Heat sink of semiconductor devices--Heat sink, staggered fingers shapes
• GB 7423.3-1987 Semiconductor device heat sink interdigitated heat sink
• GB 12565-1990 Sectional Specification for Semiconductor Devices and Optoelectronic Devices
• GB/T 11499-2001 Letter symbols for discrete semiconductor devices
• GB/T 2900.32-1994 Electrotechnical terminology. Power semiconductor device
• GB/T 7581-1987 Dimensions of outlines for semiconductor discrete devices
• GB/T 7423.1-1987 Heat sink of semiconductor devices--Generic specification
• GB 7423.1-1987 General technical requirements for heat sinks for semiconductor devices
• GB/T 32817-2016 Semiconductor devices.Micro-electromechanical devices.Generic specification for MEMS
• GB/T 13422-2013 Semiconductor converters.Electrical test methods
• GB/T 15291-2015 Semiconductor devices—Part 6: Thyristors
• GB/T 15291-1994 Semiconductor devices. Part 6: Thyristors
• GB/T 42836-2023 Microwave semiconductor integrated circuit mixer
• GB/T 42837-2023 microwave semiconductor integrated circuit amplifier
• GB/T 13068-1991 Series and products for semiconductor integrated circuits--Products for use in transducer sensitive to magnetic

RU-GOST R, Semiconductor Instruments

• GOST 29283-1992 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices
• GOST 4.137-1985 Product-quality index system. Power semiconductor devices. Nomenclature of indices
• GOST R 57439-2017 Semiconductor devices. Basic dimensions
• GOST 18472-1988 Semiconductor devices. Basic dimensions
• GOST 15133-1977 Semiconductor devices. Terms and definitions
• GOST 24352-1980 Semiconductor photoemitters. Main parameters
• GOST 26284-1984 Semiconductor power converters. Conventional designations
• GOST 18230-1972 Power supplies spectrometric semiconductor radiation detectors. Types and basic parameters
• GOST 28578-1990 Semiconductor devices. Mechanical and climatic test methods
• GOST 24376-1991 Semiconductor inverters. General specifications
• GOST 4.139-1985 System of product-quality indices. Semiconductor power converters. Nomenclature of indices

International Electrotechnical Commission (IEC), Semiconductor Instruments

• IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
• IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures
• IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
• IEC 60747-14-3:2001 Semiconductor devices - Part 14-3: Semiconductor sensors; Pressure sensors
• IEC 60747-14-3:2009 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
• IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
• IEC 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
• IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
• IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
• IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
• IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
• IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
• IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
• IEC 61207-7:2013/COR1:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers; Corrigendum 1
• IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
• IEC 60191-1:1966 Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices
• IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
• IEC 60146-2:1999 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
• IEC 60191-1A:1969 Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices.
• IEC 60191-1C:1974 Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices.
• IEC TR 60146-6:1992 Semiconductor convertors - Part 6: Application guide for the protection of semiconductor convertors against overcurrent by fuses
• IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
• IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• IEC 60747-1:2006 Semiconductor devices - Part 1: General
• IEC 60747-1:2006/AMD1:2010 Semiconductor devices - Part 1: General
• IEC 60747-1:2010 Semiconductor devices – Part 1: General (Edition 2.1 Consolidated Reprint)
• IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
• IEC 60747-14-10:2019 Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
• IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
• IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
• IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
• IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
• IEC 60747-6:2016 Semiconductor devices - Part 6: Thyristors
• IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
• IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
• IEC TR2 60146-6:1992 Semiconductor convertors; part 6: application guide for the protection of semiconductor convertors against overcurrent by fuses

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Semiconductor Instruments

• JEDEC JESD22-B108A-2003 Coplanarity Test for Surface-Mount Semiconductor Devices
• JEDEC JEP134-1998 Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis
• JEDEC JESD370B-1982 Designation System for Semiconductor Devices
• JEDEC EIA-323-1966 Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices
• JEDEC EIA-236-C-1986 Color Coding of Discrete Semiconductor Devices
• JEDEC JESD236-C-1986 Color Coding of Discrete Semiconductor Devices
• JEDEC EIA-321-C-1987 Numbering of Like-Named Terminal Functions in Semiconductor Devices and Designation of Units in Multiple-Unit Semiconductor Devices
• JEDEC JEP78-1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors

Association Francaise de Normalisation, Semiconductor Instruments

• NF EN 62047-20:2014 Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 20 : gyroscopes
• NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
• NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
• NF EN 60747-15:2013 Dispositifs à semiconducteurs - Dispositifs discrets - Partie 15 : dispositifs de puissance à semiconducteurs isolés
• NF C96-050-20*NF EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes
• NF C96-015*NF EN 60747-15:2013 Semiconductor devices - Discrete devices - Part 15 : isolated power semiconductor devices
• NF C53-221:1980 Semiconductor self-commutated convertors.
• NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
• NF C96-779-1*NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1 : general requirements
• NF C53-221*NF EN 60146-2:2002 Semiconductor converters - Part 2 : self-commutated semiconductor converters including direct d.c. converters
• NF EN 60146-2:2002 Convertisseurs à semiconducteurs - Partie 2 : convertisseurs autocommutés à semiconducteurs y compris les convertisseurs à courant continu directs
• NF C86-010:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.
• NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
• NF EN IEC 63364-1:2023 Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1 : méthode d'essai de détection de variation acoustique
• NF EN 61207-7:2014 Expression des performances des analyseurs de gaz - Partie 7 : analyseurs de gaz laser à semiconducteurs accordables
• NF EN 62417:2010 Dispositifs à semiconducteurs - Essais d'ions mobiles pour transistors à semiconducteur à oxyde métallique à effet de champ (MOSFET)
• NF C96-822:1981 Semiconductor Devices High Power Thyristors
• NF EN IEC 62969-3:2018 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 3 : récupération de l'énergie piézoélectrique produite par les chocs pour les capteurs de véhicules automobiles
• NF C96-287-1*NF EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : guidelines for IC reliability qualification
• NF C96-779-3*NF EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3 : functional type and its operational conditions
• NF EN 62779-2:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2 : caractérisation des performances d'interfaçage
• NF EN 62415:2010 Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
• NF A51-310*NF EN 13604:2013 Copper and copper alloys - Semiconductor devices, electronic and vacuum products made from high conductivity copper
• NF C96-069-1*NF EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1 : general requirements of power interface for automotive vehicle sensors
• NF C96-069-4*NF EN IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4 : evaluation method of data interface for automotive vehicle sensors

ES-UNE, Semiconductor Instruments

• UNE-EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (Endorsed by AENOR in November of 2014.)
• UNE-EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (Endorsed by AENOR in June of 2012.)
• UNE-EN 60146-2:2000 Semiconductor converters -- Part 2: Self-commutated semiconductor converters including direct d.c. converters (Endorsed by AENOR in December of 2001.)
• UNE-EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
• UNE-EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in January of 2014.)
• UNE-EN 61207-7:2013/AC:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in September of 2015.)
• UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
• UNE-EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
• UNE-EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
• UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
• UNE-EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in March of 2018.)
• UNE-EN IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)

German Institute for Standardization, Semiconductor Instruments

• DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
• DIN 28058-2:1989-01 Lead used in apparatus engineering; lead of semi-finished product designs
• DIN EN 60747-15:2012-08 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012 / Note: DIN EN 60747-15 (2004-08) remains valid alongside this standard until 2014-01-20.
• DIN EN 62047-20:2015-04 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 62047-20:2014); German version EN 62047-20:2014
• DIN EN 60146-2:2001 Semiconductor convertors - Part 2: Self-commutated semiconductor convertors including direct d.c. convertors (IEC 60146-2:1999); German version EN 60146-2:2000
• DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
• DIN EN 61207-7:2015-07 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013); German version EN 61207-7:2013 / Note: Applies in conjunction with DIN EN 61207-1 (2011-04).
• DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
• DIN EN IEC 63287-1:2020-06 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020 / Note: Date of issue 2020-05-08*Intended as replacem...
• DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010

Professional Standard - Electron, Semiconductor Instruments

• SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
• SJ/T 10414-2015 Solder for semiconductor device
• SJ/T 10414-1993 Solder for semicoductor device
• SJ/T 10535-1994 Tungsten boat for semiconductor devices
• SJ 20072-1992 Detail specification for semiconductor opto-couplers for type GH24,GH25 and GH26
• SJ/Z 9021.1-1987 Mechanical standardization of semiconductor components Part 1 Preparation of drawings of semiconductor components
• SJ 20234-1993 Verification regulation of model HP4145A semiconductor parameter analyzer
• SJ 20236-1993 Verification regulation of the model GH2050/51 calibrator for transistor characteristic tracer
• SJ 50033/3-1994 Semiconductor discrete device.Detail specification for semiconductor opto-couplers for type GH21,GH22 and GH23 of GP,GT and GCT classes
• SJ/T 11777-2021 Technical requirements and measurement methods of calibrator for semiconductor tube characteristic tracer
• SJ 2220-1982 Semiconductor photocouplers in the Darlington transistor mode
• SJ/T 11089-1996 Letter symbols for discrete semiconductor components
• SJ 50033/109-1996 Semiconductor optoelectronic devices.Detail specification for types GJ9031T and GJ9032T and GJ9034T semiconductor laser diodes
• SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
• SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
• SJ/T 10416-1993 Generic Apecification for chip for semiconductor discrete devices

Defense Logistics Agency, Semiconductor Instruments

• DLA DESC-DWG-84002-1984 HEAT SINKS FOR SEMICONDUCTOR DEVICES
• DLA MIL-S-19500/529 VALID NOTICE 4-2011 Semiconductor Device, Transistor, Silicon Type 2N3904
• DLA QML-19500-31-2007 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
• DLA QML-19500-QPD-2010 Semiconductor Devices, General Specification for
• DLA QML-19500-QPD-2011 Semiconductor Devices, General Specification for
• DLA QML-19500-2011 Semiconductor Devices, General Specification for
• DLA QML-19500-QPD-2012 Semiconductor Devices, General Specification for
• DLA QML-19500-2012 Semiconductor Devices, General Specification for
• DLA QML-19500-2013 Semiconductor Devices, General Specification for
• DLA MIL-S-19500/273 A VALID NOTICE 3-2011 Semiconductor Device, Transistor Type Type 2N744
• DLA MIL-S-19500/303 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
• DLA DSCC-DWG-91011 REV B-2003 SEMICONDUCTOR DEVICE, DIODE, ULTRA FAST
• DLA MIL-STD-750 F CHANGE 1-2013 TEST METHODS FOR SEMICONDUCTOR DEVICES
• DLA MIL-S-19500/288 VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N2377
• DLA MIL-S-19500/170 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Type 2N1499A
• DLA MIL-S-19500/179 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N1234
• DLA MIL-S-19500/216 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, NPN, Silicon Type 2N1051
• DLA MIL-STD-750 F-2012 TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
• DLA MIL-S-19500/298 VALID NOTICE 4-2011 Semiconductor Device, Diode, Silicon Type 1N1742A
• DLA MIL-S-19500/236 A VALID NOTICE 3-2011 Semiconductor Device, Diode, Silicon Type 1N31
• DLA MIL-S-19500/230 C VALID NOTICE 4-2011 Semiconductor Device, Diode, Silicon, High-Conductance Type JAN- 1N3207
• DLA MIL-S-19500/72 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Types 2N499 and 2N499A
• DLA MIL-S-19500/49 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Types 2N464, 2N465, 2N467
• DLA MIL-S-19500/215 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N1173 and 2N1174 (Navy)
• DLA DSCC-DWG-90025 REV C-2013 SEMICONDUCTOR DEVICE, POWER SWITCHING REGULATOR ASSEMBLY
• DLA DSCC-DWG-94022 REV G-2000 SEMICONDUCTOR DEVICE, DIODE, STANDARD RECOVERY
• DLA MIL-STD-750 E-2006 TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
• DLA MIL-S-19500/227 VALID NOTICE 3-2011 Semiconductor Device, Diode, Type 1N995M (Navy)
• DLA MIL-S-19500/229 VALID NOTICE 3-2011 Semiconductor Device, Diode, Type 1N830AM (Navy)
• DLA DSCC-DWG-04029-2005 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH POWER TYPE 2N5927
• DLA DSCC-DWG-04030-2005 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH POWER TYPE 2N5926
• DLA MIL-S-19500/68 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Switching Type 2N1120
• DLA MIL-S-19500/80 E VALID NOTICE 4-2011 Semiconductor Device, Transistor, NPN, Silicon, Low-Power Type 3N35
• DLA MIL-S-19500/13 B VALID NOTICE 3-2011 Semiconductor Device, Transistor, PNP, Germanium, High Power Type 2N174A
• DLA MIL-S-19500/25 B VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Low-Power Type 2N240
• DLA MIL-S-19500/36 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N297A
• DLA MIL-S-19500/44 D VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Low-Power Type 2N428
• DLA MIL-S-19500/51 E VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Low Power Type 2N466
• DLA MIL-S-19500/58 D VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N665
• DLA MIL-S-19500/330 A VALID NOTICE 4-2011 Semiconductor Device, Transistor PNP, Germanium Types 2N1557A through 2N1560A
• DLA MIL-S-19500/338 VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP Germanium, Switching Type 2N3449
• DLA MIL-S-19500/425 VALID NOTICE 3-2011 Semiconductor Device, Transistor, PN, Silicon, Unijunction JAN2N5431, and JANTX2N5431

Danish Standards Foundation, Semiconductor Instruments

• DS/EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
• DS/EN 60146-2:2000 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
• DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• DS/EN IEC 63287-1:2021 Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
• DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
• DS/EN IEC 63244-1:2021 Semiconductor devices – Semiconductor devices for wireless power transfer and charging – Part 1: General requirements and specifications

Korean Agency for Technology and Standards (KATS), Semiconductor Instruments

• KS C IEC 60747-14-1:2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors
• KS C IEC 60747-14-1:2003 Semiconductor devices－Part 14－1：Semiconductor sensors－General and classification
• KS C IEC 60747-14-1:2019 Semiconductor devices — Part 14-1: Semiconductor sensors —Generic specification for sensors
• KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
• KS C IEC 60146-2:2002 Semiconductor converters－Part 2：Self-commutated converters including direct d.c. converters
• KS C IEC 60050-521-2002(2022) Semiconductor devices and integrated circuits
• KS C IEC 60050-521-2002(2017) Semiconductor devices and integrated circuits
• KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
• KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
• KS C IEC 60747-1:2020 Semiconductor devices — Part 1: General
• KS C IEC 60747-7:2006 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
• KS C IEC 60747-7:2017 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
• KS C IEC 60146-6-2002(2012) Semiconductor convertors－Part 6：Application guide for the protection of semiconductor convertors against overcurrent by fuses
• KS C IEC 60747-14-10:2022 Semiconductor devices — Part 14-10: Semiconductor sensors — Performance evaluation methods for wearable glucose sensors
• KS C IEC 60971-2003(2008) Semiconductor convertors－Identification code for convertor connections
• KS C IEC 60146-6:2002 Semiconductor convertors-Part 6:Application guide for the protection of semiconductor convertors against overcurrent by fuses
• KS C IEC 60146-6:2013 Semiconductor convertors-Part 6:Application guide for the protection of semiconductor convertors against overcurrent by fuses
• KS C IEC 60747-6:2006 Semiconductor Devices－Discrete devices－Part 6：Thyristors
• KS C IEC 60747-8:2002 Discrete devices－Part 8：Field－effect transistors

KR-KS, Semiconductor Instruments

• KS C IEC 60747-14-1-2021 Semiconductor devices — Part 14-1: Semiconductor sensors — Generic specification for sensors
• KS C IEC 60747-14-1-2019 Semiconductor devices — Part 14-1: Semiconductor sensors —Generic specification for sensors
• KS C IEC 60747-1-2020 Semiconductor devices — Part 1: General
• KS C IEC 60747-14-10-2022 Semiconductor devices — Part 14-10: Semiconductor sensors — Performance evaluation methods for wearable glucose sensors

工业和信息化部, Semiconductor Instruments

• QB/T 5369-2019 Semiconductor refrigeration equipment

Hebei Provincial Standard of the People's Republic of China, Semiconductor Instruments

• DB13/T 5293-2020 Specifications for Maintenance of Semiconductor Characteristic Tracer

National Metrological Verification Regulations of the People's Republic of China, Semiconductor Instruments

• JJG(电子) 310002-2006 Specification for verification of DC parameter testers for semiconductor discrete devices
• JJG(电子) 310003-2006 Specification for verification of capacitor parameter testers for semiconductor discrete devices
• JJG(电子) 31010-2007 Verification Regulations for Precision Analyzer of Semiconductor Parameters
• JJG(电子) 04008-1987 Trial Verification Regulations for QE1A Double-base Semiconductor Tube Tester

Japanese Industrial Standards Committee (JISC), Semiconductor Instruments

• JIS C 5630-20:2015 Semiconductor devices -- Micro-electromechanical devices -- Part 20: Gyroscopes
• JIS C 8377:2021 Requirements for fuse-links for the protection of semiconductor devices

IEC - International Electrotechnical Commission, Semiconductor Instruments

• IEC 60146-2:1974 Semiconductor Convertors Part 2: Semiconductor Self-Commutated Convertors (Edition 1.0)
• IEC TR 63133:2017 Semiconductor devices - Scan based ageing level estimation for semiconductor devices (Edition 1.0)

Military Standard of the People's Republic of China-General Armament Department, Semiconductor Instruments

• GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
• GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
• GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
• GJB 33-1985 General Specification for Semiconductor Discrete Devices
• GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
• GJB 128-1986 Aerial photographic specification for military topographic mapping
• GJB 3164-1998 Semiconductor discrete device packaging specifications
• GJB 33B-2021 General Specification for Semiconductor Discrete Devices
• GJB/Z 10-1989 Semiconductor discrete device series type spectrum
• GJB 128B-2021 Semiconductor discrete device test methods
• GJB 8119-2013 General specification for semiconductor optoelectronic device
• GJB 923-1990 General Specification for Semiconductor Discrete Device Cases
• GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler

National Metrological Technical Specifications of the People's Republic of China, Semiconductor Instruments

• JJF 1894-2021 Calibration Specification for Calibrators of Semiconductor Curve Tracers
• JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers
• JJF 2009-2022 Calibration Specification for Semiconductor Parameters Precision Analyzers

European Committee for Electrotechnical Standardization（CENELEC）, Semiconductor Instruments

• EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
• EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
• EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
• EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
• EN 60146-2:2000 Semiconductors convertors Part 2: Self-commutated semiconductor converters including direct d.c. converters
• EN IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
• EN 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
• EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
• EN IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
• EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

CENELEC - European Committee for Electrotechnical Standardization, Semiconductor Instruments

• EN 60747-15:2004 Discrete semiconductor devices Part 15: Isolated power semiconductor devices
• EN 62415:2010 Semiconductor devices - Constant current electromigration test

TH-TISI, Semiconductor Instruments

• TIS 1863-2009 Semiconductor devices.discrete devices
• TIS 1972-2009 Semiconductor devieces.part 6: thyristors
• TIS 1864-2009 Semiconductor devices.part 7: bipolar transistors

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Semiconductor Instruments

• GB/T 15651.4-2017 Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers

Standard Association of Australia （SAA）, Semiconductor Instruments

• AS 60146.2:2001/Amdt 1:2001
• AS 60146.2:2001(R2013)
• AS 60146.2:2001 Semiconductor converters - Self-commutated semiconductor converters including direct d.c. converters
• AS 4424:1996 Reference guide to Standards for semiconductor devices

SE-SIS, Semiconductor Instruments

• SIS SS IEC 333:1986 Nuclear instrumentation - Testprocedures for semiconductor chargedparticle detectors
• SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
• SIS SS CECC 50000-1987 Generic specification: Discrete semiconductor devices
• SIS SS IEC 596:1981 Nuclear instrumentation - Definitions of test method terms for semi-conductor radiation detectors and scintillation counting
• SIS SS IEC 340:1981 Nuclear instrumentation — Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation

Institute of Electrical and Electronics Engineers (IEEE), Semiconductor Instruments

• IEEE Std 1687-2014 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
• IEEE 1687-2014 Access and Control of Instrumentation Embedded within a Semiconductor Device (IEEE Computer Society)
• IEEE P1687/D1.62, September 2013 IEEE Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
• IEEE P1687/D1.71, March 2014 IEEE Approved Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
• IEEE 660-1986 Semiconductor memory test pattern language
• ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
• ANSI/IEEE Std 662-1980 IEEE Standard Terminology for Semiconductor Memory
• IEEE 662-1980 IEEE Standard Terminology for Semiconductor Memory
• IEEE Std 662-1992 IEEE Standard Terminology for Semiconductor Memory

Underwriters Laboratories (UL), Semiconductor Instruments

• UL 1557-1993 Electrically isolated semiconductor devices
• UL 1557-1997 Electrically isolated semiconductor devices
• UL 1557-2006 UL Standard for Safety Electrically Isolated Semiconductor Devices Fourth Edition; Reprint with Revisions through and Including 6/26/2006
• UL 1557-2011 Electrically isolated semiconductor devices

Professional Standard - Machinery, Semiconductor Instruments

• JB/T 5537-2006 Semiconductor pressure sensors
• JB/T 4277-1996 Packing of power semiconductor parts
• JB/T 9684-2000 Selecting guide of heat sink for power semiconductor device
• JB/T 10097-2000 Case for power semiconductor device
• JB/T 10097-1999 Cases for Power Semiconductor Devices
• JB/T 10096-2000 Selection guidance of case for power semiconductor device
• JB/T 8757-1998 Hot pipe radiators intended to be used in power semiconductor devices
• JB/T 9687.1-1999 Molybdenum disk for power semiconductor devices
• JB/T 9687.2-1999 Tungsten disk for power semiconductor devices
• JB/T 9644-1999 Reactor for semiconductor electric drive
• JB/T 7061-1993 Silicon wafers intended to be used in power semiconductor devices
• JB/T 5843-2005 Connectors for power semiconductor devices
• JB/T 5844-1991 Parameter symbols for power semiconductor devices
• JB/T 5843-1991 Connectors for Power Semiconductor Devices
• JB/T 10501-2005 Ceramic parts of case for power semiconductor devices
• JB/T 5631-1991 Epitaxial furnace for semiconductor devices. Energy efficiency standard
• JB/T 7483-2005 Semiconductor resistance strain gauge force stransducer/sensor
• JB/T 5629-1991 Welding furnace for semiconductor devices. Grading of energy consumption
• JB/T 5630-1991 Diffusion furnace for semiconductor devices. Grading of energy consumption
• JB/T 7483-1994 Semiconductor resistance strain sensor
• JB/T 7064-1993 General Specifications for Semiconductor Inverters
• JB/T 5537-1991 Semiconductor pressure sensor technical conditions
• JB/T 10096-1999 Shell structure and selection guidelines for power semiconductor devices

ESD - ESD ASSOCIATION, Semiconductor Instruments

• EP118-2007 Physics of Semiconductor Devices

International Organization for Standardization (ISO), Semiconductor Instruments

• ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
• ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
• ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

ZA-SANS, Semiconductor Instruments

• SANS 60146-2:1999 Semiconductor converters Part 2: Self-commutated semiconductor converters including direct d.c. converters
• SANS 60146-6:1992 Semiconductor convertors Part 6: Application guide for the protection of semiconductor convertors against overcurrent by fuses

Lithuanian Standards Office , Semiconductor Instruments

• LST EN 60747-15-2012 Semiconductor devices - Discrete devices -- Part 15: Isolated power semiconductor devices (IEC 60747-15:2010)
• LST 1412-1995 Semiconductor devices. Terms and definitions
• LST EN 60146-2-2002 Semiconductor converters. Part 2: Self-commutated semiconductor converters including direct d.c. converters (IEC 60146-2:1999)

IN-BIS, Semiconductor Instruments

• IS 5001 Pt.1-1969
• IS 4411-1967
• IS 5001-1969
• IS 5000 OC.4-1969
• IS 5000 OD.34-1981
• IS 7412-1974
• IS 5000 OD.15-1973
• IS 5000 OD.16-1973
• IS 5000 OD.30-1981
• IS 5000 OD.4-1969
• IS 5000 OD.7-1969
• IS 5000 OD.9-1969
• IS 5000 OD.1-1969
• IS 5000 OD.6-1969
• IS 5000 OD.2-1969
• IS 5000 OD.5-1969
• IS 5000 OD.8-1969
• IS 5000 OD.31-1981
• IS 5000 OD.13-1971
• IS 5000 OD.19-1974
• IS 5000 OD.12-1971
• IS 5000 OD.18-1974
• IS 5000 OD.14-1971
• IS 5000 OD.33-1981
• IS 5000 OD.10-1971
• IS 5000 OD.17-1974
• IS 5000 OD.35-1981
• IS 5000 OD.11-1971
• IS 5000 OD.21-1979
• IS 5000 OD.23-1978
• IS 5000 OD.28-1978
• IS 5000 OD.20-1978
• IS 5000 OD.26-1978
• IS 5000 OD.27-1978
• IS 5000 OD.22-1978
• IS 5000 OD.25-1978
• IS 5000 OD.24-1979
• IS 5000 OD.29-1979
• IS 5000 OD.36-1981
• IS 5000 OB.1-1969
• IS 5000 OB.5-1969
• IS 5000 OB.2-1969
• IS 5000 OB.6-1969
• IS 3136-1965
• IS 5000 OB.7-1969
• IS 5000 OB.4-1969
• IS 6619-1972
• IS 2511-1963
• IS 5469-1969
• IS 12737-1988

JP-JEC, Semiconductor Instruments

• JEC 2440-2005 SEMICONDUCTOR SELF-COMMUTATED CONVERTERS

Professional Standard - Aerospace, Semiconductor Instruments

• QJ 2225-1992 Semiconductor Device Usage Rules
• QJ 1511A-1998 Acceptance Specifications for Semiconductor Discrete Devices

European Standard for Electrical and Electronic Components, Semiconductor Instruments

• CECC MUAHAG VOL 9 IS 4-1993 Preferred Products List; Semiconductors (En)

Professional Standard - Non-ferrous Metal, Semiconductor Instruments

• YS/T 678-2008 Copper wire for semiconductor lead bonding
• YS/T 641-2007 Aluminium wire for semiconductor lead bonding

American National Standards Institute （ANSI), Semiconductor Instruments

• ANSI/EIA 370-B:1992 Semiconductor Devices, Designation System for
• ANSI/EIA 321-C:1987 Numbering of Like-Named Terminal Functions in Semiconductor Devices and Designation of Units in Multiple-Unit Semiconductor Devices
• ANSI/EIA 236-C:1986 Color Coding of Discrete Semiconductor Devices

PL-PKN, Semiconductor Instruments

• PN T01503 ArkusZ06-1973 Semiconductor devices Dimensions Device A 24
• PN T01503 ArkusZ15-1973 Semiconductor devices Oimensions Device A 33
• PN T01503 ArkusZ16-1973 Semiconductor devices Dimensions Device A 51
• PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
• PN T01204-1990 Semiconductor devices Sectional specification for discrete devices

GOSTR, Semiconductor Instruments

• GOST R 57436-2017 Semiconductor devices. Terms and definitions
• GOST 18577-1980 Thermoelectric semiconductor devices. Terms and definitions

未注明发布机构, Semiconductor Instruments

• GJB 33A-1997 General Specification for Semiconductor Discrete Devices
• BS EN 61207-7:2013(2015) Expression of performance of gas analyzers Part 7 : Tuneable semiconductor laser gas analyzers
• GJB 128A-1997 Semiconductor discrete device test methods

Professional Standard - Medicine, Semiconductor Instruments

• YY 1289-2016 Laser Therapy Equipment Ophthalmic Diode Laser Photocoagulation Instrument

PH-BPS, Semiconductor Instruments

• PNS IEC 62830-2:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Semiconductor Instruments

• IEEE 1131-1987 STANDARD CRYOSTAT END-CAP DIMENSIONS FOR GERMANIUM SEMICONDUCTOR GAMMA-RAY SPECTROMETERS

IET - Institution of Engineering and Technology, Semiconductor Instruments

• DISTRB FEEDB SEMI LAS-1998 Distributed Feedback Semiconductor Lasers

机械电子工业部, Semiconductor Instruments

• JB 5843-1991 Connectors for power semiconductor devices

国家机械工业局, Semiconductor Instruments

• JB 9644-1999 Reactor for semiconductor electric transmission

中华人民共和国国家卫生和计划生育委员会, Semiconductor Instruments

• GB/T 11713-1989 Standard methods of analyzing low specific gamma radioactivity samples by semiconductor gamma spectrometers

国家市场监督管理总局、中国国家标准化管理委员会, Semiconductor Instruments

• GB/T 15879.4-2019 Mechanical standardization of semiconductor devices—Part 4: Coding system and classification into forms of package outlines for semiconductor device packages

RO-ASRO, Semiconductor Instruments

• STAS 11381/13-1981 Graphical symbols for electrical diagrams SEMICONDUCTOR DEVICES

Professional Standard - Building Materials, Semiconductor Instruments

• JC/T 181-2011 Transparent quartz glass devices for semiconductor

NEMA - National Electrical Manufacturers Association, Semiconductor Instruments

• NEMA MR 20-1958 SEMICONDUCTOR RECTIFIERS CATHODIC PROTECTION UNITS

Jilin Provincial Standard of the People's Republic of China, Semiconductor Instruments

• DB22/T 2725-2017 980 nm fiber grating semiconductor laser

Others:   Semiconductor Test Instruments, Semiconductor Instruments, Semiconductor Instruments, Semiconductor equipment, Semiconductor Measuring Instruments, Semiconductor Instruments, Semiconductor Instruments.