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Semiconductor Test Instruments

Semiconductor Test Instruments, Total:8 items.

In the international standard classification, Semiconductor Test Instruments involves: Semiconductor devices, Electricity. Magnetism. Electrical and magnetic measurements, Nuclear energy engineering, Analytical chemistry.

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Semiconductor Test Instruments

• JEDEC JESD22-B108A-2003 Coplanarity Test for Surface-Mount Semiconductor Devices

National Metrological Verification Regulations of the People's Republic of China, Semiconductor Test Instruments

• JJG(电子) 310002-2006 Specification for verification of DC parameter testers for semiconductor discrete devices
• JJG(电子) 310003-2006 Specification for verification of capacitor parameter testers for semiconductor discrete devices

International Electrotechnical Commission (IEC), Semiconductor Test Instruments

• IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures

SE-SIS, Semiconductor Test Instruments

• SIS SS IEC 333:1986 Nuclear instrumentation - Testprocedures for semiconductor chargedparticle detectors

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor Test Instruments

• GB/T 13974-1992 Test methods for semiconductor deviece curve tracers
• GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
• GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

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