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How to use the ion sputterer

How to use the ion sputterer, Total:37 items.

In the international standard classification, How to use the ion sputterer involves: Vacuum technology, Analytical chemistry, Semiconducting materials, Radiation measurements, Vocabularies, Linear and angular measurements, Wastes, Non-ferrous metals, Construction materials, Nuclear energy engineering, Electronic components in general.

Professional Standard - Electron, How to use the ion sputterer

SJ 1781-1981 Sputtering ion pump--Testing methods

Professional Standard - Machinery, How to use the ion sputterer

JB/T 2965-1992 Performance testing method of sputtering ion pump

British Standards Institution (BSI), How to use the ion sputterer

BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
PD ISO/TR 22335:2007 Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
BS IEC 60692:1999 Nuclear instrumentation. Density gauges utilizing ionizing radiation. Definitions and test methods
BS IEC 60692:2000 Nuclear instrumentation - Density gauges utilizing ionizing radiation - Definitions and test methods
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS IEC 61336:1996 Nuclear instrumentation. Thickness measurement systems utilizing ionizing radiation. Definitions and test methods

International Organization for Standardization (ISO), How to use the ion sputterer

ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 22415:2019 Surface chemical analysis — Secondary ion mass spectrometry — Method for determining yield volume in argon cluster sputter depth profiling of organic materials
ISO/TR 22335:2007 Surface chemical analysis - Depth profiling - Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p

American Society for Testing and Materials (ASTM), How to use the ion sputterer

ASTM E1438-91(2001) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
ASTM E1438-91(1996) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
ASTM C110-08 Standard Test Methods for Physical Testing of Quicklime, Hydrated Lime, and Limestone
ASTM C110-09 Standard Test Methods for Physical Testing of Quicklime, Hydrated Lime, and Limestone
ASTM C1109-98 Standard Test Method for Analysis of Aqueous Leachates from Nuclear Waste Materials Using Inductively Coupled Plasma-Atomic Emission Spectrometry
ASTM E1552-08 Standard Test Method for Determining Hafnium in Zirconium and Zirconium Alloys By Direct Current Plasmax2014;Atomic Emission Spectrometry
ASTM C1109-10(2015) Standard Practice for Analysis of Aqueous Leachates from Nuclear Waste Materials Using Inductively Coupled Plasma-Atomic Emission Spectroscopy
ASTM D5542-94(1999)e1 Standard Test Methods for Trace Anions in High Purity Water by Ion Chromatography
ASTM F1467-99(2005)e1 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM UOP407-09 Trace Metals in Organics by Dry Ashing - ICP-OES
ASTM E1097-12 Standard Guide for Determination of Various Elements by Direct Current Plasma Atomic Emission Spectrometry
ASTM F1467-11 Standard Guide for Use of an X-Ray Tester (x2248;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

International Electrotechnical Commission (IEC), How to use the ion sputterer

IEC 60181:1964 Index of electrical measuring apparatus used in connection with ionizing radiation
IEC 60181/AMD1:1967 Index of electrical measuring apparatus used in connection with ionizing radiation
IEC 61151:1992 Nuclear instrumentation; amplifiers and preamplifiers used with detectors of ionizing radiation; test procedures
IEC 60692:1999 Nuclear instrumentation - Density gauges utilizing ionizing radiation - Definitions and test methods

German Institute for Standardization, How to use the ion sputterer

DIN IEC 61336:1999 Nuclear instrumentation - Thickness measurement systems utilizing ionizing radiation - Definitions and test methods (IEC 61336:1996)
DIN IEC 61336:1999-05 Nuclear instrumentation - Thickness measurement systems utilizing ionizing radiation - Definitions and test methods (IEC 61336:1996)

Association Francaise de Normalisation, How to use the ion sputterer

FD X21-063*FD ISO/TR 22335:2008 Surface chemical analysis - Depth profiling - Measurement of sputtering rate : mesh-replica method using a mechanical stylus profilometer
FD ISO/TR 22335:2008 Analyse chimique des surfaces - Profilage en profondeur - Mesurage de la vitesse de pulvérisation : méthode par empreinte de grille au moyen d'un profilomètre à stylet mécanique

Korean Agency for Technology and Standards (KATS), How to use the ion sputterer

KS F 2587-2010(2020) Standard test method for chloride ion in fresh concrete using a chloride ion-selective electrode method

国家市场监督管理总局、中国国家标准化管理委员会, How to use the ion sputterer

GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

未注明发布机构, How to use the ion sputterer

BS IEC 61336:1996(1999) Nuclear instrumentation — Thickness measurement systems utilizing ionizing radiation — Definitions and test methods